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An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
Autore Moreira José <1975->
Edizione [Second edition.]
Pubbl/distr/stampa Norwood, Massachusetts : , : Artech House, , [2016]
Descrizione fisica 1 online resource (709 pages) : illustrations
Disciplina 621.3815
Collana Artech House microwave library
Soggetto topico Equip de test automàtic
Circuits integrats - Proves
Circuits integrats d'alta velocitat - Proves
Integrated circuits - Testing
Automatic test equipment
Very high speed integrated circuits
ISBN 9781608079865
1-5231-4621-4
1-60807-986-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards.
3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5.
Altri titoli varianti Guide to automated testing of high-speed interfaces
Automated testing of high-speed interfaces
Record Nr. UNINA-9910792713303321
Moreira José <1975->  
Norwood, Massachusetts : , : Artech House, , [2016]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
Autore Moreira José <1975->
Edizione [Second edition.]
Pubbl/distr/stampa Norwood, Massachusetts : , : Artech House, , [2016]
Descrizione fisica 1 online resource (709 pages) : illustrations
Disciplina 621.3815
Collana Artech House microwave library
Soggetto topico Equip de test automàtic
Circuits integrats - Proves
Circuits integrats d'alta velocitat - Proves
Integrated circuits - Testing
Automatic test equipment
Very high speed integrated circuits
ISBN 9781608079865
1-5231-4621-4
1-60807-986-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards.
3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5.
Altri titoli varianti Guide to automated testing of high-speed interfaces
Automated testing of high-speed interfaces
Record Nr. UNINA-9910809724203321
Moreira José <1975->  
Norwood, Massachusetts : , : Artech House, , [2016]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui