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Ellipsometry : Principles and Techniques for Materials Characterization / / edited by Faustino Wahaia
| Ellipsometry : Principles and Techniques for Materials Characterization / / edited by Faustino Wahaia |
| Pubbl/distr/stampa | Rijeka, Croatia : , : IntechOpen, , 2017 |
| Descrizione fisica | 1 online resource (160 pages) : illustrations |
| Disciplina | 620.11295 |
| Soggetto topico | Ellipsometry |
| ISBN |
953-51-4592-4
953-51-3624-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Ellipsometry |
| Record Nr. | UNINA-9910317842603321 |
| Rijeka, Croatia : , : IntechOpen, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Ellipsometry and polarized light / R.M.A. Azzam and N.M. Bashara
| Ellipsometry and polarized light / R.M.A. Azzam and N.M. Bashara |
| Autore | Azzam, R.M.A. |
| Edizione | [1st paperback ed.] |
| Pubbl/distr/stampa | Amsterdam : Elsevier, c1987 |
| Descrizione fisica | xvii, 539 p. : ill. : 23 cm. |
| Altri autori (Persone) | Bashara, N.M.author |
| Collana | North-Holland personal library |
| Soggetto topico |
Ellipsometry
Polarization (Light) |
| ISBN | 0444870164 |
| Classificazione |
53.2.4
535.5'2 QC443.A96 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000923649707536 |
Azzam, R.M.A.
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| Amsterdam : Elsevier, c1987 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Ellipsometry at the nanoscale / / Maria Losurdo, Kurt Hingerl, editors
| Ellipsometry at the nanoscale / / Maria Losurdo, Kurt Hingerl, editors |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Berlin ; ; New York, : Springer, c2013 |
| Descrizione fisica | 1 online resource (740 p.) |
| Disciplina | 620.1/1295 |
| Altri autori (Persone) |
LosurdoMaria
HingerlKurt |
| Soggetto topico |
Ellipsometry
Polarimetry Nanotechnology |
| ISBN | 3-642-33956-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Preamble -- Preface -- A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis -- Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations -- Relationship between Surface Morphology and Effective Medium Roughness -- Plasmonics and Effective-Medium Theory -- Thin films of Nanostructured Plasmonic Noble Metals.- Spectroscopic Ellipsometry on Metallic Gratings -- Mueller matrix applied to nanostructures -- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles -- Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition -- THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures -- Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates -- Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale -- Polarimetric and other Optical Probes for the Solid - Liquid Interface -- Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices -- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications -- Ellipsometry of semiconductor nanocrystals -- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry -- Thin film applications in research and industry characterized by spectroscopic ellipsometry -- Ellipsometry and Correlation Measurements -- Nanotechnology: Applications and markets, present and future. |
| Record Nr. | UNINA-9910438055203321 |
| Berlin ; ; New York, : Springer, c2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Enhancement of aviation fuel thermal stability characterization through application of ellipsometry [[electronic resource] /] / Samuel Tucker Browne ... [and others]
| Enhancement of aviation fuel thermal stability characterization through application of ellipsometry [[electronic resource] /] / Samuel Tucker Browne ... [and others] |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , [2012] |
| Descrizione fisica | 1 online resource (14 pages) : color illustrations |
| Altri autori (Persone) | BrowneSamuel Tucker |
| Collana | NASA/TM |
| Soggetto topico |
Aircraft fuels
Characterization Ellipsometry Film thickness Thermal stability JP-8 jet fuel |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910701918403321 |
| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , [2012] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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A Fortran program for analysis of ellipsometer measurements / / Frank L. McCrackin
| A Fortran program for analysis of ellipsometer measurements / / Frank L. McCrackin |
| Autore | McCrackin F. L (Frank L.) |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | McCrackinF. L (Frank L.) |
| Collana | NBS technical note |
| Soggetto topico |
Computer programming
Ellipsometry FORTRAN (Computer program language) Polarization (Light) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711241303321 |
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McCrackin F. L (Frank L.)
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of ellipsometry / / edited by Harland G. Tompkins and Eugene A. Irene
| Handbook of ellipsometry / / edited by Harland G. Tompkins and Eugene A. Irene |
| Pubbl/distr/stampa | Norwich, NY, : William Andrew Pub. |
| Descrizione fisica | 1 online resource (887 p.) |
| Disciplina | 620.1/1295 |
| Altri autori (Persone) |
TompkinsHarland G
IreneEugene A |
| Soggetto topico | Ellipsometry |
| ISBN |
0-8155-1747-5
1-282-00263-5 9786612002632 9786612002625 1-59124-849-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Handbook of Ellipsometry; Copyright Page; Contents; Part 1: Theory of Ellipsometry; Chapter 1. Polarized Light and Ellipsometry; 1.1 A Quick Guide to Ellipsometry; 1.2 Maxwell and Wave Equations; 1.3 Representations of Polarization; 1.4 Propagation of Polarized Light; 1.5 Reflection and Transmission of Polarized Light at Planar Interfaces; 1.6 References; Chapter 2. Optical Physics of Materials; 2.1 Introduction; 2.2 Propagation of Light in Solids; 2.3 Classical Theories of the Optical Properties of Solids; 2.4 Quantum Mechanical Theories of the Optical Properties of Solids
2.5 Modeling the Optical Properties of Solids2.6 Overview and Concluding Remarks; 2.7 References and Bibliography; Chapter 3. Data Analysis for Spectroscopic Ellipsometry; 3.1 Introduction; 3.2 Ellipsometry Parameters; 3.3 Calculation of Complex Reflection Coefficients; 3.4 Models for Dielectric Functions; 3.5 Fitting Models to Data; 3.6 Determination of Optical Functions from Spectroscopic Ellipsometry Data; 3.7 Depolarization; 3.8 Further Reading and References; Part 2: Instrumentation; Chapter 4. Optical Components and the Simple PCSA (Polarizer, Compensator, Sample, Analyzer) Ellipsometer 4.1 General4.2 The Components; 4.3 Ellipsometer Component Configurations; 4.4 References; Chapter 5. Rotating Polarizer and Analyzer Ellipsometry; 5.1 Introduction; 5.2 Comparison of Ellipsometers; 5.3 Instrumentation Issues; 5.4 Data Reduction for the Rotating Polarizer and Analyzer Ellipsometers; 5.5 Precision Considerations; 5.6 Calibration Procedures; 5.7 Summary: Recent and Future Directions; 5.8 References; Chapter 6. Polarization Modulation Ellipsometry; 6.1 Introduction; 6.2 The Photoelastic Modulator (PEM); 6.3 Experimental Configurations of Polarization Modulation Ellipsometers 6.4 Light Intensity Through a Polarization Modulation Ellipsometer6.5 Waveform Analysis; 6.6 Calibration Procedures; 6.7 Errors; 6.8 Further Reading and References; Chapter 7. Multichannel Ellipsometry; 7.1 Introduction; 7.2 Overview of Instrumentation; 7.3 Rotating-Element Designs; 7.4 Concluding Remarks; 7.5 References; Part 3: Critical Reviews of Some Applications; Chapter 8. SiO2 Films; 8.1 Introduction; 8.2 Historical Perspective - Prior to 1970; 8.3 Modern Studies - Since 1970; 8.4 Conclusions; 8.5 References; Chapter 9. Theory and Application of Generalized Ellipsometry 9.1 Introduction9.2 The Generalized Ellipsometry Concept; 9.3 Theory of Generalized Ellipsometry; 9.4 Special Generalized Ellipsometry Solutions; 9.5 Strategies in Generalized Ellipsometry; 9.6 Generalized Ellipsometry Applications; 9.7 Conclusions; 9.8 Further Reading and References; Part 4: Emerging Areas in Ellipsometry; Chapter 10. VUV Ellipsometry; 10.1 Introduction; 10.2 Historical Review of Short Wavelength Ellipsometry; 10.3 VUV Ellipsometry Today; 10.4 Importance of VUV Ellipsometry; 10.5 Survey of Applications; 10.6 Future of VUV Ellipsometry; 10.7 Acknowledgments; 10.8 References Chapter 11. Spectroscopic Infrared Ellipsometry |
| Record Nr. | UNINA-9911004801103321 |
| Norwich, NY, : William Andrew Pub. | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices [[electronic resource] ] : final report, December 2004 - January 2009 / / W.S. Sampath, A. Enzenroth, and K. Barth
| Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices [[electronic resource] ] : final report, December 2004 - January 2009 / / W.S. Sampath, A. Enzenroth, and K. Barth |
| Autore | Sampath W. S (Walajabad S.) |
| Pubbl/distr/stampa | Golden, Colo. : , : National Renewable Energy Laboratory, , [2009] |
| Descrizione fisica | iii, 32 pages : digital, PDF file |
| Altri autori (Persone) |
EnzenrothA (Al)
BarthK (Kurt) |
| Collana | Subcontract report |
| Soggetto topico |
Photovoltaic cells - Research
Solar cells - Research Manufacturing processes Ellipsometry |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices
Manufacturing Process Optimization to Improve Stability, Yield and Efficiency of CdS/CdTe PV Devices |
| Record Nr. | UNINA-9910702878503321 |
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Sampath W. S (Walajabad S.)
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| Golden, Colo. : , : National Renewable Energy Laboratory, , [2009] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices [[electronic resource] ] : Phase II, annual technical report, January 2006 - February 2007 / / W.S. Sampath, A. Enzenroth, and K. Barth
| Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices [[electronic resource] ] : Phase II, annual technical report, January 2006 - February 2007 / / W.S. Sampath, A. Enzenroth, and K. Barth |
| Autore | Sampath W. S (Walajabad S.) |
| Pubbl/distr/stampa | Golden, Colo. : , : National Renewable Energy Laboratory, , [2007] |
| Descrizione fisica | iii, 12 pages : digital, PDF file |
| Altri autori (Persone) |
EnzenrothA (Al)
BarthK (Kurt) |
| Collana | NREL/SR |
| Soggetto topico |
Photovoltaic cells - Research
Solar cells - Research Ellipsometry Thin films |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices
Manufacturing Process Optimization to Improve Stability, Yield and Efficiency of CdS/CdTe PV Devices |
| Record Nr. | UNINA-9910698319603321 |
|
Sampath W. S (Walajabad S.)
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||
| Golden, Colo. : , : National Renewable Energy Laboratory, , [2007] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Optimization of phase-engineered a-Si:H-based multijunction solar cells [[electronic resource] ] : final technical report, October 2001 - July 2005 / / C.R. Wronski ... [and others]
| Optimization of phase-engineered a-Si:H-based multijunction solar cells [[electronic resource] ] : final technical report, October 2001 - July 2005 / / C.R. Wronski ... [and others] |
| Pubbl/distr/stampa | Golden, Colo. : , : National Renewable Energy Laboratory, , [2006] |
| Descrizione fisica | vi, 74 pages : digital, PDF file |
| Altri autori (Persone) | WronskiC. R (Christopher R.) |
| Collana | NREL/SR |
| Soggetto topico |
Photovoltaic cells - Design and construction - Research
Solar cells - Materials Thin films Ellipsometry |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Optimization of phase-engineered a-Si |
| Record Nr. | UNINA-9910696421303321 |
| Golden, Colo. : , : National Renewable Energy Laboratory, , [2006] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Selected papers on ellipsometry / R.M.A. Azzam, editor
| Selected papers on ellipsometry / R.M.A. Azzam, editor |
| Autore | Azzam, R.M.A. |
| Edizione | [1st ed] |
| Pubbl/distr/stampa | Bellingham : SPIE Optical Engineering Press, c1991 |
| Descrizione fisica | xxi, 707 p. : ill. ; 28 cm. |
| Altri autori (Enti) | SPIE |
| Collana | SPIE milestone series ; MS 27 |
| Soggetto topico | Ellipsometry |
| ISBN | 0819405701 |
| Classificazione |
53.7.8
516.15 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001234019707536 |
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Azzam, R.M.A.
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| Bellingham : SPIE Optical Engineering Press, c1991 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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