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Digital holography for MEMS and microsystem metrology / / edited by Anand Asundi
Digital holography for MEMS and microsystem metrology / / edited by Anand Asundi
Pubbl/distr/stampa Chichester, England : , : Wiley, , 2011
Descrizione fisica 1 online resource (229 p.)
Disciplina 620.1127
621.381
Collana The Wiley microsystem and nanotechnology series
Soggetto topico Microelectromechanical systems - Measurement
Microelectronics - Measurement
Holographic testing
Image processing - Digital techniques
ISBN 1-283-17798-6
9786613177988
1-119-97278-7
1-119-99729-1
1-119-99730-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Digital Holography for MEMS and Microsystem Metrology; Contents; About the Editor; Contributors; Series Preface; Acknowledgements; Abbreviations; 1 Introduction; 2 Digital Reflection Holography and Applications; 2.1 Introduction to Digital Holography and Methods; 2.1.1 Holography and Digital Holography; 2.1.2 Digital Recording Mechanism; 2.1.3 Numerical Reconstruction Methods; 2.2 Reflection Digital Holographic Microscope (DHM) Systems Development; 2.2.1 Optical Systems and Methodology; 2.3 3D Imaging, Static and Dynamic Measurements; 2.3.1 Numerical Phase and 3D Measurements
2.3.2 Digital Holographic Interferometry2.4 MEMS/Microsystems Characterization Applications; 2.4.1 3D Measurements; 2.4.2 Static Measurements and Dynamic Interferometric Measurement; 2.4.3 Vibration Analysis; References; 3 Digital Transmission Holography and Applications; 3.1 Historical Introduction; 3.2 The Foundation of Digital Holography [30]; 3.2.1 Theoretical Analysis of Wavefront Interference; 3.2.2 Digital Hologram Recording and Reconstruction; 3.2.3 Different Numerical Reconstruction Algorithms; 3.3 Digital Holographic Microscopy System
3.3.1 Digital Holographic Microscopy with Physical Spherical Phase Compensation3.3.2 Lens-Less Common-Path Digital Holographic Microscope; 3.3.3 Common-Path Digital Holographic Microscope; 3.3.4 Digital Holographic Microscopy with Quasi-Physical Spherical Phase Compensation : Light with Long Coherence Length; 3.3.5 Digital Holographic Microscopy with Quasi-Physical Spherical Phase Compensation : Light with Short Coherence Length; 3.4 Conclusion; References; 4 Digital In-Line Holography and Applications; 4.1 Background; 4.2 Digital In-Line Holography; 4.2.1 Recording and Reconstruction
4.3 Methodology for 2D Measurement of Micro-Particles4.3.1 Numerical Reconstruction, Pre-Processing and Background Correction; 4.3.2 Image Segmentation; 4.3.3 Particle Focusing; 4.3.4 Particle Size Measurement; 4.4 Validation and Performance of the 2D Measurement Method; 4.4.1 Verification of the Focusing Algorithm; 4.4.2 Spherical Beads on a Glass Slide; 4.4.3 Microspheres in a Flowing System Normalized Population; 4.4.4 10 μm Microspheres Suspension; 4.4.5 Measurement of Microfibers; 4.5 Methodology for 3D Measurement of Micro-Fibers; 4.5.1 Method 1: The 3D Point Cloud Method
4.5.2 Method 2: The Superimposition Method4.6 Validation and Performance of the 3D Measurement Methods; 4.6.1 Experiment with a Single Fiber; 4.6.2 3D Measurements of Micro-Fibers in Suspension; 4.7 Conclusion; References; 5 Other Applications; 5.1 Recording Plane Division Multiplexing (RDM) in Digital Holography for Resolution Enhancement; 5.1.1 Introduction of the Recording Plane Division Multiplexing Technique; 5.1.1.1 The SM Technique; 5.1.1.2 The ADM Technique; 5.1.1.3 The WDM Technique; 5.1.1.4 The PM Technique; 5.1.2 RDM Implemented in Pulsed Digital Holography for Ultra-Fast Recording
5.1.2.1 Introduction
Record Nr. UNINA-9910139619603321
Chichester, England : , : Wiley, , 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Digital holography for MEMS and microsystem metrology / / edited by Anand Asundi
Digital holography for MEMS and microsystem metrology / / edited by Anand Asundi
Pubbl/distr/stampa Chichester, England : , : Wiley, , 2011
Descrizione fisica 1 online resource (229 p.)
Disciplina 620.1127
621.381
Collana The Wiley microsystem and nanotechnology series
Soggetto topico Microelectromechanical systems - Measurement
Microelectronics - Measurement
Holographic testing
Image processing - Digital techniques
ISBN 1-283-17798-6
9786613177988
1-119-97278-7
1-119-99729-1
1-119-99730-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Digital Holography for MEMS and Microsystem Metrology; Contents; About the Editor; Contributors; Series Preface; Acknowledgements; Abbreviations; 1 Introduction; 2 Digital Reflection Holography and Applications; 2.1 Introduction to Digital Holography and Methods; 2.1.1 Holography and Digital Holography; 2.1.2 Digital Recording Mechanism; 2.1.3 Numerical Reconstruction Methods; 2.2 Reflection Digital Holographic Microscope (DHM) Systems Development; 2.2.1 Optical Systems and Methodology; 2.3 3D Imaging, Static and Dynamic Measurements; 2.3.1 Numerical Phase and 3D Measurements
2.3.2 Digital Holographic Interferometry2.4 MEMS/Microsystems Characterization Applications; 2.4.1 3D Measurements; 2.4.2 Static Measurements and Dynamic Interferometric Measurement; 2.4.3 Vibration Analysis; References; 3 Digital Transmission Holography and Applications; 3.1 Historical Introduction; 3.2 The Foundation of Digital Holography [30]; 3.2.1 Theoretical Analysis of Wavefront Interference; 3.2.2 Digital Hologram Recording and Reconstruction; 3.2.3 Different Numerical Reconstruction Algorithms; 3.3 Digital Holographic Microscopy System
3.3.1 Digital Holographic Microscopy with Physical Spherical Phase Compensation3.3.2 Lens-Less Common-Path Digital Holographic Microscope; 3.3.3 Common-Path Digital Holographic Microscope; 3.3.4 Digital Holographic Microscopy with Quasi-Physical Spherical Phase Compensation : Light with Long Coherence Length; 3.3.5 Digital Holographic Microscopy with Quasi-Physical Spherical Phase Compensation : Light with Short Coherence Length; 3.4 Conclusion; References; 4 Digital In-Line Holography and Applications; 4.1 Background; 4.2 Digital In-Line Holography; 4.2.1 Recording and Reconstruction
4.3 Methodology for 2D Measurement of Micro-Particles4.3.1 Numerical Reconstruction, Pre-Processing and Background Correction; 4.3.2 Image Segmentation; 4.3.3 Particle Focusing; 4.3.4 Particle Size Measurement; 4.4 Validation and Performance of the 2D Measurement Method; 4.4.1 Verification of the Focusing Algorithm; 4.4.2 Spherical Beads on a Glass Slide; 4.4.3 Microspheres in a Flowing System Normalized Population; 4.4.4 10 μm Microspheres Suspension; 4.4.5 Measurement of Microfibers; 4.5 Methodology for 3D Measurement of Micro-Fibers; 4.5.1 Method 1: The 3D Point Cloud Method
4.5.2 Method 2: The Superimposition Method4.6 Validation and Performance of the 3D Measurement Methods; 4.6.1 Experiment with a Single Fiber; 4.6.2 3D Measurements of Micro-Fibers in Suspension; 4.7 Conclusion; References; 5 Other Applications; 5.1 Recording Plane Division Multiplexing (RDM) in Digital Holography for Resolution Enhancement; 5.1.1 Introduction of the Recording Plane Division Multiplexing Technique; 5.1.1.1 The SM Technique; 5.1.1.2 The ADM Technique; 5.1.1.3 The WDM Technique; 5.1.1.4 The PM Technique; 5.1.2 RDM Implemented in Pulsed Digital Holography for Ultra-Fast Recording
5.1.2.1 Introduction
Record Nr. UNINA-9910818361103321
Chichester, England : , : Wiley, , 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Holography : the next disruptive technology / / by Tomoko Sano
Holography : the next disruptive technology / / by Tomoko Sano
Autore Sano Tomoko
Pubbl/distr/stampa Aberdeen Proving Ground, MD : , : US Army Research Laboratory, , Apr 2017
Descrizione fisica 1 online resource (iv, 18 pages) : color illustrations
Collana ARL-TR
Soggetto topico Holography
Holographic testing
Three-dimensional imaging
Augmented reality
Soggetto genere / forma Technical reports.
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Holography
Record Nr. UNINA-9910711430603321
Sano Tomoko  
Aberdeen Proving Ground, MD : , : US Army Research Laboratory, , Apr 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui