IEC 62243 IEEE 1232 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002) : Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) / / IEEE
| IEC 62243 IEEE 1232 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002) : Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) / / IEEE |
| Edizione | [First edition 2005-07.] |
| Pubbl/distr/stampa | New York : , : IEEE, , 2002 |
| Descrizione fisica | 1 online resource (128 pages) |
| Disciplina | 006.33 |
| Collana | IEC |
| Soggetto topico |
Expert systems (Computer science)
Expert systems (Computer science) - Standards Artificial intelligence Reasoning Diagnostic services |
| ISBN | 0-7381-4778-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
62243-2002 - IEC 62243 Ed. 1
IEC 62243 First edition 2005-07 IEEE 1232 IEC 62243 Ed. 1 |
| Record Nr. | UNINA-9910135765903321 |
| New York : , : IEEE, , 2002 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEC 62243 IEEE 1232 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002) : Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) / / IEEE
| IEC 62243 IEEE 1232 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002) : Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) / / IEEE |
| Edizione | [First edition 2005-07.] |
| Pubbl/distr/stampa | New York : , : IEEE, , 2002 |
| Descrizione fisica | 1 online resource (128 pages) |
| Disciplina | 006.33 |
| Collana | IEC |
| Soggetto topico |
Expert systems (Computer science)
Expert systems (Computer science) - Standards Artificial intelligence Reasoning Diagnostic services |
| ISBN | 0-7381-4778-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
62243-2002 - IEC 62243 Ed. 1
IEC 62243 First edition 2005-07 IEEE 1232 IEC 62243 Ed. 1 |
| Record Nr. | UNISA-996279345303316 |
| New York : , : IEEE, , 2002 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEC 62243 IEEE Std 1232 : IEC 62243:2012(E) (IEEE Std 1232-2010) : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) / / IEEE
| IEC 62243 IEEE Std 1232 : IEC 62243:2012(E) (IEEE Std 1232-2010) : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) / / IEEE |
| Edizione | [Second edition 2012-06.] |
| Pubbl/distr/stampa | Piscataway : , : IEEE, , 2012 |
| Descrizione fisica | 1 online resource (172 pages) |
| Disciplina | 006.33 |
| Soggetto topico |
Expert systems (Computer science)
Expert systems (Computer science) - Standards Artificial intelligence Reasoning Diagnostic services |
| ISBN | 0-7381-7295-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
62243-2012 - IEC 62243
IEC 62243 Second edition 2012-06 IEEE Std 1232: IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) |
| Record Nr. | UNINA-9910135765803321 |
| Piscataway : , : IEEE, , 2012 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEC 62243 IEEE Std 1232 : IEC 62243:2012(E) (IEEE Std 1232-2010) : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) / / IEEE
| IEC 62243 IEEE Std 1232 : IEC 62243:2012(E) (IEEE Std 1232-2010) : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) / / IEEE |
| Edizione | [Second edition 2012-06.] |
| Pubbl/distr/stampa | Piscataway : , : IEEE, , 2012 |
| Descrizione fisica | 1 online resource (172 pages) |
| Disciplina | 006.33 |
| Soggetto topico |
Expert systems (Computer science)
Expert systems (Computer science) - Standards Artificial intelligence Reasoning Diagnostic services |
| ISBN | 0-7381-7295-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
62243-2012 - IEC 62243
IEC 62243 Second edition 2012-06 IEEE Std 1232: IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) |
| Record Nr. | UNISA-996279345403316 |
| Piscataway : , : IEEE, , 2012 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEC 62243:2012(E) (IEEE Std 1232-2010) : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) - Redline / / IEEE
| IEC 62243:2012(E) (IEEE Std 1232-2010) : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) - Redline / / IEEE |
| Pubbl/distr/stampa | Piscataway : , : IEEE, , 2012 |
| Descrizione fisica | 1 online resource (450 pages) |
| Disciplina | 006.33 |
| Collana | IEC |
| Soggetto topico |
Expert systems (Computer science)
Expert systems (Computer science) - Standards Artificial intelligence Reasoning Diagnostic services |
| ISBN | 0-7381-8093-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
62243-2012 - IEC 62243
IEC 62243:2012(E) (IEEE Std 1232-2010) - Redline: IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) - Redline IEC 62243 |
| Record Nr. | UNINA-9910135765703321 |
| Piscataway : , : IEEE, , 2012 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEC 62243:2012(E) (IEEE Std 1232-2010) : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) - Redline / / IEEE
| IEC 62243:2012(E) (IEEE Std 1232-2010) : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) - Redline / / IEEE |
| Pubbl/distr/stampa | Piscataway : , : IEEE, , 2012 |
| Descrizione fisica | 1 online resource (450 pages) |
| Disciplina | 006.33 |
| Collana | IEC |
| Soggetto topico |
Expert systems (Computer science)
Expert systems (Computer science) - Standards Artificial intelligence Reasoning Diagnostic services |
| ISBN | 0-7381-8093-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
62243-2012 - IEC 62243
IEC 62243:2012(E) (IEEE Std 1232-2010) - Redline: IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) - Redline IEC 62243 |
| Record Nr. | UNISA-996279345603316 |
| Piscataway : , : IEEE, , 2012 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board
| IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board |
| Pubbl/distr/stampa | New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 |
| Descrizione fisica | 1 online resource (v, 35 pages) |
| Disciplina | 006.3 |
| Soggetto topico |
Artificial intelligence - Standards
Expert systems (Computer science) - Standards |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 1522-2004: IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and Metrics |
| Record Nr. | UNISA-996278288803316 |
| New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board
| IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board |
| Pubbl/distr/stampa | New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 |
| Descrizione fisica | 1 online resource (v, 35 pages) |
| Disciplina | 006.3 |
| Soggetto topico |
Artificial intelligence - Standards
Expert systems (Computer science) - Standards |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 1522-2004: IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and Metrics |
| Record Nr. | UNINA-9910147249403321 |
| New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||