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In-situ electron microscopy at high resolution [[electronic resource] /] / editor, Florian Banhart
| In-situ electron microscopy at high resolution [[electronic resource] /] / editor, Florian Banhart |
| Pubbl/distr/stampa | Hackensack, NJ, : World Scientific, c2008 |
| Descrizione fisica | 1 online resource (318 p.) |
| Disciplina | 502.825 |
| Altri autori (Persone) | BanhartFlorian |
| Soggetto topico |
Electron microscopy - Technique
High resolution electron microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-61344-079-0
981-279-734-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; Chapter 1 Introduction to In-Situ Electron Microscopy Florian Banhart; 1. Definition and History of In-Situ Electron Microscopy; 2. Modern In-Situ Electron Microscopy; 3. The Techniques of In-Situ Electron Microscopy; 4. Limitations of in-situ Electron Microscopy and Future Demands; 5. Concept of this Book; References; Chapter 2 Observation of Dynamic Processes using Environmental Transmission or Scanning Transmission Electron Microscopy Renu Sharma; 1. Introduction; 2. Environmental Scanning/Transmission Electron Microscope; 2.1. Windowed cell; 2.2. Differential pumping systems
3. Experimental Planning Strategies5. Data Collection; 6. Applications; 6.1. Nanoscale characterization during synthesis; 6.1.1. Effect of the environment on nanoparticle morphology; 6.1.2. Effect of support on nanoparticle morphology; 6.1.3. Nanoparticle synthesis by de-hydroxylation; 6.1.3. Chemical vapor deposition (CVD); 6.2. Effect of environment on catalytic activity; 6.3. Effect of humidity on aerosol particles; 7. Limitations; Conclusions; Acknowledgments; References; Chapter 3 In-Situ High-Resolution Observation of Solid-Solid, Solid-Liquid and Solid-Gas Reactions Hiroyasu Saka 1. Introduction2. Specimen-Heating Holders; 3. Solid-Solid Reactions; 3.1. Formation of SiC via solid-state reaction and behaviour of grain boundary in SiC; 3.2. Vibration of a grain boundary and an interface; 4. Solid-Liquid Reactions; 4.1. Melting of metals with small dimensions; 4.1.1. Melting of embedded particles; 4.1.2. Melting of a wedge-shaped crystal; 4.1.3. Melting of a conical needle; 4.2. Solid-liquid interfaces; 4.2.1. Pure metals; 4.2.2. Alumina; 4.2.3. Al-Si alloy; 4.3. Wetting of liquid metals on non-metallic substrates; 4.3.1. Au liquid on Si substrate; 4.3.2. Al on Si 4.3.3. Size dependence of the wetting angle of liquid metals on non-metallic substrates5. Solid-Gas Reactions; 5.1. Oxidation of Si; 5.2. Three-way catalyst; 6. Conclusions and Outlook; Acknowledgments; References; Chapter 4 In-Situ Transmission Electron Microscopy: Nanoindentation and Straining Experiments Wouter A. Soer and Jeff T. De Hosson; 1. Introduction; 2. In-Situ Nanoindentation in a TEM; 2.1. Stage design; 2.2. Specimen geometry; 3. Experimental Procedure; 3.1. Specimen preparation and microstructure; 3.2. In-situ and exsitu nanoindentation experiments 4. Dislocation Dynamics in Al and Al-Mg Thin Films4.1. In-situ observations of dislocation propagation; 4.2. Serrated yielding in Al-Mg alloys; 4.3. Effect of solute drag on load-controlled indentation curves; 4.4. Effect of solute drag on displacement-controlled indentation; 5. Grain Boundary Dynamics in Al and Al-Mg Thin Films; 6. Superplastic Behavior of Coarse-Grained Al-Mg Alloys; 6.1. In-situ TEM straining experiments; 6.2. Dislocation substructure; 6.3. In-situ observations of substructure evolution; 7. Conclusions; Acknowledgments; References Chapter 5 In-Situ HRTEM Studies of Interface Dynamics During Solid-Solid Phase Transformations in Metal Alloys James M. Howe |
| Record Nr. | UNINA-9910455528703321 |
| Hackensack, NJ, : World Scientific, c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
In-situ electron microscopy at high resolution [[electronic resource] /] / editor, Florian Banhart
| In-situ electron microscopy at high resolution [[electronic resource] /] / editor, Florian Banhart |
| Pubbl/distr/stampa | Hackensack, NJ, : World Scientific, c2008 |
| Descrizione fisica | 1 online resource (318 p.) |
| Disciplina | 502.825 |
| Altri autori (Persone) | BanhartFlorian |
| Soggetto topico |
Electron microscopy - Technique
High resolution electron microscopy |
| ISBN |
1-61344-079-0
981-279-734-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; Chapter 1 Introduction to In-Situ Electron Microscopy Florian Banhart; 1. Definition and History of In-Situ Electron Microscopy; 2. Modern In-Situ Electron Microscopy; 3. The Techniques of In-Situ Electron Microscopy; 4. Limitations of in-situ Electron Microscopy and Future Demands; 5. Concept of this Book; References; Chapter 2 Observation of Dynamic Processes using Environmental Transmission or Scanning Transmission Electron Microscopy Renu Sharma; 1. Introduction; 2. Environmental Scanning/Transmission Electron Microscope; 2.1. Windowed cell; 2.2. Differential pumping systems
3. Experimental Planning Strategies5. Data Collection; 6. Applications; 6.1. Nanoscale characterization during synthesis; 6.1.1. Effect of the environment on nanoparticle morphology; 6.1.2. Effect of support on nanoparticle morphology; 6.1.3. Nanoparticle synthesis by de-hydroxylation; 6.1.3. Chemical vapor deposition (CVD); 6.2. Effect of environment on catalytic activity; 6.3. Effect of humidity on aerosol particles; 7. Limitations; Conclusions; Acknowledgments; References; Chapter 3 In-Situ High-Resolution Observation of Solid-Solid, Solid-Liquid and Solid-Gas Reactions Hiroyasu Saka 1. Introduction2. Specimen-Heating Holders; 3. Solid-Solid Reactions; 3.1. Formation of SiC via solid-state reaction and behaviour of grain boundary in SiC; 3.2. Vibration of a grain boundary and an interface; 4. Solid-Liquid Reactions; 4.1. Melting of metals with small dimensions; 4.1.1. Melting of embedded particles; 4.1.2. Melting of a wedge-shaped crystal; 4.1.3. Melting of a conical needle; 4.2. Solid-liquid interfaces; 4.2.1. Pure metals; 4.2.2. Alumina; 4.2.3. Al-Si alloy; 4.3. Wetting of liquid metals on non-metallic substrates; 4.3.1. Au liquid on Si substrate; 4.3.2. Al on Si 4.3.3. Size dependence of the wetting angle of liquid metals on non-metallic substrates5. Solid-Gas Reactions; 5.1. Oxidation of Si; 5.2. Three-way catalyst; 6. Conclusions and Outlook; Acknowledgments; References; Chapter 4 In-Situ Transmission Electron Microscopy: Nanoindentation and Straining Experiments Wouter A. Soer and Jeff T. De Hosson; 1. Introduction; 2. In-Situ Nanoindentation in a TEM; 2.1. Stage design; 2.2. Specimen geometry; 3. Experimental Procedure; 3.1. Specimen preparation and microstructure; 3.2. In-situ and exsitu nanoindentation experiments 4. Dislocation Dynamics in Al and Al-Mg Thin Films4.1. In-situ observations of dislocation propagation; 4.2. Serrated yielding in Al-Mg alloys; 4.3. Effect of solute drag on load-controlled indentation curves; 4.4. Effect of solute drag on displacement-controlled indentation; 5. Grain Boundary Dynamics in Al and Al-Mg Thin Films; 6. Superplastic Behavior of Coarse-Grained Al-Mg Alloys; 6.1. In-situ TEM straining experiments; 6.2. Dislocation substructure; 6.3. In-situ observations of substructure evolution; 7. Conclusions; Acknowledgments; References Chapter 5 In-Situ HRTEM Studies of Interface Dynamics During Solid-Solid Phase Transformations in Metal Alloys James M. Howe |
| Record Nr. | UNINA-9910777935403321 |
| Hackensack, NJ, : World Scientific, c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku
| Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku |
| Autore | Oku Takeo |
| Pubbl/distr/stampa | Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014 |
| Descrizione fisica | 1 online resource (180 p.) |
| Disciplina | 502.825 |
| Soggetto topico |
Transmission electron microscopy
High resolution electron microscopy Nanostructured materials Structural analysis (Engineering) |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-5231-0054-0
3-11-038804-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front matter -- Preface -- Contents -- 1 Introduction -- 2 Structure and principle of electron microscopes -- 3 Practice of HREM -- 4 Characterization by HREM -- 5 Electron diffraction analysis of nanostructured materials -- 6 HREM analysis of nanostructured materials -- A Appendix -- Index |
| Record Nr. | UNINA-9910463816503321 |
Oku Takeo
|
||
| Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku
| Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku |
| Autore | Oku Takeo |
| Pubbl/distr/stampa | Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014 |
| Descrizione fisica | 1 online resource (180 p.) |
| Disciplina | 502.825 |
| Soggetto topico |
Transmission electron microscopy
High resolution electron microscopy Nanostructured materials Structural analysis (Engineering) |
| Soggetto non controllato |
Advanced Nanomaterials
Crystallography Industrial Application Materials Science |
| ISBN |
1-5231-0054-0
3-11-038804-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front matter -- Preface -- Contents -- 1 Introduction -- 2 Structure and principle of electron microscopes -- 3 Practice of HREM -- 4 Characterization by HREM -- 5 Electron diffraction analysis of nanostructured materials -- 6 HREM analysis of nanostructured materials -- A Appendix -- Index |
| Record Nr. | UNINA-9910788564003321 |
|
Oku Takeo
|
||
| Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku
| Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku |
| Autore | Oku Takeo |
| Pubbl/distr/stampa | Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014 |
| Descrizione fisica | 1 online resource (180 p.) |
| Disciplina | 502.825 |
| Soggetto topico |
Transmission electron microscopy
High resolution electron microscopy Nanostructured materials Structural analysis (Engineering) |
| Soggetto non controllato |
Advanced Nanomaterials
Crystallography Industrial Application Materials Science |
| ISBN |
1-5231-0054-0
3-11-038804-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front matter -- Preface -- Contents -- 1 Introduction -- 2 Structure and principle of electron microscopes -- 3 Practice of HREM -- 4 Characterization by HREM -- 5 Electron diffraction analysis of nanostructured materials -- 6 HREM analysis of nanostructured materials -- A Appendix -- Index |
| Record Nr. | UNINA-9910827817203321 |
|
Oku Takeo
|
||
| Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
