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Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson
| Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson |
| Autore | Gupta K. M. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Scrivener Publishing, , 2015 |
| Descrizione fisica | 1 online resource (1140 p.) |
| Disciplina | 621.315 |
| Collana | Advanced Material Series |
| Soggetto topico |
Capacitors
Electric resistors Electronics - Materials |
| ISBN |
1-118-99857-X
1-118-99856-1 1-118-99858-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright page; Dedication; Preface; Acknowledgement; About the Authors; Abbreviations; Chapter 1: General Introduction to Electrical and Electronic Materials; 1.1 Importance of Materials; 1.2 Importance of Electrical and Electronic Materials; 1.3 Classification of Electrical and Electronic Materials; 1.4 Scope of Electrical and Electronic Materials; 1.5 Requirements of Engineering Materials; 1.6 Operational Requirements of Electrical and Electronic Materials; 1.7 Classification of Solids on the Basis of Energy Gap
1.8 Glimpse of Some Electronic Products, Their Working Principles and Choicest Materials1.9 Different Types of Engineering Materials; 1.10 Different Levels of Materials Structure; 1.11 Spintronics (The Electronics of Tomorrow) and Spintronic Materials; 1.12 Ferromagnetic Semiconductor; 1.13 Left-Handed (LH) Materials; 1.14 Solved Examples; Chapter 2: Atomic Models, Bonding in Solids, Crystal Geometry, and Miller Indices; 2.1 Atomic Models; 2.2 Bohr's Quantum Atomic Model; 2.3 Modern Concept of Atomic Model; 2.4 Electron Configuration; 2.5 Meaning of Chemical (or Atomic) Bonding 2.6 Classification of Chemical Bonds2.7 Ionic Bond; 2.8 Covalent Bonds; 2.9 Monocrystalline and Polycrystalline Crystal Structures; 2.10 Space Lattice; 2.11 Basis; 2.12 Unit Cell and Crystal; 2.13 Bravais Crystal System; 2.14 Primitive and Non-Primitive Unit Cells; 2.15 Coordination Number; 2.16 Atomic Packing Fraction; 2.17 Calculation of Density (or Bulk Density); 2.18 Miller Indices; 2.19 Interplaner Spacing; 2.20 Linear Density; 2.21 Planer Density; Chapter 3: Solid Structures, Characterization of Materials, Crystal Imperfections, and Mechanical Properties of Materials 3.1 Crystallography3.2 Crystalline and Non-Crystalline Structures; 3.3 Hexagonally Closed Packed Structure (HCP); 3.4 VOIDS; 3.5 Covalent Solids; 3.6 Bragg's Law of X-Rays Diffraction; 3.7 Structure Determination; 3.8 Microscopy; 3.9 Different Types of Metallurgical Microscopes and Their Features; 3.10 Working Principle of Electron Microscope; 3.11 Ideal and Real Crystals, and Imperfections; 3.12 Classification of Imperfections; 3.13 Point Imperfections; 3.14 Effects of Point Imperfections; 3.15 Line Imperfections; 3.16 Features of Edge Dislocation; 3.17 Screw Dislocation 3.18 Characteristics of Dislocations3.19 Sources of Dislocations, Their Effects and Remedies; 3.20 Grain Boundary; 3.21 Twin or Twinning; 3.22 Mechanical Properties of Metals; Chapter 4: Conductive Materials: Electron Theories, Properties and Behaviour; 4.1 Electrons and Their Role in Conductivity; 4.2 Electron Theories of Solids; 4.3 Free Electron Theory; 4.4 Energy Band Theory; 4.5 Brillouin Zone Theory; 4.6 Conductors; 4.7 Factors Affecting Conductivity (and Resistivity) of Metals; 4.8 Thermal Conductivity; 4.9 Heating Effect of Current; 4.10 Thermoelectric Effect (or Thermoelectricity) 4.11 Seebeck Effect |
| Record Nr. | UNISA-996202316803316 |
Gupta K. M.
|
||
| Hoboken, New Jersey : , : Scrivener Publishing, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson
| Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson |
| Autore | Gupta K. M. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Scrivener Publishing, , 2015 |
| Descrizione fisica | 1 online resource (1140 p.) |
| Disciplina | 621.315 |
| Collana | Advanced Material Series |
| Soggetto topico |
Capacitors
Electric resistors Electronics - Materials |
| ISBN |
1-118-99857-X
1-118-99856-1 1-118-99858-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright page; Dedication; Preface; Acknowledgement; About the Authors; Abbreviations; Chapter 1: General Introduction to Electrical and Electronic Materials; 1.1 Importance of Materials; 1.2 Importance of Electrical and Electronic Materials; 1.3 Classification of Electrical and Electronic Materials; 1.4 Scope of Electrical and Electronic Materials; 1.5 Requirements of Engineering Materials; 1.6 Operational Requirements of Electrical and Electronic Materials; 1.7 Classification of Solids on the Basis of Energy Gap
1.8 Glimpse of Some Electronic Products, Their Working Principles and Choicest Materials1.9 Different Types of Engineering Materials; 1.10 Different Levels of Materials Structure; 1.11 Spintronics (The Electronics of Tomorrow) and Spintronic Materials; 1.12 Ferromagnetic Semiconductor; 1.13 Left-Handed (LH) Materials; 1.14 Solved Examples; Chapter 2: Atomic Models, Bonding in Solids, Crystal Geometry, and Miller Indices; 2.1 Atomic Models; 2.2 Bohr's Quantum Atomic Model; 2.3 Modern Concept of Atomic Model; 2.4 Electron Configuration; 2.5 Meaning of Chemical (or Atomic) Bonding 2.6 Classification of Chemical Bonds2.7 Ionic Bond; 2.8 Covalent Bonds; 2.9 Monocrystalline and Polycrystalline Crystal Structures; 2.10 Space Lattice; 2.11 Basis; 2.12 Unit Cell and Crystal; 2.13 Bravais Crystal System; 2.14 Primitive and Non-Primitive Unit Cells; 2.15 Coordination Number; 2.16 Atomic Packing Fraction; 2.17 Calculation of Density (or Bulk Density); 2.18 Miller Indices; 2.19 Interplaner Spacing; 2.20 Linear Density; 2.21 Planer Density; Chapter 3: Solid Structures, Characterization of Materials, Crystal Imperfections, and Mechanical Properties of Materials 3.1 Crystallography3.2 Crystalline and Non-Crystalline Structures; 3.3 Hexagonally Closed Packed Structure (HCP); 3.4 VOIDS; 3.5 Covalent Solids; 3.6 Bragg's Law of X-Rays Diffraction; 3.7 Structure Determination; 3.8 Microscopy; 3.9 Different Types of Metallurgical Microscopes and Their Features; 3.10 Working Principle of Electron Microscope; 3.11 Ideal and Real Crystals, and Imperfections; 3.12 Classification of Imperfections; 3.13 Point Imperfections; 3.14 Effects of Point Imperfections; 3.15 Line Imperfections; 3.16 Features of Edge Dislocation; 3.17 Screw Dislocation 3.18 Characteristics of Dislocations3.19 Sources of Dislocations, Their Effects and Remedies; 3.20 Grain Boundary; 3.21 Twin or Twinning; 3.22 Mechanical Properties of Metals; Chapter 4: Conductive Materials: Electron Theories, Properties and Behaviour; 4.1 Electrons and Their Role in Conductivity; 4.2 Electron Theories of Solids; 4.3 Free Electron Theory; 4.4 Energy Band Theory; 4.5 Brillouin Zone Theory; 4.6 Conductors; 4.7 Factors Affecting Conductivity (and Resistivity) of Metals; 4.8 Thermal Conductivity; 4.9 Heating Effect of Current; 4.10 Thermoelectric Effect (or Thermoelectricity) 4.11 Seebeck Effect |
| Record Nr. | UNINA-9910132441103321 |
|
Gupta K. M.
|
||
| Hoboken, New Jersey : , : Scrivener Publishing, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson
| Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson |
| Autore | Gupta K. M. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Scrivener Publishing, , 2015 |
| Descrizione fisica | 1 online resource (1140 p.) |
| Disciplina | 621.315 |
| Collana | Advanced Material Series |
| Soggetto topico |
Capacitors
Electric resistors Electronics - Materials |
| ISBN |
1-118-99857-X
1-118-99856-1 1-118-99858-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright page; Dedication; Preface; Acknowledgement; About the Authors; Abbreviations; Chapter 1: General Introduction to Electrical and Electronic Materials; 1.1 Importance of Materials; 1.2 Importance of Electrical and Electronic Materials; 1.3 Classification of Electrical and Electronic Materials; 1.4 Scope of Electrical and Electronic Materials; 1.5 Requirements of Engineering Materials; 1.6 Operational Requirements of Electrical and Electronic Materials; 1.7 Classification of Solids on the Basis of Energy Gap
1.8 Glimpse of Some Electronic Products, Their Working Principles and Choicest Materials1.9 Different Types of Engineering Materials; 1.10 Different Levels of Materials Structure; 1.11 Spintronics (The Electronics of Tomorrow) and Spintronic Materials; 1.12 Ferromagnetic Semiconductor; 1.13 Left-Handed (LH) Materials; 1.14 Solved Examples; Chapter 2: Atomic Models, Bonding in Solids, Crystal Geometry, and Miller Indices; 2.1 Atomic Models; 2.2 Bohr's Quantum Atomic Model; 2.3 Modern Concept of Atomic Model; 2.4 Electron Configuration; 2.5 Meaning of Chemical (or Atomic) Bonding 2.6 Classification of Chemical Bonds2.7 Ionic Bond; 2.8 Covalent Bonds; 2.9 Monocrystalline and Polycrystalline Crystal Structures; 2.10 Space Lattice; 2.11 Basis; 2.12 Unit Cell and Crystal; 2.13 Bravais Crystal System; 2.14 Primitive and Non-Primitive Unit Cells; 2.15 Coordination Number; 2.16 Atomic Packing Fraction; 2.17 Calculation of Density (or Bulk Density); 2.18 Miller Indices; 2.19 Interplaner Spacing; 2.20 Linear Density; 2.21 Planer Density; Chapter 3: Solid Structures, Characterization of Materials, Crystal Imperfections, and Mechanical Properties of Materials 3.1 Crystallography3.2 Crystalline and Non-Crystalline Structures; 3.3 Hexagonally Closed Packed Structure (HCP); 3.4 VOIDS; 3.5 Covalent Solids; 3.6 Bragg's Law of X-Rays Diffraction; 3.7 Structure Determination; 3.8 Microscopy; 3.9 Different Types of Metallurgical Microscopes and Their Features; 3.10 Working Principle of Electron Microscope; 3.11 Ideal and Real Crystals, and Imperfections; 3.12 Classification of Imperfections; 3.13 Point Imperfections; 3.14 Effects of Point Imperfections; 3.15 Line Imperfections; 3.16 Features of Edge Dislocation; 3.17 Screw Dislocation 3.18 Characteristics of Dislocations3.19 Sources of Dislocations, Their Effects and Remedies; 3.20 Grain Boundary; 3.21 Twin or Twinning; 3.22 Mechanical Properties of Metals; Chapter 4: Conductive Materials: Electron Theories, Properties and Behaviour; 4.1 Electrons and Their Role in Conductivity; 4.2 Electron Theories of Solids; 4.3 Free Electron Theory; 4.4 Energy Band Theory; 4.5 Brillouin Zone Theory; 4.6 Conductors; 4.7 Factors Affecting Conductivity (and Resistivity) of Metals; 4.8 Thermal Conductivity; 4.9 Heating Effect of Current; 4.10 Thermoelectric Effect (or Thermoelectricity) 4.11 Seebeck Effect |
| Record Nr. | UNINA-9910828839503321 |
|
Gupta K. M.
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||
| Hoboken, New Jersey : , : Scrivener Publishing, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Failures of voltage-dropping resistors in the power supply circuitry of electric governor systems
| Failures of voltage-dropping resistors in the power supply circuitry of electric governor systems |
| Pubbl/distr/stampa | Washington, D.C. : , : United States Nuclear Regulatory Commission, Office of Nuclear Reactor Regulation, , 1990-1991 |
| Descrizione fisica | 1 online resource (2 volumes) |
| Collana | Information notice |
| Soggetto topico |
Nuclear power plants - Electric equipment
Electric resistors Electronic control |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910715355103321 |
| Washington, D.C. : , : United States Nuclear Regulatory Commission, Office of Nuclear Reactor Regulation, , 1990-1991 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Low Power Memory/Memristor Devices and Systems / / by Alex Serb, Adnan Mehonic (editors)
| Low Power Memory/Memristor Devices and Systems / / by Alex Serb, Adnan Mehonic (editors) |
| Pubbl/distr/stampa | [Place of publication not identified] : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2023 |
| Descrizione fisica | 1 online resource (250 pages) |
| Disciplina | 621.38154 |
| Soggetto topico |
Memristors
Electric resistors |
| ISBN | 3-0365-6186-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Preface to "Low Power Memory/Memristor Devices and Systems" vii -- A Novel Inductorless Design Technique for Linear Equalization in Optical Receivers 1 -- Towards Integration of a Dedicated Memory Controller and Its Instruction Set to Improve Performance of Systems Containing Computational SRAM 21 -- Silicon-Compatible Memristive Devices Tailored by Laser and Thermal Treatments 33 -- Design of In-Memory Parallel-Prefix Adders 55 -- A New Physical Design Flow for a Selective State Retention Based Approach 71 -- Energy-Efficient Non-Von Neumann Computing Architecture Supporting Multiple Computing Paradigms for Logic and Binarized Neural Networks 87 -- Minimization of the Line Resistance Impact on Memdiode-Based Simulations of Multilayer Perceptron Arrays Applied to Pattern Recognition 105 -- A Morphable Physically Unclonable Function and True Random Number Generator Using a Commercial Magnetic Memory 123 -- Continuous-Time Programming of Floating-Gate Transistors for Nonvolatile Analog Memory Arrays † 139 -- Logic-in-Memory Computation: Is It Worth It? A Binary Neural Network Case Study 161 -- Rediscovering Majority Logic in the Post-CMOS Era: A Perspective from In-Memory Computing 195 -- Graph Coloring via Locally-Active Memristor Oscillatory Networks 211. |
| Record Nr. | UNINA-9910647231503321 |
| [Place of publication not identified] : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Piezoresistor design and applications / / Joseph C. Doll, Beth L. Pruitt
| Piezoresistor design and applications / / Joseph C. Doll, Beth L. Pruitt |
| Autore | Doll Joseph C |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | New York : , : Springer, , 2013 |
| Descrizione fisica | 1 online resource (xi, 245 pages) : illustrations (some color) |
| Disciplina |
620.1
621.3815 |
| Collana | Microsystems and Nanosystems |
| Soggetto topico |
Piezoelectric devices - Design and construction
Electric resistors Microelectromechanical systems - Design and construction |
| ISBN | 1-4614-8517-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Piezoresistance fundamentals -- Sensitivity, noise and resolution -- Fabrication and process modeling -- Temperature effects -- Design optimization -- Alternative materials and transduction methods. |
| Record Nr. | UNINA-9910437766803321 |
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Doll Joseph C
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| New York : , : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Resistive switching : oxide materials, mechanisms, devices and operations / / edited by Jennifer Rupp, Daniele Ielmini, and Ilia Valov
| Resistive switching : oxide materials, mechanisms, devices and operations / / edited by Jennifer Rupp, Daniele Ielmini, and Ilia Valov |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (386 pages) |
| Disciplina | 621.384133 |
| Collana | Electronic Materials: Science and Technology |
| Soggetto topico |
Electric resistors
Switching circuits |
| ISBN | 3-030-42424-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910523798703321 |
| Cham, Switzerland : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Resistivity modeling : propagation, laterolog and micro-pad analysis / / Wilson C. Chin
| Resistivity modeling : propagation, laterolog and micro-pad analysis / / Wilson C. Chin |
| Autore | Chin Wilson C. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Scrivener Publishing, , 2017 |
| Descrizione fisica | 1 online resource (321 pages) : illustrations (some color) |
| Disciplina | 621.381331 |
| Collana | Advances in Petroleum Engineering |
| Soggetto topico | Electric resistors |
| ISBN |
1-118-92600-5
1-118-92603-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Physics, math and basic ideas -- Axisymmetric transient models -- Steady axisymmetric formulations -- Direct current models for micro-pad devices -- Coil antenna modeling for MWD applications -- What is resistivity? -- Multiphase flow and transient resistivity -- Analytical methods for time lapse well logging analysis. |
| Record Nr. | UNINA-9910135049203321 |
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Chin Wilson C.
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| Hoboken, New Jersey : , : Scrivener Publishing, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Resistivity modeling : propagation, laterolog and micro-pad analysis / / Wilson C. Chin
| Resistivity modeling : propagation, laterolog and micro-pad analysis / / Wilson C. Chin |
| Autore | Chin Wilson C. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Scrivener Publishing, , 2017 |
| Descrizione fisica | 1 online resource (321 pages) : illustrations (some color) |
| Disciplina | 621.381331 |
| Collana | Advances in Petroleum Engineering |
| Soggetto topico | Electric resistors |
| ISBN |
1-118-92600-5
1-118-92603-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Physics, math and basic ideas -- Axisymmetric transient models -- Steady axisymmetric formulations -- Direct current models for micro-pad devices -- Coil antenna modeling for MWD applications -- What is resistivity? -- Multiphase flow and transient resistivity -- Analytical methods for time lapse well logging analysis. |
| Record Nr. | UNINA-9910815876203321 |
|
Chin Wilson C.
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| Hoboken, New Jersey : , : Scrivener Publishing, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Resistor theory and technology / Felix Zandman, Paul-Rene Simon, Joseph Szwarc
| Resistor theory and technology / Felix Zandman, Paul-Rene Simon, Joseph Szwarc |
| Autore | Zandman, Felix |
| Pubbl/distr/stampa | Mendham (NJ) : SciTech Publishing, 2002 |
| Descrizione fisica | XIII, 308 p. : ill. ; 24 cm |
| Disciplina | 621.38133 |
| Altri autori (Persone) |
Simon, Paul-Reneauthor
Szwarc, Josephauthor |
| Soggetto topico |
Electric resistors
Elettronica |
| ISBN | 189112112X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991003301159707536 |
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Zandman, Felix
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| Mendham (NJ) : SciTech Publishing, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Soggetto topico
-
Electric resistors
(11)
- Capacitors (3)
- Electronics - Materials (3)
- Electronic control (1)
- Elettronica (1)