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1996 11th International Conference on High-Power Particle Beams : 10-14 June 1996
| 1996 11th International Conference on High-Power Particle Beams : 10-14 June 1996 |
| Pubbl/distr/stampa | Stevenage, England : , : IET, , 2012 |
| Descrizione fisica | 1 online resource (1307 pages) |
| Soggetto topico |
Particle beams
Electron beams |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996218169403316 |
| Stevenage, England : , : IET, , 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2018 20th International Symposium on High-Current Electronics : 16-22 September 2018, Tomsk, Russia / / IEEE Nuclear and Plasma Sciences Society
| 2018 20th International Symposium on High-Current Electronics : 16-22 September 2018, Tomsk, Russia / / IEEE Nuclear and Plasma Sciences Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (97 pages) |
| Disciplina | 621.381 |
| Soggetto topico |
Electron beams
Electric discharges Microwaves |
| ISBN | 1-5386-6891-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280364203316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2018 20th International Symposium on High-Current Electronics : 16-22 September 2018, Tomsk, Russia / / IEEE Nuclear and Plasma Sciences Society
| 2018 20th International Symposium on High-Current Electronics : 16-22 September 2018, Tomsk, Russia / / IEEE Nuclear and Plasma Sciences Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (97 pages) |
| Disciplina | 621.381 |
| Soggetto topico |
Electron beams
Electric discharges Microwaves |
| ISBN | 1-5386-6891-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910293158903321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Additive manufacturing modeling and simulation : a literature review for electron beam free form fabrication / / William J. Seufzer
| Additive manufacturing modeling and simulation : a literature review for electron beam free form fabrication / / William J. Seufzer |
| Autore | Seufzer William J (William James), <1961-> |
| Pubbl/distr/stampa | Hampton, Virginia : , : National Aeronautics and Space Administration, Langley Research Center, , April 2014 |
| Descrizione fisica | 1 online resource (vii, 23 pages) |
| Collana | NASA/TM |
| Soggetto topico |
Additives
Deposition Electron beams Fabrication Feedback control Simulation |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Additive manufacturing modeling and simulation |
| Record Nr. | UNINA-9910702428803321 |
Seufzer William J (William James), <1961->
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| Hampton, Virginia : , : National Aeronautics and Space Administration, Langley Research Center, , April 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Beam diagnostics in superconducting accelerating cavities : the extraction of transverse beam position from beam-excited higher order modes / / Pei Zhang
| Beam diagnostics in superconducting accelerating cavities : the extraction of transverse beam position from beam-excited higher order modes / / Pei Zhang |
| Autore | Zhang Pei |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | New York, : Springer, 2013 |
| Descrizione fisica | 1 online resource (128 p.) |
| Disciplina | 530 |
| Collana | Springer theses : recognizing outstanding Ph.D. research |
| Soggetto topico |
Electron beams
Particle accelerators |
| ISBN | 3-319-00759-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Electromagnetic Eigenmode Simulations of the Third Harmonic Cavity -- Measurements of HOM Spectra -- Analysis Methods for Beam Position Extraction from HOM -- Dependencies of HOM on Transverse Beam Offsets -- HOM-Based Beam Position Diagnostics. |
| Record Nr. | UNINA-9910741166603321 |
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Zhang Pei
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| New York, : Springer, 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Beam-Based Correction and Optimization for Accelerators [[electronic resource]]
| Beam-Based Correction and Optimization for Accelerators [[electronic resource]] |
| Autore | Huang Xiaobiao |
| Pubbl/distr/stampa | [S.l.], : CRC PRESS, 2019 |
| Descrizione fisica | 1 online resource (253 pages) |
| Disciplina | 537.5 |
| Soggetto topico |
Electron beams
Beam emittance (Nuclear physics) |
| Soggetto non controllato |
Accelerator errors
Accelerator failure Accelerator performance High energy accelerator Particle accelerator |
| ISBN |
0-429-78473-2
0-429-78474-0 0-429-43435-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Basics of beam dynamics -- Beam dynamics topics -- Orbit and trajectory correction -- Linear optics measurement and correction I -- Linear optics measurement and correction II -- Coupling and nonlinear dynamics correction -- Online optimization algorithms -- Application of beam-based optimization. |
| Record Nr. | UNINA-9910552988803321 |
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Huang Xiaobiao
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| [S.l.], : CRC PRESS, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Cathode-ray-oscillograph beam intensification / / John H. Park, H.N. Cones
| Cathode-ray-oscillograph beam intensification / / John H. Park, H.N. Cones |
| Autore | Park John H |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1953 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
ConesH. N
ParkJohn H |
| Collana | NBS report |
| Soggetto topico |
Cathode ray oscillographs
Electron beams |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711281103321 |
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Park John H
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1953 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Characterization of silicon-gate CMOS/SOS integrated circuits processed with ion implantation / / D.S. Woo
| Characterization of silicon-gate CMOS/SOS integrated circuits processed with ion implantation / / D.S. Woo |
| Autore | Woo D. S. |
| Pubbl/distr/stampa | Marshall Space Flight Center, AL : , : George C. Marshall Space Flight Center, , January 1982 |
| Descrizione fisica | 1 online resource (v, 12 pages, 1 unnumbered page) : illustrations |
| Collana | NASA/CR |
| Soggetto topico |
Computer aided design
Coding Ion implantation Masks Electron beams |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910709974503321 |
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Woo D. S.
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| Marshall Space Flight Center, AL : , : George C. Marshall Space Flight Center, , January 1982 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes / / C.M. Schnabel [and six others]
| Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes / / C.M. Schnabel [and six others] |
| Autore | Schnabel C. M. |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , February 2000 |
| Descrizione fisica | 1 online resource (4 pages) : illustrations |
| Collana | NASA/TM |
| Soggetto topico |
Correlation
Synchrotrons Topography Beam currents Electron beams Schottky diodes Crystal defects |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Correlation of electron-beam-induced current and synchrotron white-beam X-ray topography imaged defects and epilayer growth pits in 6H-SiC Schottky diodes |
| Record Nr. | UNINA-9910706231503321 |
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Schnabel C. M.
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , February 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Development program on a cold cathode electron gun [[electronic resource] ] : annual report / / by C.A. Spindt, C.E. Holland
| Development program on a cold cathode electron gun [[electronic resource] ] : annual report / / by C.A. Spindt, C.E. Holland |
| Autore | Spindt C. A |
| Pubbl/distr/stampa | Menlo Park, Calif. : , : SRI International |
| Descrizione fisica | 1 online resource (ix, 63 pages) : illustrations |
| Altri autori (Persone) | HollandChristopher E |
| Collana | [NASA contractor report] ; CR 174792 |
| Soggetto topico |
Arrays
Cold cathodes Electron beams Electron guns Emission spectra Microscopy Product development |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Development program on a cold cathode electron gun |
| Record Nr. | UNINA-9910701721403321 |
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Spindt C. A
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| Menlo Park, Calif. : , : SRI International | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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