1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE
| 1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE |
| Pubbl/distr/stampa | New York : , : IEEE, , 2022 |
| Descrizione fisica | 1 online resource (168 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Testing
Embedded computer systems - Testing Systems on a chip - Testing - Standards |
| ISBN | 1-5044-8866-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996574994103316 |
| New York : , : IEEE, , 2022 | ||
| Lo trovi qui: Univ. di Salerno | ||
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Embedded systems and software validation / / Abhik Roychoudhury
| Embedded systems and software validation / / Abhik Roychoudhury |
| Autore | Roychoudhury Abhik |
| Pubbl/distr/stampa | Amsterdam ; ; Boston, : Morgan Kaufmann Publishers/Elsevier, c2009 |
| Descrizione fisica | 1 online resource (267 p.) |
| Disciplina | 004.1 |
| Collana | The Morgan Kaufmann series in systems on silicon |
| Soggetto topico |
Embedded computer systems - Design and construction
Embedded computer systems - Testing Computer software - Testing |
| ISBN |
1-282-25804-4
9786612258046 0-08-092125-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Embedded Systems and Software Validation; Copyright Page; Dedication Page; Table of Contents; Acknowledgments; Preface; Chapter 1. Introduction; Chapter 2. Model Validation; 2.1 Platform versus System Behavior; 2.2 Criteria for Design Model; 2.3 Informal Requirements: A Case Study; 2.3.1 The Requirements Document; 2.3.2 Simplification of the Informal Requirements; 2.4 Common Modeling Notations; 2.4.1 Finite-State Machines; 2.4.2 Communicating FSMs; 2.4.3 Message Sequence Chart-Based Models; 2.5 Remarks About Modeling Notations; 2.6 Model Simulations; 2.6.1 FSM Simulations
2.6.2 Simulating MSC-Based System Models2.7 Model-Based Testing; 2.8 Model Checking; 2.8.1 Property Specification; 2.8.2 Checking Procedure; 2.9 The SPIN Validation Tool; 2.10 The SMV Validation Tool; 2.11 Case Study: Air-Traffic Controller; 2.12 References; 2.13 Exercises; Chapter 3. Communication Validation; 3.1 Common Incompatibilities; 3.1.1 Sending/Receiving Signals in Different Order; 3.1.2 Handling a Different Signal Alphabet; 3.1.3 Mismatch in Data Format; 3.1.4 Mismatch in Data Rates; 3.2 Converter Synthesis; 3.2.1 Representing Native Protocols and Converters 3.2.2 Basic Ideas for Converter Synthesis3.2.3 Various Strategies for Protocol Conversion; 3.2.4 Avoiding No-Progress Cycles; 3.2.5 Speculative Transmission to Avoid Deadlocks; 3.3 Changing a Working Design; 3.4 References; 3.5 Exercises; Chapter 4. Performance Validation; 4.1 The Conventional Abstraction of Time; 4.2 Predicting Execution Time of a Program; 4.2.1 WCET Calculation; 4.2.2 Modeling of Microarchitecture; 4.3 Interference within a Processing Element; 4.3.1 Interrupts from Environment; 4.3.2 Contention and Preemption; 4.3.3 Sharing a Processor Cache 4.4 System-Level Communication Analysis4.5 Designing Systems with Predictable Timing; 4.5.1 Scratchpad Memories; 4.5.2 Time-Triggered Communication; 4.6 Emerging Applications; 4.7 References; 4.8 Exercises; Chapter 5. Functionality Validation; 5.1 Dynamic or Trace-Based Checking; 5.1.1 Dynamic Slicing; 5.1.2 Fault Localization; 5.1.3 Directed Testing Methods; 5.2 Formal Verification; 5.2.1 Predicate Abstraction; 5.2.2 Software Checking via Predicate Abstraction; 5.2.3 Combining Formal Verification with Testing; 5.3 References; 5.4 Exercises; Bibliography; Index |
| Record Nr. | UNINA-9911006781103321 |
Roychoudhury Abhik
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| Amsterdam ; ; Boston, : Morgan Kaufmann Publishers/Elsevier, c2009 | ||
| Lo trovi qui: Univ. Federico II | ||
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Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems / / general chairs, Tingting Yu, Darko Marinov
| Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems / / general chairs, Tingting Yu, Darko Marinov |
| Pubbl/distr/stampa | New York : , : ACM, , 2017 |
| Descrizione fisica | 1 online resource (15 pages) |
| Disciplina | 004.1 |
| Soggetto topico | Embedded computer systems - Testing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Proceedings of the first Association for Computing Machinery Special Interest Group on Software Engineering International Workshop on Testing Embedded and Cyber-Physical Systems |
| Record Nr. | UNINA-9910375665703321 |
| New York : , : ACM, , 2017 | ||
| Lo trovi qui: Univ. Federico II | ||
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Proceedings, International Test Conference 1999
| Proceedings, International Test Conference 1999 |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 1999 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Circuits - Testing Embedded computer systems - Testing Microprocessors - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996218046903316 |
| [Place of publication not identified], : International Test Conference, 1999 | ||
| Lo trovi qui: Univ. di Salerno | ||
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Proceedings, International Test Conference 1999
| Proceedings, International Test Conference 1999 |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 1999 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Circuits - Testing Embedded computer systems - Testing Microprocessors - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872508603321 |
| [Place of publication not identified], : International Test Conference, 1999 | ||
| Lo trovi qui: Univ. Federico II | ||
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