Info
10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001
| 10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2001 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 0-7695-1233-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ATS 2001 compendium |
| Record Nr. | UNISA-996217253003316 |
| [Place of publication not identified], : IEEE Computer Society, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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10th Workshop on Fault Diagnosis and Tolerance in Cryptography : 20 August 2013, Santa Barbara, California / / IEEE Computer Society ; edited by Wieland Fischer, Jörn-Marc Schmidt
| 10th Workshop on Fault Diagnosis and Tolerance in Cryptography : 20 August 2013, Santa Barbara, California / / IEEE Computer Society ; edited by Wieland Fischer, Jörn-Marc Schmidt |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2013 |
| Descrizione fisica | 1 online resource (130 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Cryptography Data encryption (Computer science) - Mathematical models |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-4799-1489-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280996603316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
10th Workshop on Fault Diagnosis and Tolerance in Cryptography : 20 August 2013, Santa Barbara, California / / IEEE Computer Society ; edited by Wieland Fischer, Jörn-Marc Schmidt
| 10th Workshop on Fault Diagnosis and Tolerance in Cryptography : 20 August 2013, Santa Barbara, California / / IEEE Computer Society ; edited by Wieland Fischer, Jörn-Marc Schmidt |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2013 |
| Descrizione fisica | 1 online resource (130 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Cryptography Data encryption (Computer science) - Mathematical models |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-4799-1489-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910132910203321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
| 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2003 |
| Soggetto topico |
Integrated circuits - Design and construction - Very large scale integration
Fault-tolerant computing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214789603316 |
| [Place of publication not identified], : IEEE Computer Society Press, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
| 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2003 |
| Soggetto topico |
Integrated circuits - Design and construction - Very large scale integration
Fault-tolerant computing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872558103321 |
| [Place of publication not identified], : IEEE Computer Society Press, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
| 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2000 |
| Descrizione fisica | 1 online resource (438 pages) |
| Disciplina | 004.2 |
| Soggetto topico | Fault-tolerant computing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872769203321 |
| [Place of publication not identified], : IEEE Computer Society Press, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2008 17th Asian Test Symposium : 24-27 November 2008
| 2008 17th Asian Test Symposium : 24-27 November 2008 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (456 pages) |
| Soggetto topico |
Fault-tolerant computing
Electronic circuits - Testing Electronic digital computers - Circuits - Testing |
| ISBN | 1-5090-8449-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996198309403316 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2008 17th Asian Test Symposium : 24-27 November 2008
| 2008 17th Asian Test Symposium : 24-27 November 2008 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (456 pages) |
| Soggetto topico |
Fault-tolerant computing
Electronic circuits - Testing Electronic digital computers - Circuits - Testing |
| ISBN | 1-5090-8449-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910139855303321 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2008 IEEE International Conference on Dependable Systems and Networks
| 2008 IEEE International Conference on Dependable Systems and Networks |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2008 |
| Descrizione fisica | 1 online resource |
| Disciplina | 004.2 |
| Soggetto topico | Fault-tolerant computing |
| ISBN |
9781509081561
1509081569 9781424423989 1424423988 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145386903321 |
| [Place of publication not identified], : I E E E, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2009 4th Latin-American Symposium on Dependable Computing
| 2009 4th Latin-American Symposium on Dependable Computing |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2009 |
| Descrizione fisica | 1 online resource : illustrations |
| Disciplina | 001.64 |
| Soggetto topico |
Electronic digital computers - Reliability
Fault-tolerant computing |
| ISBN |
9781509069309
1509069305 9780769537603 076953760X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910138782803321 |
| [Place of publication not identified], : IEEE, 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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