Electromigration in ULSI interconnections [[electronic resource] /] / Cher Ming Tan |
Autore | Tan Cher Ming <1959-> |
Pubbl/distr/stampa | Hackensack, N.J., : World Scientific, c2010 |
Descrizione fisica | 1 online resource (312 p.) |
Disciplina | 621.395 |
Collana | International series on advances in solid state electronics and technology (ASSET) |
Soggetto topico |
Integrated circuits - Ultra large scale integration
Electrodiffusion |
Soggetto genere / forma | Electronic books. |
ISBN |
1-283-14371-2
9786613143716 981-4273-33-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface; Contents; 1. Introduction; 2. History of Electromigration; 3. Experimental Studies of Al Interconnections; 4. Experimental Studies of Cu Interconnections; 5. Numerical Modeling of Electromigration; 6. Future Challenges; Index; Biography |
Record Nr. | UNINA-9910456216003321 |
Tan Cher Ming <1959->
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Hackensack, N.J., : World Scientific, c2010 | ||
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Lo trovi qui: Univ. Federico II | ||
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Electromigration in ULSI interconnections [[electronic resource] /] / Cher Ming Tan |
Autore | Tan Cher Ming <1959-> |
Pubbl/distr/stampa | Hackensack, N.J., : World Scientific, c2010 |
Descrizione fisica | 1 online resource (312 p.) |
Disciplina | 621.395 |
Collana | International series on advances in solid state electronics and technology (ASSET) |
Soggetto topico |
Integrated circuits - Ultra large scale integration
Electrodiffusion |
ISBN |
1-283-14371-2
9786613143716 981-4273-33-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface; Contents; 1. Introduction; 2. History of Electromigration; 3. Experimental Studies of Al Interconnections; 4. Experimental Studies of Cu Interconnections; 5. Numerical Modeling of Electromigration; 6. Future Challenges; Index; Biography |
Record Nr. | UNINA-9910780711903321 |
Tan Cher Ming <1959->
![]() |
||
Hackensack, N.J., : World Scientific, c2010 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Electromigration in ULSI interconnections / / Cher Ming Tan |
Autore | Tan Cher Ming <1959-> |
Edizione | [1st ed.] |
Pubbl/distr/stampa | Hackensack, N.J., : World Scientific, c2010 |
Descrizione fisica | 1 online resource (312 p.) |
Disciplina | 621.395 |
Collana | International series on advances in solid state electronics and technology (ASSET) |
Soggetto topico |
Integrated circuits - Ultra large scale integration
Electrodiffusion |
ISBN |
1-283-14371-2
9786613143716 981-4273-33-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface; Contents; 1. Introduction; 2. History of Electromigration; 3. Experimental Studies of Al Interconnections; 4. Experimental Studies of Cu Interconnections; 5. Numerical Modeling of Electromigration; 6. Future Challenges; Index; Biography |
Record Nr. | UNINA-9910822511903321 |
Tan Cher Ming <1959->
![]() |
||
Hackensack, N.J., : World Scientific, c2010 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Electromigration on semiconductor integrated circuits [[electronic resource]] |
Pubbl/distr/stampa | Washington, DC : , : U.S. Nuclear Regulatory Commission, Office of Nuclear Reactror Regulation, , [2002] |
Descrizione fisica | 1 online resource (2 pages) |
Collana | NRC information notice |
Soggetto topico |
Integrated circuits
Semiconductors Electrodiffusion |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910699662703321 |
Washington, DC : , : U.S. Nuclear Regulatory Commission, Office of Nuclear Reactror Regulation, , [2002] | ||
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Lo trovi qui: Univ. Federico II | ||
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