top

  Info

  • Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.

  Info

  • Utilizzare questo link per rimuovere la selezione effettuata.
1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE
1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE
Pubbl/distr/stampa New York : , : IEEE, , 2022
Descrizione fisica 1 online resource (168 pages)
Disciplina 621.3815
Soggetto topico Integrated circuits - Testing
Embedded computer systems - Testing
Systems on a chip - Testing - Standards
ISBN 1-5044-8866-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996574994103316
New York : , : IEEE, , 2022
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Embedded systems and software validation / / Abhik Roychoudhury
Embedded systems and software validation / / Abhik Roychoudhury
Autore Roychoudhury Abhik
Pubbl/distr/stampa Amsterdam ; ; Boston, : Morgan Kaufmann Publishers/Elsevier, c2009
Descrizione fisica 1 online resource (267 p.)
Disciplina 004.1
Collana The Morgan Kaufmann series in systems on silicon
Soggetto topico Embedded computer systems - Design and construction
Embedded computer systems - Testing
Computer software - Testing
ISBN 1-282-25804-4
9786612258046
0-08-092125-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Embedded Systems and Software Validation; Copyright Page; Dedication Page; Table of Contents; Acknowledgments; Preface; Chapter 1. Introduction; Chapter 2. Model Validation; 2.1 Platform versus System Behavior; 2.2 Criteria for Design Model; 2.3 Informal Requirements: A Case Study; 2.3.1 The Requirements Document; 2.3.2 Simplification of the Informal Requirements; 2.4 Common Modeling Notations; 2.4.1 Finite-State Machines; 2.4.2 Communicating FSMs; 2.4.3 Message Sequence Chart-Based Models; 2.5 Remarks About Modeling Notations; 2.6 Model Simulations; 2.6.1 FSM Simulations
2.6.2 Simulating MSC-Based System Models2.7 Model-Based Testing; 2.8 Model Checking; 2.8.1 Property Specification; 2.8.2 Checking Procedure; 2.9 The SPIN Validation Tool; 2.10 The SMV Validation Tool; 2.11 Case Study: Air-Traffic Controller; 2.12 References; 2.13 Exercises; Chapter 3. Communication Validation; 3.1 Common Incompatibilities; 3.1.1 Sending/Receiving Signals in Different Order; 3.1.2 Handling a Different Signal Alphabet; 3.1.3 Mismatch in Data Format; 3.1.4 Mismatch in Data Rates; 3.2 Converter Synthesis; 3.2.1 Representing Native Protocols and Converters
3.2.2 Basic Ideas for Converter Synthesis3.2.3 Various Strategies for Protocol Conversion; 3.2.4 Avoiding No-Progress Cycles; 3.2.5 Speculative Transmission to Avoid Deadlocks; 3.3 Changing a Working Design; 3.4 References; 3.5 Exercises; Chapter 4. Performance Validation; 4.1 The Conventional Abstraction of Time; 4.2 Predicting Execution Time of a Program; 4.2.1 WCET Calculation; 4.2.2 Modeling of Microarchitecture; 4.3 Interference within a Processing Element; 4.3.1 Interrupts from Environment; 4.3.2 Contention and Preemption; 4.3.3 Sharing a Processor Cache
4.4 System-Level Communication Analysis4.5 Designing Systems with Predictable Timing; 4.5.1 Scratchpad Memories; 4.5.2 Time-Triggered Communication; 4.6 Emerging Applications; 4.7 References; 4.8 Exercises; Chapter 5. Functionality Validation; 5.1 Dynamic or Trace-Based Checking; 5.1.1 Dynamic Slicing; 5.1.2 Fault Localization; 5.1.3 Directed Testing Methods; 5.2 Formal Verification; 5.2.1 Predicate Abstraction; 5.2.2 Software Checking via Predicate Abstraction; 5.2.3 Combining Formal Verification with Testing; 5.3 References; 5.4 Exercises; Bibliography; Index
Record Nr. UNINA-9911006781103321
Roychoudhury Abhik  
Amsterdam ; ; Boston, : Morgan Kaufmann Publishers/Elsevier, c2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems / / general chairs, Tingting Yu, Darko Marinov
Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems / / general chairs, Tingting Yu, Darko Marinov
Pubbl/distr/stampa New York : , : ACM, , 2017
Descrizione fisica 1 online resource (15 pages)
Disciplina 004.1
Soggetto topico Embedded computer systems - Testing
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Proceedings of the first Association for Computing Machinery Special Interest Group on Software Engineering International Workshop on Testing Embedded and Cyber-Physical Systems
Record Nr. UNINA-9910375665703321
New York : , : ACM, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Proceedings, International Test Conference 1999
Proceedings, International Test Conference 1999
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 1999
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Circuits - Testing
Embedded computer systems - Testing
Microprocessors - Testing
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996218046903316
[Place of publication not identified], : International Test Conference, 1999
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Proceedings, International Test Conference 1999
Proceedings, International Test Conference 1999
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 1999
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Circuits - Testing
Embedded computer systems - Testing
Microprocessors - Testing
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872508603321
[Place of publication not identified], : International Test Conference, 1999
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui