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Biblioteca

MARC Lista (tabellare)
ANSI/IEEE Std 213-1987 / / Institute of Electrical and Electronics Engineers
ANSI/IEEE Std 213-1987 / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa [Place of publication not identified] : , : IEEE, , 1988
Descrizione fisica 1 online resource (245 pages)
Disciplina 621.381
Soggetto topico Electric interference
ISBN 0-7381-3953-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti ANSI/IEEE Std 213-1987: IEEE Standard Procedure for Measuring Conducted Emissions in the Range of 300 kHz to 25 MHz From Television and FM Broadcast Receivers to Power Lines
Record Nr. UNINA-9910135274903321
[Place of publication not identified] : , : IEEE, , 1988
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ANSI/IEEE Std 213-1987 / / Institute of Electrical and Electronics Engineers
ANSI/IEEE Std 213-1987 / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa [Place of publication not identified] : , : IEEE, , 1988
Descrizione fisica 1 online resource (245 pages)
Disciplina 621.381
Soggetto topico Electric interference
ISBN 0-7381-3953-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti ANSI/IEEE Std 213-1987: IEEE Standard Procedure for Measuring Conducted Emissions in the Range of 300 kHz to 25 MHz From Television and FM Broadcast Receivers to Power Lines
Record Nr. UNISA-996279861103316
[Place of publication not identified] : , : IEEE, , 1988
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ANSI/IEEE Std 539-1979 : IEEE standard definitions of terms relating to overhead-power-line corona and radio noise / / Institute of Electrical and Electronics Engineers
ANSI/IEEE Std 539-1979 : IEEE standard definitions of terms relating to overhead-power-line corona and radio noise / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : IEEE, , 1979
Descrizione fisica 1 online resource
Disciplina 621.38411
Soggetto topico Radio noise
Radio - Interference
Electric interference
ISBN 0-7381-4229-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti ANSI/IEEE Std 539-1979: IEEE Standard Definitions of Terms Relating to Overhead-Power-Line Corona and Radio Noise
Record Nr. UNINA-9910135787703321
Piscataway, New Jersey : , : IEEE, , 1979
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ANSI/IEEE Std 539-1979 : IEEE standard definitions of terms relating to overhead-power-line corona and radio noise / / Institute of Electrical and Electronics Engineers
ANSI/IEEE Std 539-1979 : IEEE standard definitions of terms relating to overhead-power-line corona and radio noise / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : IEEE, , 1979
Descrizione fisica 1 online resource
Disciplina 621.38411
Soggetto topico Radio noise
Radio - Interference
Electric interference
ISBN 0-7381-4229-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti ANSI/IEEE Std 539-1979: IEEE Standard Definitions of Terms Relating to Overhead-Power-Line Corona and Radio Noise
Record Nr. UNISA-996279750203316
Piscataway, New Jersey : , : IEEE, , 1979
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Basics of interferometry [[electronic resource] /] / P. Hariharan
Basics of interferometry [[electronic resource] /] / P. Hariharan
Autore Hariharan P
Edizione [2nd ed.]
Pubbl/distr/stampa Boston, : Elsevier Academic Press, c2006
Descrizione fisica 1 online resource (249 p.)
Disciplina 535/.470287
Soggetto topico Interferometry
Electric interference
Soggetto genere / forma Electronic books.
ISBN 1-280-70770-4
9786610707706
0-08-046545-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front cover; Title page; Copyright page; Contents; Preface to the First Edition; Preface to the Second Edition; Acknowledgments; 1 Introduction; 2 Interference: A Primer; 2.1 Light Waves; 2.2 Intensity in an Interference Pattern; 2.3 Visibility of Interference Fringes; 2.4 Interference with a Point Source; 2.5 Localization of Fringes; 2.6 Summary; 2.7 Problems; Further Reading; 3 Two-Beam Interferometers; 3.1 Wavefront Division; 3.2 Amplitude Division; 3.3 The Rayleigh Interferometer; 3.4 The Michelson Interferometer; 3.5 The Mach-Zehnder Interferometer; 3.6 The Sagnac Interferometer
3.7 Summary 3.8 Problems; Further Reading; 4 Source-Size and Spectral Effects; 4.1 Coherence; 4.2 Source-Size Effects; 4.3 Spectral Effects; 4.4 Polarization Effects; 4.5 White-Light Fringes; 4.6 Channeled Spectra; 4.7 Summary; 4.8 Problems; Further Reading; 5 Multiple-Beam Interference; 5.1 Multiple-Beam Fringes by Transmission; 5.2 Multiple-Beam Fringes by Reflection; 5.3 Multiple-Beam Fringes of Equal Thickness; 5.4 Fringes of Equal Chromatic Order (FECO Fringes); 5.5 The Fabry-Perot Interferometer; 5.6 Summary; 5.7 Problems; Further Reading; 6 The Laser as a Light Source
6.1 Lasers for Interferometry 6.2 Laser Modes; 6.3 Single-Wavelength Operation of Lasers; 6.4 Polarization of Laser Beams; 6.5 Wavelength Stabilization of Lasers; 6.6 Laser-Beam Expansion; 6.7 Problems with Laser Sources; 6.8 Laser Safety; 6.9 Summary; 6.10 Problems; Further Reading; 7 Photodetectors; 7.1 Photomultipliers; 7.2 Photodiodes; 7.3 Charge-Coupled Detector Arrays; 7.4 Photoconductive Detectors; 7.5 Pyroelectric Detectors; 7.6 Summary; 7.7 Problems; Further Reading; 8 Measurements of Length; 8.1 The Definition of the Metre; 8.2 Length Measurements
8.3 Measurements of Changes in Length 8.4 Summary; 8.5 Problems; Further Reading; 9 Optical Testing; 9.1 The Fizeau Interferometer; 9.2 The Twyman-Green Interferometer; 9.3 Analysis of Wavefront Aberrations; 9.4 Laser Unequal-Path Interferometers; 9.5 The Point-Diffraction Interferometer; 9.6 Shearing Interferometers; 9.7 Grazing-Incidence Interferometry; 9.8 Summary; 9.9 Problems; Further Reading; 10 Digital Techniques; 10.1 Digital Fringe Analysis; 10.2 Digital Phase Measurements; 10.3 Testing Aspheric Surfaces; 10.4 Summary; 10.5 Problems; Further Reading; 11 Macro- and Micro-Interferometry
11.1 Interferometry of Refractive Index Fields 11.2 The Mach-Zehnder Interferometer; 11.3 Interference Microscopy; 11.4 Multiple-Beam Interferometry; 11.5 Two-Beam Interference Microscopes; 11.6 The Nomarski Interferometer; 11.7 Summary; 11.8 Problems; Further Reading; 12 White-Light Interference Microscopy; 12.1 White-Light Interferometry; 12.2 White-Light Phase-Shifting Microscopy; 12.3 Spectrally Resolved Interferometry; 12.4 Coherence-Probe Microscopy; 12.5 Summary; 12.6 Problems; Further reading; 13 Holographic and Speckle Interferometry; 13.1 Holographic Interferometry
13.2 Holographic Nondestructive Testing
Record Nr. UNINA-9910458110803321
Hariharan P  
Boston, : Elsevier Academic Press, c2006
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Basics of interferometry / / P. Hariharan
Basics of interferometry / / P. Hariharan
Autore Hariharan P
Edizione [2nd ed.]
Pubbl/distr/stampa Boston, : Elsevier Academic Press, c2006
Descrizione fisica 1 online resource (249 p.)
Disciplina 535/.470287
Soggetto topico Interferometry
Electric interference
ISBN 1-280-70770-4
9786610707706
0-08-046545-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front cover; Title page; Copyright page; Contents; Preface to the First Edition; Preface to the Second Edition; Acknowledgments; 1 Introduction; 2 Interference: A Primer; 2.1 Light Waves; 2.2 Intensity in an Interference Pattern; 2.3 Visibility of Interference Fringes; 2.4 Interference with a Point Source; 2.5 Localization of Fringes; 2.6 Summary; 2.7 Problems; Further Reading; 3 Two-Beam Interferometers; 3.1 Wavefront Division; 3.2 Amplitude Division; 3.3 The Rayleigh Interferometer; 3.4 The Michelson Interferometer; 3.5 The Mach-Zehnder Interferometer; 3.6 The Sagnac Interferometer
3.7 Summary 3.8 Problems; Further Reading; 4 Source-Size and Spectral Effects; 4.1 Coherence; 4.2 Source-Size Effects; 4.3 Spectral Effects; 4.4 Polarization Effects; 4.5 White-Light Fringes; 4.6 Channeled Spectra; 4.7 Summary; 4.8 Problems; Further Reading; 5 Multiple-Beam Interference; 5.1 Multiple-Beam Fringes by Transmission; 5.2 Multiple-Beam Fringes by Reflection; 5.3 Multiple-Beam Fringes of Equal Thickness; 5.4 Fringes of Equal Chromatic Order (FECO Fringes); 5.5 The Fabry-Perot Interferometer; 5.6 Summary; 5.7 Problems; Further Reading; 6 The Laser as a Light Source
6.1 Lasers for Interferometry 6.2 Laser Modes; 6.3 Single-Wavelength Operation of Lasers; 6.4 Polarization of Laser Beams; 6.5 Wavelength Stabilization of Lasers; 6.6 Laser-Beam Expansion; 6.7 Problems with Laser Sources; 6.8 Laser Safety; 6.9 Summary; 6.10 Problems; Further Reading; 7 Photodetectors; 7.1 Photomultipliers; 7.2 Photodiodes; 7.3 Charge-Coupled Detector Arrays; 7.4 Photoconductive Detectors; 7.5 Pyroelectric Detectors; 7.6 Summary; 7.7 Problems; Further Reading; 8 Measurements of Length; 8.1 The Definition of the Metre; 8.2 Length Measurements
8.3 Measurements of Changes in Length 8.4 Summary; 8.5 Problems; Further Reading; 9 Optical Testing; 9.1 The Fizeau Interferometer; 9.2 The Twyman-Green Interferometer; 9.3 Analysis of Wavefront Aberrations; 9.4 Laser Unequal-Path Interferometers; 9.5 The Point-Diffraction Interferometer; 9.6 Shearing Interferometers; 9.7 Grazing-Incidence Interferometry; 9.8 Summary; 9.9 Problems; Further Reading; 10 Digital Techniques; 10.1 Digital Fringe Analysis; 10.2 Digital Phase Measurements; 10.3 Testing Aspheric Surfaces; 10.4 Summary; 10.5 Problems; Further Reading; 11 Macro- and Micro-Interferometry
11.1 Interferometry of Refractive Index Fields 11.2 The Mach-Zehnder Interferometer; 11.3 Interference Microscopy; 11.4 Multiple-Beam Interferometry; 11.5 Two-Beam Interference Microscopes; 11.6 The Nomarski Interferometer; 11.7 Summary; 11.8 Problems; Further Reading; 12 White-Light Interference Microscopy; 12.1 White-Light Interferometry; 12.2 White-Light Phase-Shifting Microscopy; 12.3 Spectrally Resolved Interferometry; 12.4 Coherence-Probe Microscopy; 12.5 Summary; 12.6 Problems; Further reading; 13 Holographic and Speckle Interferometry; 13.1 Holographic Interferometry
13.2 Holographic Nondestructive Testing
Record Nr. UNINA-9910784656903321
Hariharan P  
Boston, : Elsevier Academic Press, c2006
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IEEE STD 1137-1991/Cor1-2009 : IEEE Guide for the Implementation of Inductive Coordination Mitigation Techniques and Applications--Corrigendum 1 / / Institute of Electrical and Electronics Engineers
IEEE STD 1137-1991/Cor1-2009 : IEEE Guide for the Implementation of Inductive Coordination Mitigation Techniques and Applications--Corrigendum 1 / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa [Place of publication not identified] : , : IEEE, , 2009
Descrizione fisica 1 online resource
Disciplina 621.38224
Soggetto topico Electromagnetic interference
Electric interference
ISBN 0-7381-6054-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti IEEE STD 1137-1991/Cor1-2009: IEEE Guide for the Implementation of Inductive Coordination Mitigation Techniques and Applications--Corrigendum 1
Record Nr. UNISA-996280521503316
[Place of publication not identified] : , : IEEE, , 2009
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IEEE STD 1137-1991/Cor1-2009 : IEEE Guide for the Implementation of Inductive Coordination Mitigation Techniques and Applications--Corrigendum 1 / / Institute of Electrical and Electronics Engineers
IEEE STD 1137-1991/Cor1-2009 : IEEE Guide for the Implementation of Inductive Coordination Mitigation Techniques and Applications--Corrigendum 1 / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa [Place of publication not identified] : , : IEEE, , 2009
Descrizione fisica 1 online resource
Disciplina 621.38224
Soggetto topico Electromagnetic interference
Electric interference
ISBN 0-7381-6054-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti IEEE STD 1137-1991/Cor1-2009: IEEE Guide for the Implementation of Inductive Coordination Mitigation Techniques and Applications--Corrigendum 1
Record Nr. UNINA-9910135887003321
[Place of publication not identified] : , : IEEE, , 2009
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Low-angle radar land clutter : measurements and empirical models / / J. Barrie Billingsley
Low-angle radar land clutter : measurements and empirical models / / J. Barrie Billingsley
Autore Billingsley J. Barrie
Edizione [1st edition]
Pubbl/distr/stampa Norwich, N.Y., : William Andrew Pub., : SciTech Pub.
Descrizione fisica 1 online resource (722 p.)
Disciplina 621.3848
Soggetto topico Radar - Interference
Electric interference
ISBN 1-282-01117-0
9786612011177
0-8155-1821-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Low-Angle Radar Land Clutter: Measurements and EmpiricalModels; Copyright Page; Dedication; Table ofContents; Foreword; Preface; Chapter 1.Overview; 1.1 Introduction; 1.2 Historical Review; 1.3 Clutter Measurements at Lincoln Laboratory; 1.4 Clutter Prediction at Lincoln Laboratory; 1.5 Scope of Book; 1.6 Organization of Book; References; Chapter 2. Preliminary X-Band Clutter Measurements; 2.1 Introduction; 2.2 Phase Zero Clutter Measurements; 2.3 The Nature of Low-Angle Clutter; 2.4 X-Band Clutter Spatial Amplitude Statistics; 2.5 Summary; References
Appendix 2.A: Phase Zero RadarAppendix 2.B: Formulation of Clutter Statistics; Appendix 2.C: Depression Angle Computation; Chapter 3.Repeat Sector Clutter Measurements; 3.1 Introduction; 3.2 Multifrequency Clutter Measurements; 3.3 Fundamental Effects in Low-Angle Clutter; 3.4 Mean Land Clutter Strength vs Frequency by Terrain Type; 3.5 Dependencies of Mean Land Clutter Strength with Radar Parameters; 3.6 Higher Moments and Percentiles in Measured Land Clutter Spatial Amplitude Distributions; 3.7 Effects of Weather and Season; 3.8 Summary; References; Appendix 3.A: Phase One Radar
Appendix 3.B: Multipath PropagationAppendix 3.C: Clutter Computations; Chapter 4.Approaches to Clutter Modeling; 4.1 Introduction; 4.2 An Interim Angle-Specific Clutter Model; 4.3 Non-Angle-Specific Modeling Considerations; 4.4 Terrain Visibility and Clutter Occurrence; 4.5 Discrete vs Distributed Clutter; 4.6 Temporal Statistics, Spectra, and Correlation; 4.7 Summary; References; Appendix 4.A: Clutter Strength vs Range; Appendix 4.B: Terrain Visibility as a Function of Site Height and Antenna Mast Height; Appendix 4.C: Effects of Terrain Shadowing and Finite Sensitivity
Appendix 4.D: Separation of Discretes in Clutter ModelingChapter 5.Multifrequency Land ClutterModeling Information; 5.1 Introduction; 5.2 Derivation of Clutter Modeling Information; 5.3 Land Clutter Coefficients for General Terrain; 5.4 Land Clutter Coefficients for Specific Terrain Types; 5.5 PPI Clutter Map Prediction; 5.6 Summary; References; Appendix 5.A: Weibull Statistics; Chapter 6. Windblown Clutter Spectral Measurements; 6.1 Introduction; 6.2 Exponential Windblown Clutter Spectral Model; 6.3 Measurement Basis for Clutter Spectral Model; 6.4 Use of Clutter Spectral Model
6.5 Impact on MTI and STAP6.6 Historical Review; 6.7 Summary; References; Index
Record Nr. UNINA-9911004839303321
Billingsley J. Barrie  
Norwich, N.Y., : William Andrew Pub., : SciTech Pub.
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Optimum array processing [[electronic resource] /] / Harry L. Van Trees
Optimum array processing [[electronic resource] /] / Harry L. Van Trees
Autore Van Trees Harry L
Pubbl/distr/stampa New York, : Wiley-Interscience, 2002
Descrizione fisica 1 online resource (1470 p.)
Disciplina 621.381536
621.3822
Soggetto topico Signal theory (Telecommunication)
Electric interference
Signal processing
ISBN 1-280-27271-6
9786610272716
0-470-34672-8
0-471-22110-4
0-471-46383-3
1-60119-387-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Contents; Preface; 1 Introduction; 1.1 Array Processing; 1.2 Applications; 1.2.1 Radar; 1.2.2 Radio Astronomy; 1.2.3 Sonar; 1.2.4 Communications; 1.2.5 Direction Finding; 1.2.6 Seismology; 1.2.7 Tomography; 1.2.8 Array Processing Literature; 1.3 Organization of the Book; 1.4 Interactive Study; 2 Arrays and Spatial Filters; 2.1 Introduction; 2.2 Frequency-wavenumber Response and Beam Patterns; 2.3 Uniform Linear Arrays; 2.4 Uniformly Weighted Linear Arrays; 2.4.1 Beam Pattern Parameters; 2.5 Array Steering; 2.6 Array Performance Measures; 2.6.1 Directivity
2.6.2 Array Gain vs. Spatially White Noise (A[sub(w)])2.6.3 Sensitivity and the Tolerance Factor; 2.6.4 Summary; 2.7 Linear Apertures; 2.7.1 Frequency-wavenumber Response; 2.7.2 Aperture Sampling; 2.8 Non-isotropic Element Patterns; 2.9 Summary; 2.10 Problems; 3 Synthesis of Linear Arrays and Apertures; 3.1 Spectral Weighting; 3.2 Array Polynomials and the z-Transform; 3.2.1 z-Transform; 3.2.2 Real Array Weights; 3.2.3 Properties of the Beam Pattern Near a Zero; 3.3 Pattern Sampling in Wavenumber Space; 3.3.1 Continuous Aperture; 3.3.2 Linear Arrays; 3.3.3 Discrete Fourier Transform
3.3.4 Norms3.3.5 Summary; 3.4 Minimum Beamwidth for Specified Sidelobe Level; 3.4.1 Introduction; 3.4.2 Dolph-Chebychev Arrays; 3.4.3 Taylor Distribution; 3.4.4 Villeneuve n Distribution; 3.5 Least Squares Error Pattern Synthesis; 3.6 Minimax Design; 3.6.1 Alternation Theorem; 3.6.2 Parks-McClellan-Rabiner Algorithm; 3.6.3 Summary; 3.7 Null Steering; 3.7.1 Null Constraints; 3.7.2 Least Squares Error Pattern Synthesis with Nulls; 3.8 Asymmetric Beams; 3.9 Spatially Non-uniform Linear Arrays; 3.9.1 Introduction; 3.9.2 Minimum Redundancy Arrays; 3.9.3 Beam Pattern Design Algorithm
3.10 Beamspace Processing3.10.1 Full-dimension Beamspace; 3.10.2 Reduced-dimension Beamspace; 3.10.3 Multiple Beam Antennas; 3.10.4 Summary; 3.11 Broadband Arrays; 3.12 Summary; 3.13 Problems; 4 Planar Arrays and Apertures; 4.1 Rectangular Arrays; 4.1.1 Uniform Rectangular Arrays; 4.1.2 Array Manifold Vector; 4.1.3 Separable Spectral Weightings; 4.1.4 2-D z-Transforms; 4.1.5 Least Squares Synthesis; 4.1.6 Circularly Symmetric Weighting and Windows; 4.1.7 Wavenumber Sampling and 2-D DFT; 4.1.8 Transformations from One Dimension to Two Dimensions; 4.1.9 Null Steering; 4.1.10 Related Topics
4.2 Circular Arrays4.2.1 Continuous Circular Arrays (Ring Apertures); 4.2.2 Circular Arrays; 4.2.3 Phase Mode Excitation Beamformers; 4.3 Circular Apertures; 4.3.1 Separable Weightings; 4.3.2 Taylor Synthesis for Circular Apertures; 4.3.4 Difference Beams; 4.3.5 Summary; 4.4 Hexagonal Arrays; 4.4.1 Introduction; 4.4.2 Beam Pattern Design; 4.4.3 Hexagonal Grid to Rectangular Grid Transformation; 4.4.4 Summary; 4.5 Nonplanar Arrays; 4.5.1 Cylindrical Arrays; 4.5.2 Spherical Arrays; 4.6 Summary; 4.7 Problems; 5 Characterization of Space-time Processes; 5.1 Introduction; 5.2 Snapshot Models
5.2.1 Frequency-domain Snapshot Models
Record Nr. UNISA-996201055803316
Van Trees Harry L  
New York, : Wiley-Interscience, 2002
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