Basic equations for the modeling of gallium nitride (GaN) high electron mobility transistors (HEMTs) / / Jon C. Freeman |
Autore | Freeman Jon C. |
Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , February 2003 |
Descrizione fisica | 1 online resource (65 pages) : illustrations |
Collana | NASA/TM |
Soggetto topico |
Gallium nitrides
Field effect transistors High electron mobility transistors |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Basic equations for the modeling of gallium nitride |
Record Nr. | UNINA-9910705626303321 |
Freeman Jon C. | ||
Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , February 2003 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Cryogenic parametric characterization of gallium nitride switches / / Marcelo C. Gonzalez, Lee W. Kohlman, and Andrew J. Trunek |
Autore | Gonzalez Marcelo C. |
Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , October 2018 |
Descrizione fisica | 1 online resource (iii, 26 pages) : color illustrations |
Collana | NASA/TP |
Soggetto topico |
Field effect transistors
Gallium nitrides Metal oxide semiconductors |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910711565803321 |
Gonzalez Marcelo C. | ||
Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , October 2018 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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