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Electron microscopy 1980 : proceedings of the 7th European Congress on Electron Microscopy, The Hague, The Netherlands, August 24-29, 1980 / edited by P. Brederoo...[et al.]
| Electron microscopy 1980 : proceedings of the 7th European Congress on Electron Microscopy, The Hague, The Netherlands, August 24-29, 1980 / edited by P. Brederoo...[et al.] |
| Autore | European Congress on electron microscopy <7. ; 1980 ; Hague, Netherlands> |
| Pubbl/distr/stampa | Leiden : Seventh European Congress on Electron Microscopy Foundation, 1980 |
| Descrizione fisica | 4 v. : ill. ; 27 cm |
| Disciplina | 502.825 |
| Altri autori (Persone) | Brederoo, P. |
| Collana | International Conference on high voltage electron microscopy ; 6 |
| Soggetto topico | Electron microscopy - Congresses |
| Classificazione |
53(082.2)
53.0.691 LC QH212.E4 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000910339707536 |
European Congress on electron microscopy <7. ; 1980 ; Hague, Netherlands>
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| Leiden : Seventh European Congress on Electron Microscopy Foundation, 1980 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Microscopy of semiconducting materials : proceedings of the Institute of Physics Conference held in St. Catherine's College Oxford, 21-23 March 1983 / A.G. Cullis, S.M. Davidson and G.R. Booker (eds.)
| Microscopy of semiconducting materials : proceedings of the Institute of Physics Conference held in St. Catherine's College Oxford, 21-23 March 1983 / A.G. Cullis, S.M. Davidson and G.R. Booker (eds.) |
| Autore | Institute of Physics : Conference on microscopy of semiconducting materials |
| Pubbl/distr/stampa | Bristol : IOP Publishing, 1983 |
| Descrizione fisica | xii, 520 p. : ill. ; 24 cm. |
| Altri autori (Persone) |
Cullis, A.G.
Davidson, S.M. Booker, G.R. |
| Collana | Conference Series ; 67 |
| Soggetto topico |
Electron microscopy - Congresses
Semiconductors - Congresses |
| ISBN | 0854981586 |
| Classificazione |
53.7.16
53.7.18 53.8.22 537.6'22 QC610.9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001088489707536 |
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Institute of Physics : Conference on microscopy of semiconducting materials
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| Bristol : IOP Publishing, 1983 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Nanoscale spectroscopy and its applications to semiconductor research / Y. Watanabe ... [et al.]
| Nanoscale spectroscopy and its applications to semiconductor research / Y. Watanabe ... [et al.] |
| Autore | International Workshop on Nanoscale Spectroscopy and its Applications to Semiconductor Research <2000 ; Trieste, Italy> |
| Pubbl/distr/stampa | Berlin ; New York : Springer, c2002 |
| Descrizione fisica | xv, 306 p. : ill. ; 24 cm |
| Disciplina | 621.38152 |
| Altri autori (Persone) | Watanabe, Yoshio |
| Collana | Lecture notes in physics, 0075-8450 ; 588 |
| Soggetto topico |
Electron spectroscopy - Congresses
Electron microscopy - Congresses Semiconductors - Materials - Congresses Nanostructured materials - Congresses |
| ISBN | 3540433120 |
| Classificazione |
LC QC454.E4
621.3.2.4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000991489707536 |
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International Workshop on Nanoscale Spectroscopy and its Applications to Semiconductor Research <2000 ; Trieste, Italy>
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| Berlin ; New York : Springer, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Proceedings of 5th Multinational Congress on Electron Microscopy : September 20-25, 2001, Lecce, Italy / edited by L. Dini, M. Catalano
| Proceedings of 5th Multinational Congress on Electron Microscopy : September 20-25, 2001, Lecce, Italy / edited by L. Dini, M. Catalano |
| Autore | Multinational Congress on Electron Microscopy <5th ; 2001 ; Lecce> |
| Pubbl/distr/stampa | Princeton : Rinton Press, c2001 |
| Descrizione fisica | xxx, 578 p. : ill. ; 24 cm |
| Disciplina | 502.82 |
| Altri autori (Persone) |
Dini, Luciana
Catalano, Massimo |
| Soggetto topico | Electron microscopy - Congresses |
| ISBN | 9781589490031 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001901999707536 |
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Multinational Congress on Electron Microscopy <5th ; 2001 ; Lecce>
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| Princeton : Rinton Press, c2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Surface and interface characterization by electron optical methods / edited by A. Howie and U. Valdrè
| Surface and interface characterization by electron optical methods / edited by A. Howie and U. Valdrè |
| Autore | NATO Advanced Study Institute on the study of surfaces and interfaces by electron optical techniques <1987 ; Erice, Italy> |
| Pubbl/distr/stampa | New York : Plenum Press : Published in cooperation with the NATO Scientific Affairs Division, c1988 |
| Descrizione fisica | viii, 319 p. : ill. (some col.) ; 26 cm. |
| Altri autori (Persone) |
Howie, A.
Valdrè, U. |
| Collana | NATO ASI Series. Series B, Physics ; 191 |
| Soggetto topico |
Electron microscope, transmission - Congresses
Electron microscopy - Congresses Surfaces (Physics)-Technique - Congresses |
| ISBN | 030643086X |
| Classificazione |
530.4'1
QC173.4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001281069707536 |
