.. East-West Design and Test Symposium
| .. East-West Design and Test Symposium |
| Pubbl/distr/stampa | Piscataway, NJ : , : Institute of Electrical and Electronics Engineers, Inc |
| Disciplina | 621.38195 |
| Soggetto topico |
Computer engineering
Electronic circuit design Electronic circuits - Testing Electronic digital computers - Circuits - Testing Integrated circuits - Testing |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. |
| ISSN | 2472-761X |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
EWDTS ..
Proceedings Proceedings of IEEE East-West Disign & Test Symposium Proceedings of IEEE East-West Disign and Test Symposium IEEE East-West Design & Test International Symposium |
| Record Nr. | UNISA-996581539603316 |
| Piscataway, NJ : , : Institute of Electrical and Electronics Engineers, Inc | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
.. East-West Design and Test Symposium
| .. East-West Design and Test Symposium |
| Pubbl/distr/stampa | Piscataway, NJ : , : Institute of Electrical and Electronics Engineers, Inc |
| Disciplina | 621.38195 |
| Soggetto topico |
Computer engineering
Electronic circuit design Electronic circuits - Testing Electronic digital computers - Circuits - Testing Integrated circuits - Testing |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. |
| ISSN | 2472-761X |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
EWDTS ..
Proceedings Proceedings of IEEE East-West Disign & Test Symposium Proceedings of IEEE East-West Disign and Test Symposium IEEE East-West Design & Test International Symposium |
| Record Nr. | UNINA-9910626115703321 |
| Piscataway, NJ : , : Institute of Electrical and Electronics Engineers, Inc | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001
| 10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2001 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 0-7695-1233-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ATS 2001 compendium |
| Record Nr. | UNISA-996217253003316 |
| [Place of publication not identified], : IEEE Computer Society, 2001 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2004 IEEE International High-Level Design Validation and Test Workshop
| 2004 IEEE International High-Level Design Validation and Test Workshop |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2004 |
| Descrizione fisica | 1 online resource |
| Disciplina | 005.14 |
| Soggetto topico |
Computer software - Verification
Electronic circuits - Testing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | HLDVT'04 - Ninth Annual IEEE International Workshop on High Level Design Validation and Test -- Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940) -- Copyright -- Chairs' welcome message -- Committees -- Table of contents -- TTTC: test technology technical council -- Session 1: formal techniques -- Enhancing sequential depth computation with a branch-and-bound algorithm -- Reference model based RTL verification: an integrated approach -- Dynamic guiding of bounded property checking -- Towards an efficient assertion based verification of SystemC designs. |
| Record Nr. | UNINA-9910872487603321 |
| [Place of publication not identified], : I E E E, 2004 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 15th Asian Test Symposium / / IEEE Computer Society
| 2006 15th Asian Test Symposium / / IEEE Computer Society |
| Pubbl/distr/stampa | Los Alamitos, California : , : IEEE, , 2006 |
| Descrizione fisica | 1 online resource (xxiii, 451 pages) : illustrations |
| Disciplina | 621.381548015192 |
| Soggetto topico | Electronic circuits - Testing |
| ISBN | 1-5090-9801-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 15th Asian Test Symposium |
| Record Nr. | UNISA-996198862003316 |
| Los Alamitos, California : , : IEEE, , 2006 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2006 15th Asian Test Symposium / / IEEE Computer Society
| 2006 15th Asian Test Symposium / / IEEE Computer Society |
| Pubbl/distr/stampa | Los Alamitos, California : , : IEEE, , 2006 |
| Descrizione fisica | 1 online resource (xxiii, 451 pages) : illustrations |
| Disciplina | 621.381548015192 |
| Soggetto topico | Electronic circuits - Testing |
| ISBN | 1-5090-9801-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 15th Asian Test Symposium |
| Record Nr. | UNINA-9910142739503321 |
| Los Alamitos, California : , : IEEE, , 2006 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2008 14th IEEE International On-Line Testing Symposium : 7-9 July 2008
| 2008 14th IEEE International On-Line Testing Symposium : 7-9 July 2008 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (306 pages) |
| Soggetto topico |
Electronic circuits - Testing
Online data processing Electronic circuit design |
| ISBN | 1-5090-7765-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996216495703316 |
| New York : , : IEEE, , 2008 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2008 14th IEEE International On-Line Testing Symposium : 7-9 July 2008
| 2008 14th IEEE International On-Line Testing Symposium : 7-9 July 2008 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (306 pages) |
| Soggetto topico |
Electronic circuits - Testing
Online data processing Electronic circuit design |
| ISBN | 1-5090-7765-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145679203321 |
| New York : , : IEEE, , 2008 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2008 17th Asian Test Symposium : 24-27 November 2008
| 2008 17th Asian Test Symposium : 24-27 November 2008 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (456 pages) |
| Soggetto topico |
Fault-tolerant computing
Electronic circuits - Testing Electronic digital computers - Circuits - Testing |
| ISBN | 1-5090-8449-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996198309403316 |
| New York : , : IEEE, , 2008 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2008 17th Asian Test Symposium : 24-27 November 2008
| 2008 17th Asian Test Symposium : 24-27 November 2008 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (456 pages) |
| Soggetto topico |
Fault-tolerant computing
Electronic circuits - Testing Electronic digital computers - Circuits - Testing |
| ISBN | 1-5090-8449-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910139855303321 |
| New York : , : IEEE, , 2008 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||