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Electric and electronic circuit simulation using TINA-TI® / / Farzin Asadi
| Electric and electronic circuit simulation using TINA-TI® / / Farzin Asadi |
| Autore | Asadi Farzin |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Oxon, UK : , : River Publishers, , [2022] |
| Descrizione fisica | 1 online resource (458 pages) |
| Disciplina | 621.3815 |
| Collana | River Publishers Series in Circuits and Systems |
| Soggetto topico |
Electronic circuits - Computer simulation
Electronic circuits - Data processing |
| ISBN |
1-00-333279-X
1-000-77351-5 1-000-77346-9 1-003-33279-X 87-7022-685-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910794620203321 |
Asadi Farzin
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| Oxon, UK : , : River Publishers, , [2022] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electric and electronic circuit simulation using TINA-TI® / / Farzin Asadi
| Electric and electronic circuit simulation using TINA-TI® / / Farzin Asadi |
| Autore | Asadi Farzin |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Oxon, UK : , : River Publishers, , [2022] |
| Descrizione fisica | 1 online resource (458 pages) |
| Disciplina | 621.3815 |
| Collana | River Publishers Series in Circuits and Systems |
| Soggetto topico |
Electronic circuits - Computer simulation
Electronic circuits - Data processing |
| ISBN |
1-00-333279-X
1-000-77351-5 1-000-77346-9 1-003-33279-X 87-7022-685-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910812168603321 |
|
Asadi Farzin
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| Oxon, UK : , : River Publishers, , [2022] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic circuit design and application / / Stephan J. G. Gift and Brent Maundy
| Electronic circuit design and application / / Stephan J. G. Gift and Brent Maundy |
| Autore | Gift Stephan J. G. |
| Edizione | [1st edition 2021.] |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2020] |
| Descrizione fisica | 1 online resource (XXI, 595 p. 1032 illus., 12 illus. in color.) |
| Disciplina | 621.3815 |
| Soggetto topico |
Electronic circuit design
Electronic circuits - Data processing |
| ISBN | 3-030-46989-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Semiconductor Diodes -- Bipolar Junction Transistor -- Field Effect Transistor -- BJT Models -- FET Models -- Multi-Transistor and Special Circuits -- Frequency Response of Transistor Amplifiers -- Feedback Amplifiers -- Operational Amplifiers -- Power Amplifiers -- Oscillators -- Power Supplies -- Active Filters -- Waveform Generators -- Special Devices. |
| Record Nr. | UNINA-9910483086503321 |
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Gift Stephan J. G.
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| Cham, Switzerland : , : Springer, , [2020] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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RF and time-domain techniques for evaluating novel semiconductor transistors / / Keith A. Jenkins
| RF and time-domain techniques for evaluating novel semiconductor transistors / / Keith A. Jenkins |
| Autore | Jenkins Keith A. <1953-> |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer International Publishing, , [2021] |
| Descrizione fisica | 1 online resource (173 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Electronic circuits - Data processing
Telecommunication - Safety measures |
| ISBN | 3-030-77775-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Intro -- Preface -- Acknowledgments -- Contents -- About the Author -- Chapter 1: The Novel Transistor Characterization Challenge -- 1.1 Introduction: Why This Book? -- 1.2 General Measurement Conditions and Terminology -- 1.2.1 Small-Signal vs Large-Signal -- 1.2.2 Frequency-Domain vs Time-Domain -- 1.2.3 Continuous-Wave vs Transient Signals -- 1.3 Overview of the Content of the Book -- Chapter 2: High-Frequency Test Equipment, Connections, and Contact with Transistors -- 2.1 Introduction -- 2.2 Signal Detection Instruments -- 2.2.1 Spectrum Analyzer -- 2.2.2 Vector Network Analyzer -- 2.2.3 Oscilloscope -- 2.3 Stimulus Instruments -- 2.4 Transmission Lines and Interconnections -- 2.5 Cables, Connectors, and Bandwidth -- 2.6 Bias Tees and Resistor Tees -- 2.7 Transistor Probing -- 2.8 Probe Pad Design -- References -- Chapter 3: Measurement of the Frequency Response of Transistors -- 3.1 Introduction -- 3.2 Methods for Low-Current Transistors -- 3.2.1 Transistor Structures -- 3.2.2 Rectification Technique -- 3.2.3 Direct Gain Measurement Technique -- 3.3 Frequency Performance Figure-of-Merit and Linear Model -- 3.3.1 AC Linear Model of Transistors -- 3.3.2 Measuring Small-Signal Current Gain with S-Parameters -- 3.3.3 Calibration -- 3.3.4 De-Embedding Procedure -- 3.3.5 Measurement Examples -- 3.3.6 Definition of the Physical Open Structure -- 3.3.7 Other Performance Figures-of-Merit -- References -- Chapter 4: Case Studies in the Evaluation of Novel Transistors -- 4.1 Voltage Gain of a Low-Current Transistor as a Function of Frequency -- 4.2 Vertical Gate Resistance -- 4.2.1 Detecting Gate Discontinuity Using VNA Measurements -- 4.2.2 Measuring Vertical Gate Resistance in Continuous Gate Stack -- References -- Chapter 5: Measurement of the AC Linearity of Transistors -- 5.1 Linearity Overview -- 5.2 One-Tone Non-Linearity: Gain Compression.
5.3 Two-Tone Non-Linearity: Third-Order Intercept -- References -- Chapter 6: Measurement of the Large-Signal Propagation Delay of Single Transistors -- 6.1 Single Transistor Figure-of-Merit -- 6.2 Direct Propagation Delay Measurement -- 6.3 Ring Oscillators to Measure Delay -- 6.3.1 Ring Oscillator Frequency Measurement -- 6.3.2 Ring Oscillators with Novel Transistors -- 6.4 Instability in Digital Gates -- 6.4.1 Gated Ring Oscillators and Delay Chains -- 6.4.2 Transistor Aging -- 6.4.3 Drift and Jitter -- References -- Chapter 7: Measurement of the Transient Response of Transistors -- 7.1 Transient Effects in Transistors -- 7.2 Voltage Measurement Methods -- 7.3 Fast Source and Measurement Units -- 7.4 Pulsed I-V Method -- 7.5 Pulse-Train Method -- 7.6 Fast Edge Methods -- References -- Appendix A: Measuring Transistors with Controlled Temperature -- Index. |
| Record Nr. | UNINA-9910523716403321 |
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Jenkins Keith A. <1953->
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| Cham, Switzerland : , : Springer International Publishing, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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