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10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001
| 10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2001 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 0-7695-1233-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ATS 2001 compendium |
| Record Nr. | UNISA-996217253003316 |
| [Place of publication not identified], : IEEE Computer Society, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2018 IEEE 27th Asian Test Symposium : 15-18 October 2018, Hefei, China / / IEEE Computer Society
| 2018 IEEE 27th Asian Test Symposium : 15-18 October 2018, Hefei, China / / IEEE Computer Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (79 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing |
| ISBN | 1-5386-9466-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280069103316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2018 IEEE 27th Asian Test Symposium : 15-18 October 2018, Hefei, China / / IEEE Computer Society
| 2018 IEEE 27th Asian Test Symposium : 15-18 October 2018, Hefei, China / / IEEE Computer Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (79 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing |
| ISBN | 1-5386-9466-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910296457603321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
| The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1990 |
| Disciplina | 621.381/5 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Automatic test equipment - Testing Semiconductors Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211380203316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1990 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
| The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1990 |
| Disciplina | 621.381/5 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Automatic test equipment - Testing Semiconductors Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872638003321 |
| [Place of publication not identified], : IEEE Computer Society Press, 1990 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
| International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2004 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Telecommunication Radio frequency Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202164503316 |
| [Place of publication not identified], : International Test Conference, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
| International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2004 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Telecommunication Radio frequency Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872538803321 |
| [Place of publication not identified], : International Test Conference, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC
| New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC |
| Pubbl/distr/stampa | [Place of publication not identified], : Computer Society Press of the IEEE, 1988 |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Automatic test equipment Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215160203316 |
| [Place of publication not identified], : Computer Society Press of the IEEE, 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC
| New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC |
| Pubbl/distr/stampa | [Place of publication not identified], : Computer Society Press of the IEEE, 1988 |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Automatic test equipment Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872681703321 |
| [Place of publication not identified], : Computer Society Press of the IEEE, 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings International Test Conference 2002
| Proceedings International Test Conference 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2002 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Telecommunication Radio frequency Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211258803316 |
| [Place of publication not identified], : International Test Conference, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
