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Quantitative millimetre wavelength spectrometry [[electronic resource] /] / John F. Alder, John G. Baker
| Quantitative millimetre wavelength spectrometry [[electronic resource] /] / John F. Alder, John G. Baker |
| Autore | Alder John F |
| Pubbl/distr/stampa | Cambridge, U.K., : Royal Society of Chemistry, c2002 |
| Descrizione fisica | 1 online resource (138 p.) |
| Disciplina | 543/.57 |
| Altri autori (Persone) | BakerJohn G |
| Collana | RSC analytical spectroscopy monographs |
| Soggetto topico |
Gases - Spectra
Millimeter wave devices |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-84755-179-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | BK9780854045754-FX001; BK9780854045754-FP001; BK9780854045754-FP005; BK9780854045754-FP007; BK9780854045754-FP011; BK9780854045754-00001; BK9780854045754-00021; BK9780854045754-00038; BK9780854045754-00065; BK9780854045754-00080; BK9780854045754-00089; BK9780854045754-00115; BK9780854045754-00119 |
| Record Nr. | UNINA-9910455235703321 |
Alder John F
|
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| Cambridge, U.K., : Royal Society of Chemistry, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Quantitative millimetre wavelength spectrometry [[electronic resource] /] / John F. Alder, John G. Baker
| Quantitative millimetre wavelength spectrometry [[electronic resource] /] / John F. Alder, John G. Baker |
| Autore | Alder John F |
| Pubbl/distr/stampa | Cambridge, U.K., : Royal Society of Chemistry, c2002 |
| Descrizione fisica | 1 online resource (138 p.) |
| Disciplina | 543/.57 |
| Altri autori (Persone) | BakerJohn G |
| Collana | RSC analytical spectroscopy monographs |
| Soggetto topico |
Gases - Spectra
Millimeter wave devices |
| ISBN | 1-84755-179-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | BK9780854045754-FX001; BK9780854045754-FP001; BK9780854045754-FP005; BK9780854045754-FP007; BK9780854045754-FP011; BK9780854045754-00001; BK9780854045754-00021; BK9780854045754-00038; BK9780854045754-00065; BK9780854045754-00080; BK9780854045754-00089; BK9780854045754-00115; BK9780854045754-00119 |
| Record Nr. | UNINA-9910778311603321 |
|
Alder John F
|
||
| Cambridge, U.K., : Royal Society of Chemistry, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Trace analysis of specialty and electronic gases [[electronic resource] /] / edited by William M. Geiger, Mark W. Raynor
| Trace analysis of specialty and electronic gases [[electronic resource] /] / edited by William M. Geiger, Mark W. Raynor |
| Pubbl/distr/stampa | Hoboken, N.J., : John Wiley & Sons, Inc., 2013 |
| Descrizione fisica | 1 online resource (387 p.) |
| Disciplina | 543 |
| Altri autori (Persone) |
GeigerWilliam M. <1948->
RaynorMark W. <1961-> |
| Soggetto topico |
Gases - Analysis
Trace elements - Analysis Gases - Spectra |
| ISBN |
1-118-64257-0
1-118-64277-5 1-118-64256-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Title Page; Copyright Page; CONTENTS; List of Figures; List of Tables; Foreword; Acknowledgments; Acronyms; 1 Introduction to Gas Analysis: Past and Future; 1.1 The Beginning; 1.2 Gas Chromatography; 1.3 Ion Chromatography; 1.4 Mass Spectrometry; 1.5 Ion Mobility Spectrometry; 1.6 Optical Spectroscopy; 1.7 Metals Analysis; 1.8 Species-Specific Analyzers; 1.8.1 Oxygen Analyzers; 1.8.2 Paramagnetic Analyzers; 1.8.3 Moisture Analyzers; 1.9 Sensors; 1.10 The Future; References; 2 Sample Preparation and ICP-MS Analysis of Gases for Metals; 2.1 Introduction
2.2 Extraction of Impurities Before Analysis2.2.1 Filtration Method; 2.2.2 Hydrolysis Method; 2.2.3 Residue Method; 2.2.4 Choice of Sampling Method; 2.2.5 ICP-MS Analysis; 2.3 Direct Analysis of ESGs; 2.3.1 Calibration; 2.3.2 Analysis of Carbon Monoxide; 2.4 Conclusions; References; 3 Novel Improvements in FTIR Analysis of Specialty Gases; 3.1 Gas-Phase Analysis Using FTIR Spectroscopy; 3.2 Gas-Phase Effects on Spectral Line Shape; 3.2.1 External Effects on Line Shapes; 3.2.2 Matrix Gas Effects on Line Shapes; 3.3 Factors That Greatly Affect Quantification; 3.3.1 Isotope Abundance Ratios 3.3.2 Hydrogen Bonding3.3.3 Alternative Background Removal Strategies; 3.3.4 Automatic Region Selection for CLS Methods; 3.4 Future Applications; References; 4 Emerging Infrared Laser Absorption Spectroscopic Techniques for Gas Analysis; 4.1 Introduction; 4.2 Laser Absorption Spectroscopic Techniques; 4.2.1 Quantum and Interband Cascade Lasers; 4.2.2 Cavity-Enhanced Spectroscopy: CRDS and ICOS; 4.2.3 Conventional and Quartz-Enhanced Photoacoustic Spectroscopy; 4.2.4 Cavity-Enhanced Direct Frequency-Comb Spectroscopy; 4.3 Applications of Semiconductor LAS-Based Trace Gas Sensor Systems 4.3.1 OA-ICOS Online Measurement of Acetylene in an Industrial Hydrogenation Reactor4.3.2 Multicomponent Impurity Analysis in Hydrogen Process Gas Using a Compact QEPAS Sensor; 4.3.3 Analysis of Trace Impurities in Arsine by CE-DFCS at 1.75 to 1.95 mm; 4.4 Conclusions and Future Trends; References; 5 Atmospheric Pressure lonization Mass Spectrometry for Bulk and Electronic Gas Analysis; 5.1 Introduction; 5.2 APIMS Operating Principle; 5.3 Point-to-Plane Corona Discharge lonization; 5.4 Factors Affecting Sensitivity in Point-to-Plane Corona Discharge APIMS; 5.4.1 Effects of Pressure 5.4.2 Effects of Declustering Lens Voltage5.4.3 Effects of Coexisting Analytes; 5.4.4 Isotopic Dilution APIMS Measurements; 5.5 Applications of Point-to-Plane Corona Discharge APIMS; 5.5.1 Bulk Gas Analysis; 5.5.2 Electronic Specialty Gas Analysis; 5.6 Nickel-63 Beta Emitter APIMS; 5.6.1 Nickel-63 Source Design; 5.6.2 Ion Formation from a Nickel-63 Source; 5.6.3 Importance of the Declustering Region for Nickel-63 Sources; 5.6.4 Overcoming Competing Positive-Ion Proton Affinities; 5.6.5 Negative-Ion Cluster Formation 5.7 Specialty Gas Analysis Application: Determination of Oxygenated Impurities in High-Purity Ammonia |
| Record Nr. | UNINA-9910139015403321 |
| Hoboken, N.J., : John Wiley & Sons, Inc., 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Trace analysis of specialty and electronic gases / / edited by William M. Geiger, Mark W. Raynor
| Trace analysis of specialty and electronic gases / / edited by William M. Geiger, Mark W. Raynor |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : John Wiley & Sons, Inc., 2013 |
| Descrizione fisica | 1 online resource (387 p.) |
| Disciplina | 543 |
| Altri autori (Persone) |
GeigerWilliam M. <1948->
RaynorMark W. <1961-> |
| Soggetto topico |
Gases - Analysis
Trace elements - Analysis Gases - Spectra |
| ISBN |
9781118642573
1118642570 9781118642771 1118642775 9781118642566 1118642562 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Title Page; Copyright Page; CONTENTS; List of Figures; List of Tables; Foreword; Acknowledgments; Acronyms; 1 Introduction to Gas Analysis: Past and Future; 1.1 The Beginning; 1.2 Gas Chromatography; 1.3 Ion Chromatography; 1.4 Mass Spectrometry; 1.5 Ion Mobility Spectrometry; 1.6 Optical Spectroscopy; 1.7 Metals Analysis; 1.8 Species-Specific Analyzers; 1.8.1 Oxygen Analyzers; 1.8.2 Paramagnetic Analyzers; 1.8.3 Moisture Analyzers; 1.9 Sensors; 1.10 The Future; References; 2 Sample Preparation and ICP-MS Analysis of Gases for Metals; 2.1 Introduction
2.2 Extraction of Impurities Before Analysis2.2.1 Filtration Method; 2.2.2 Hydrolysis Method; 2.2.3 Residue Method; 2.2.4 Choice of Sampling Method; 2.2.5 ICP-MS Analysis; 2.3 Direct Analysis of ESGs; 2.3.1 Calibration; 2.3.2 Analysis of Carbon Monoxide; 2.4 Conclusions; References; 3 Novel Improvements in FTIR Analysis of Specialty Gases; 3.1 Gas-Phase Analysis Using FTIR Spectroscopy; 3.2 Gas-Phase Effects on Spectral Line Shape; 3.2.1 External Effects on Line Shapes; 3.2.2 Matrix Gas Effects on Line Shapes; 3.3 Factors That Greatly Affect Quantification; 3.3.1 Isotope Abundance Ratios 3.3.2 Hydrogen Bonding3.3.3 Alternative Background Removal Strategies; 3.3.4 Automatic Region Selection for CLS Methods; 3.4 Future Applications; References; 4 Emerging Infrared Laser Absorption Spectroscopic Techniques for Gas Analysis; 4.1 Introduction; 4.2 Laser Absorption Spectroscopic Techniques; 4.2.1 Quantum and Interband Cascade Lasers; 4.2.2 Cavity-Enhanced Spectroscopy: CRDS and ICOS; 4.2.3 Conventional and Quartz-Enhanced Photoacoustic Spectroscopy; 4.2.4 Cavity-Enhanced Direct Frequency-Comb Spectroscopy; 4.3 Applications of Semiconductor LAS-Based Trace Gas Sensor Systems 4.3.1 OA-ICOS Online Measurement of Acetylene in an Industrial Hydrogenation Reactor4.3.2 Multicomponent Impurity Analysis in Hydrogen Process Gas Using a Compact QEPAS Sensor; 4.3.3 Analysis of Trace Impurities in Arsine by CE-DFCS at 1.75 to 1.95 mm; 4.4 Conclusions and Future Trends; References; 5 Atmospheric Pressure lonization Mass Spectrometry for Bulk and Electronic Gas Analysis; 5.1 Introduction; 5.2 APIMS Operating Principle; 5.3 Point-to-Plane Corona Discharge lonization; 5.4 Factors Affecting Sensitivity in Point-to-Plane Corona Discharge APIMS; 5.4.1 Effects of Pressure 5.4.2 Effects of Declustering Lens Voltage5.4.3 Effects of Coexisting Analytes; 5.4.4 Isotopic Dilution APIMS Measurements; 5.5 Applications of Point-to-Plane Corona Discharge APIMS; 5.5.1 Bulk Gas Analysis; 5.5.2 Electronic Specialty Gas Analysis; 5.6 Nickel-63 Beta Emitter APIMS; 5.6.1 Nickel-63 Source Design; 5.6.2 Ion Formation from a Nickel-63 Source; 5.6.3 Importance of the Declustering Region for Nickel-63 Sources; 5.6.4 Overcoming Competing Positive-Ion Proton Affinities; 5.6.5 Negative-Ion Cluster Formation 5.7 Specialty Gas Analysis Application: Determination of Oxygenated Impurities in High-Purity Ammonia |
| Record Nr. | UNINA-9910826057803321 |
| Hoboken, N.J., : John Wiley & Sons, Inc., 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
