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Correction factors for on-line microprobe analysis of multielement alloy systems [[electronic resource] /] / Jalaiah Unnam, Darrel R. Tenney, and William D. Brewer
| Correction factors for on-line microprobe analysis of multielement alloy systems [[electronic resource] /] / Jalaiah Unnam, Darrel R. Tenney, and William D. Brewer |
| Autore | Unnam Jalaiah |
| Pubbl/distr/stampa | Washington, D.C. : , : National Aeronautics and Space Administration, Scientific and Technical Information Office, , 1977 |
| Descrizione fisica | 1 online resource (v, 211 pages) : illustrations |
| Altri autori (Persone) |
TenneyDarrel R
BrewerWilliam D |
| Collana | NASA reference publication |
| Soggetto topico |
Electron probe microanalysis
Alloys - Analysis Microprobe analysis X-ray microanalysis |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910701999403321 |
Unnam Jalaiah
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| Washington, D.C. : , : National Aeronautics and Space Administration, Scientific and Technical Information Office, , 1977 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Evaluation of off-axis measurements performed in an anechoic chamber / / Motohisa. Kanda
| Evaluation of off-axis measurements performed in an anechoic chamber / / Motohisa. Kanda |
| Autore | Kanda Motohisa |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | KandaMotohisa |
| Collana | NBS technical note |
| Soggetto topico |
Anechoic chambers
Electromagnetic measurements Electron probe microanalysis |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711214403321 |
|
Kanda Motohisa
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Micron
| Micron |
| Pubbl/distr/stampa | Oxford ; ; New York, : Pergamon Press, : Elsevier |
| Soggetto topico |
Microscopy
Electron probe microanalysis Electron Probe Microanalysis Microscopie Microanalyse par sonde électronique |
| Soggetto genere / forma | Periodicals. |
| ISSN | 1878-4291 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199885703316 |
| Oxford ; ; New York, : Pergamon Press, : Elsevier | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Micron
| Micron |
| Pubbl/distr/stampa | Oxford ; ; New York, : Pergamon Press, : Elsevier |
| Soggetto topico |
Microscopy
Electron probe microanalysis Electron Probe Microanalysis Microscopie Microanalyse par sonde électronique |
| Soggetto genere / forma | Periodicals. |
| ISSN | 1878-4291 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910333249003321 |
| Oxford ; ; New York, : Pergamon Press, : Elsevier | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nanobeam x-ray scattering : probing matter at the nanoscale / / Julian Stangl [and three others]
| Nanobeam x-ray scattering : probing matter at the nanoscale / / Julian Stangl [and three others] |
| Autore | Stangl Julian |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & sons, , 2013 |
| Descrizione fisica | 1 online resource (284 p.) |
| Disciplina | 539.7222 |
| Soggetto topico |
Electron probe microanalysis
Nanotechnology X-rays - Scattering |
| ISBN |
3-527-65508-5
3-527-65506-9 3-527-65509-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Nanobeam X-Ray Scattering; Contents; Foreword; Preface; 1 Introduction; 1.1 X-ray Interaction with Matter; 1.1.1 Transmission of X-ray; 1.1.2 Diffraction of X-rays; 1.1.3 X-ray Elemental Sensitivity; 1.2 Diffraction at Different Length scales and Real-Space Resolution; 1.2.1 How to Produce an X-ray Nanobeam; 1.2.2 Experiments with Nanobeams; 1.2.3 Coherence Properties of Small Beams; 1.2.4 Side Issues ?; 1.3 Future Developments; 2 X-ray Diffraction Principles; 2.1 A Brief Introduction to Diffraction Theory; 2.1.1 Interference of X-ray Waves; 2.2 Kinematic X-ray Diffraction Theory
2.2.1 The Structure Factor 2.2.2 The Form Factor; 2.2.3 Reciprocal Lattice of Nanostructures; 2.2.4 The Phase Problem; 2.3 Reflectivity; 2.4 Properties of X-ray Beams; 2.5 A Note on Coherence; 2.5.1 Longitudinal Coherence and Wavelength Distribution; 2.5.2 Longitudinal Coherence Length; 2.5.3 Transverse Coherence and Thermal Sources; 2.5.4 Transverse Coherence Length; 2.6 X-ray Sources; 2.7 Diffraction Measurement: How to Access q in a Real Experiment; 2.7.1 Diffraction Geometries; 2.7.2 Length scales; 3 X-ray Focusing Elements Characterization; 3.1 Introduction and Context 3.2 Refractive X-ray Lenses 3.2.1 Characterization of Focusing Elements; 3.2.2 Spherical Refractive X-ray Lenses; 3.2.3 Parabolic Compound Refractive Lenses (CRL); 3.2.4 Kinoform Lenses; 3.2.5 Characteristics of the Refractive Lenses; 3.3 X-ray Mirrors. Reflection of X-rays at Surfaces; 3.3.1 Reflective X-ray Optics (Kirkpatrick-Baez Mirrors); 3.3.2 Capillaries; 3.3.3 Waveguides (Resonators); 3.3.4 Other Reflective Optical Elements; 3.4 Diffraction X-ray Optics; 3.4.1 Fresnel Zone Plates; 3.4.2 Hologram of a Point Object; 3.4.3 Quantities Characterizing a Binary Zone Plate 3.4.4 Multilevel Zone Plate 3.4.5 Getting a Clean and Intense Focused Beam with ZPs; 3.4.6 Bragg-Fresnel Lenses; 3.4.7 Multilayer Laue Lenses; 3.4.8 Photon Sieves; 3.4.9 Beam Compressors; 3.5 Other X-ray Optics; 3.6 Measuring the Size of the X-ray Focused Spot; 3.7 Conclusion; 4 Scattering Experiments Using Nanobeams; 4.1 From the Ensemble Average Approach towards the Single Nanostructure Study; 4.1.1 A Motivation for the Use of Small X-ray Beams; 4.1.2 Required Focused Beam Properties; 4.2 Scanning X-ray Diffraction Microscopy; 4.3 Finite Element Based Analysis of Diffraction Data 4.4 Single Structure Inside a Device 4.5 Examples from Biology; 4.6 Recent Experiments: The Current Limits; 4.6.1 Strain Distribution in Nanoscale Ridges; 4.6.2 Between Single Structure and Ensemble Average; 4.7 Outlook; 4.7.1 Experimental Developments; 5 Nanobeam Diffraction Setups; 5.1 Introduction; 5.2 Typical X-ray Diffraction Setup; 5.3 Nanodiffraction Setup Requirements; 5.3.1 Diffractometer; 5.3.2 Restriction of Setup; 5.3.3 Stability: How to Keep the Beam on the Sample; 5.3.4 Beating Drifts: More Solutions; 5.4 Nanobeam and Coherence Setup 5.5 Detectors: Pixel and Time Resolution, Dynamical Range |
| Record Nr. | UNINA-9910139013203321 |
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Stangl Julian
|
||
| Hoboken, New Jersey : , : John Wiley & sons, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nanobeam x-ray scattering : probing matter at the nanoscale / / Julian Stangl [and three others]
| Nanobeam x-ray scattering : probing matter at the nanoscale / / Julian Stangl [and three others] |
| Autore | Stangl Julian |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & sons, , 2013 |
| Descrizione fisica | 1 online resource (284 p.) |
| Disciplina | 539.7222 |
| Soggetto topico |
Electron probe microanalysis
Nanotechnology X-rays - Scattering |
| ISBN |
3-527-65508-5
3-527-65506-9 3-527-65509-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Nanobeam X-Ray Scattering; Contents; Foreword; Preface; 1 Introduction; 1.1 X-ray Interaction with Matter; 1.1.1 Transmission of X-ray; 1.1.2 Diffraction of X-rays; 1.1.3 X-ray Elemental Sensitivity; 1.2 Diffraction at Different Length scales and Real-Space Resolution; 1.2.1 How to Produce an X-ray Nanobeam; 1.2.2 Experiments with Nanobeams; 1.2.3 Coherence Properties of Small Beams; 1.2.4 Side Issues ?; 1.3 Future Developments; 2 X-ray Diffraction Principles; 2.1 A Brief Introduction to Diffraction Theory; 2.1.1 Interference of X-ray Waves; 2.2 Kinematic X-ray Diffraction Theory
2.2.1 The Structure Factor 2.2.2 The Form Factor; 2.2.3 Reciprocal Lattice of Nanostructures; 2.2.4 The Phase Problem; 2.3 Reflectivity; 2.4 Properties of X-ray Beams; 2.5 A Note on Coherence; 2.5.1 Longitudinal Coherence and Wavelength Distribution; 2.5.2 Longitudinal Coherence Length; 2.5.3 Transverse Coherence and Thermal Sources; 2.5.4 Transverse Coherence Length; 2.6 X-ray Sources; 2.7 Diffraction Measurement: How to Access q in a Real Experiment; 2.7.1 Diffraction Geometries; 2.7.2 Length scales; 3 X-ray Focusing Elements Characterization; 3.1 Introduction and Context 3.2 Refractive X-ray Lenses 3.2.1 Characterization of Focusing Elements; 3.2.2 Spherical Refractive X-ray Lenses; 3.2.3 Parabolic Compound Refractive Lenses (CRL); 3.2.4 Kinoform Lenses; 3.2.5 Characteristics of the Refractive Lenses; 3.3 X-ray Mirrors. Reflection of X-rays at Surfaces; 3.3.1 Reflective X-ray Optics (Kirkpatrick-Baez Mirrors); 3.3.2 Capillaries; 3.3.3 Waveguides (Resonators); 3.3.4 Other Reflective Optical Elements; 3.4 Diffraction X-ray Optics; 3.4.1 Fresnel Zone Plates; 3.4.2 Hologram of a Point Object; 3.4.3 Quantities Characterizing a Binary Zone Plate 3.4.4 Multilevel Zone Plate 3.4.5 Getting a Clean and Intense Focused Beam with ZPs; 3.4.6 Bragg-Fresnel Lenses; 3.4.7 Multilayer Laue Lenses; 3.4.8 Photon Sieves; 3.4.9 Beam Compressors; 3.5 Other X-ray Optics; 3.6 Measuring the Size of the X-ray Focused Spot; 3.7 Conclusion; 4 Scattering Experiments Using Nanobeams; 4.1 From the Ensemble Average Approach towards the Single Nanostructure Study; 4.1.1 A Motivation for the Use of Small X-ray Beams; 4.1.2 Required Focused Beam Properties; 4.2 Scanning X-ray Diffraction Microscopy; 4.3 Finite Element Based Analysis of Diffraction Data 4.4 Single Structure Inside a Device 4.5 Examples from Biology; 4.6 Recent Experiments: The Current Limits; 4.6.1 Strain Distribution in Nanoscale Ridges; 4.6.2 Between Single Structure and Ensemble Average; 4.7 Outlook; 4.7.1 Experimental Developments; 5 Nanobeam Diffraction Setups; 5.1 Introduction; 5.2 Typical X-ray Diffraction Setup; 5.3 Nanodiffraction Setup Requirements; 5.3.1 Diffractometer; 5.3.2 Restriction of Setup; 5.3.3 Stability: How to Keep the Beam on the Sample; 5.3.4 Beating Drifts: More Solutions; 5.4 Nanobeam and Coherence Setup 5.5 Detectors: Pixel and Time Resolution, Dynamical Range |
| Record Nr. | UNINA-9910818082403321 |
|
Stangl Julian
|
||
| Hoboken, New Jersey : , : John Wiley & sons, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Possible estimation methodologies for electromagnetic field distributions in complex environments / / Motohisa. Kanda
| Possible estimation methodologies for electromagnetic field distributions in complex environments / / Motohisa. Kanda |
| Autore | Kanda Motohisa |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1985 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | KandaMotohisa |
| Collana | NBS technical note |
| Soggetto topico |
Electromagnetic fields
Electromagnetic measurements Electron probe microanalysis |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711229903321 |
|
Kanda Motohisa
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1985 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
