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1036-2020 - IEEE guide for the application of shunt power capacitors - redline / / IEEE
1036-2020 - IEEE guide for the application of shunt power capacitors - redline / / IEEE
Pubbl/distr/stampa [Place of publication not identified] : , : IEEE, , 2021
Descrizione fisica 1 online resource
Disciplina 621.31
Soggetto topico Electric power systems
Electric circuit analysis
ISBN 1-5044-7847-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910490728703321
[Place of publication not identified] : , : IEEE, , 2021
Materiale a stampa
Lo trovi qui: Univ. Federico II
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1036-2020 - IEEE guide for the application of shunt power capacitors - redline / / IEEE
1036-2020 - IEEE guide for the application of shunt power capacitors - redline / / IEEE
Pubbl/distr/stampa [Place of publication not identified] : , : IEEE, , 2021
Descrizione fisica 1 online resource
Disciplina 621.31
Soggetto topico Electric power systems
Electric circuit analysis
ISBN 1-5044-7847-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996574868103316
[Place of publication not identified] : , : IEEE, , 2021
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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Advanced electrical circuit analysis : practice problems, methods, and solutions / / Mehdi Rahmani-Andebili
Advanced electrical circuit analysis : practice problems, methods, and solutions / / Mehdi Rahmani-Andebili
Autore Rahmani-Andebili Mehdi
Pubbl/distr/stampa Cham, Switzerland : , : Springer, , [2022]
Descrizione fisica 1 online resource (155 pages)
Disciplina 621.3192
Soggetto topico Electric circuit analysis
Electric circuits - Testing
ISBN 3-030-78540-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910522979303321
Rahmani-Andebili Mehdi  
Cham, Switzerland : , : Springer, , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Analysis and design of digital integrated circuits : in deep submicron technology / David A. Hodges, Horace G. Jackson, Resve A. Saleh
Analysis and design of digital integrated circuits : in deep submicron technology / David A. Hodges, Horace G. Jackson, Resve A. Saleh
Autore Hodges, David A., 1937-
Edizione [3rd ed.]
Pubbl/distr/stampa Boston : McGraw-Hill Higher Education, 2004
Descrizione fisica xix, 580 p. : ill. ; 24 cm.
Disciplina 621.3815
Altri autori (Persone) Jackson, Horace G.
Saleh, Resve A., 1957-
Collana McGraw-Hill series in electrical engineering
Soggetto topico Digital integrated circuits - Design and construction
Integrated circuits - Ultra large scale integration
Electric circuit analysis
ISBN 0072283653
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991003001019707536
Hodges, David A., 1937-  
Boston : McGraw-Hill Higher Education, 2004
Materiale a stampa
Lo trovi qui: Univ. del Salento
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Analysis methods for RF, microwave, and millimeter-wave planar transmission line structures / / Cam Nguyen
Analysis methods for RF, microwave, and millimeter-wave planar transmission line structures / / Cam Nguyen
Autore Nguyen Cam
Pubbl/distr/stampa New York, : J. Wiley, c2000
Descrizione fisica 1 online resource (259 p.)
Disciplina 621.3813
Collana Wiley series in microwave and optical engineering
Soggetto topico Microwave transmission lines
Strip transmission lines
Microwave integrated circuits
Electric circuit analysis
ISBN 9786610367412
9781280367410
1280367415
9780470231852
0470231858
9780471463849
0471463841
9780471200673
0471200670
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Analysis Methods for RF, Microwave, and Millimeter-Wave Planar Transmission Line Structures; Contents; Preface; 1 Introduction; 1.1 Planar Transmission Lines and Microwave Integrated Circuits; 1.2 Analysis Methods for Planar Transmission Lines; 1.3 Organization of the Book; 2 Fundamentals of Electromagnetic Theory; 2.1 Maxwell's Equations; 2.2 Constitutive Relations; 2.3 Continuity Equation; 2.4 Loss in Medium; 2.5 Boundary Conditions; 2.6 Skin Depth; 2.7 Power Flow; 2.8 Poisson's and Laplace's Equations; 2.9 Wave Equations; 2.10 Electric and Magnetic Potentials; 2.11 Wave Types and Solutions
2.11.1 Wave Types2.11.2 Wave Solutions; 2.12 Orthogonality Relations; 2.12.1 Orthogonality Relations Between y(h)(mn)(x, y) and Between y(e)(mn)(x, y); 2.12.2 Orthogonality Relations Between Electric Fields and Between Magnetic Fields; 2.12.3 Orthogonality Relations Between Electric and Magnetic Fields; 2.12.4 Power Orthogonality for Lossless Structures; References; Problems; 3 Green's Function; 3.1 Descriptions of Green's Function; 3.1.1 Solution of Poisson's Equation Using Green's Function; 3.1.2 Solution of the Wave Equation Using Green's Function; 3.2 Sturm-Liouville Equation
3.3 Solutions of Green's Function3.3.1 Closed-Form Green's Function; 3.3.2 Series-Form Green's Function; 3.3.3 Integral-Form Green's Function; References; Problems; Appendix: Green's Identities; 4 Planar Transmission Lines; 4.1 Transmission Line Parameters; 4.1.1 Static Analysis; 4.1.2 Dynamic Analysis; 4.2 Microstrip Line; 4.3 Coplanar Waveguide; 4.4 Coplanar Strips; 4.5 Strip Line; 4.6 Slot Line; References; Problems; 5 Conformal Mapping; 5.1 Principles of Mappings; 5.2 Fundamentals of Conformal Mapping; 5.3 The Schwarz-Christoffel Transformation
5.4 Applications of the Schwarz-Christoffel Transformation in Transmisison Line Analysis5.5 Conformal-Mapping Equations for Common Transmission Lines; References; Problems; 6 Variational Methods; 6.1 Fundamentals of Variational Methods; 6.2 Variational Expressions for the Capacitance per Unit Length of Transmission Lines; 6.2.1 Upper-Bound Variational Expression for C; 6.2.2 Lower-Bound Variational Expression for C; 6.2.3 Determination of C, Z(o), and ε(eff); 6.3 Formulation of Variational Methods in the Space Domain; 6.3.1 Variational Formulation Using Upper-Bound Expression
6.3.2 Variational Formulation Using Lower-Bound Expression6.4 Variational Methods in the Spectral Domain; 6.4.1 Lower-Bound Variational Expression for C in the Spectral Domain; 6.4.2 Determination of C, Z(o), and ε(eff); 6.4.3 Formulation; References; Problems; Appendix: Systems of Homogeneous Equations from the Lower-Bound Variational Formulation; 7 Spectral-Domain Method; 7.1 Formulation of the Quasi-static Spectral-Domain Analysis; 7.2 Formulation of the Dynamic Spectral-Domain Analysis; References; Problems; Appendix A: Fourier Transform and Parseval's Theorem
Appendix B: Galerkin's Method
Record Nr. UNINA-9911019993803321
Nguyen Cam  
New York, : J. Wiley, c2000
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Analysis of linear circuits / Clayton R. Paul
Analysis of linear circuits / Clayton R. Paul
Autore Paul, Clayton R.
Pubbl/distr/stampa New York : McGraw-Hill, c1989
Descrizione fisica xxi, 792 p. : ill. ; 24 cm.
Disciplina 621.31042
Collana McGraw-Hill series in electrical engineering
Soggetto topico Electric circuit analysis
Linear electric circuits
ISBN 0071002634
Classificazione AMS 94C
CR B.7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione en
Record Nr. UNISALENTO-991000680389707536
Paul, Clayton R.  
New York : McGraw-Hill, c1989
Materiale a stampa
Lo trovi qui: Univ. del Salento
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Base electronics. 3, Voltage
Base electronics. 3, Voltage
Pubbl/distr/stampa [Place of publication not identified] : , : Programming Electronics Academy, , 2016
Descrizione fisica 1 online resource (7 minutes)
Collana Academic Video Online
Soggetto topico Electric circuits
Electric circuit analysis
Electric apparatus and appliances
Electrical engineering
Soggetto genere / forma Educational films.
Instructional films.
Short films.
Formato Videoregistrazioni
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Voltage
Record Nr. UNINA-9910867497403321
[Place of publication not identified] : , : Programming Electronics Academy, , 2016
Videoregistrazioni
Lo trovi qui: Univ. Federico II
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Circuit analysis [[electronic resource] /] / Virginia E. Wright, editor
Circuit analysis [[electronic resource] /] / Virginia E. Wright, editor
Pubbl/distr/stampa Hauppauge, N.Y., : Nova Science Publishers, c2011
Descrizione fisica 1 online resource (196 p.)
Disciplina 621.3815
Altri autori (Persone) WrightVirginia E
Collana Electrical engineering developments
Soggetto topico Electronic circuits
Electric circuit analysis
Soggetto genere / forma Electronic books.
ISBN 1-61728-703-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910462131703321
Hauppauge, N.Y., : Nova Science Publishers, c2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Circuit analysis [[electronic resource] /] / Virginia E. Wright, editor
Circuit analysis [[electronic resource] /] / Virginia E. Wright, editor
Pubbl/distr/stampa Hauppauge, N.Y., : Nova Science Publishers, c2011
Descrizione fisica 1 online resource (196 p.)
Disciplina 621.3815
Altri autori (Persone) WrightVirginia E
Collana Electrical engineering developments
Soggetto topico Electronic circuits
Electric circuit analysis
ISBN 1-61728-703-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910789947403321
Hauppauge, N.Y., : Nova Science Publishers, c2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Circuit analysis [[electronic resource] ] : failure mode and likelihood analysis / / prepared by J.L. LaChance ... [and others]
Circuit analysis [[electronic resource] ] : failure mode and likelihood analysis / / prepared by J.L. LaChance ... [and others]
Pubbl/distr/stampa Washington, DC : , : Division of Risk Analysis and Applications, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, , 2003
Descrizione fisica 1 volume (various pagings) : digital, PDF file
Altri autori (Persone) LaChanceJ. L
Soggetto topico Nuclear power plants - Electric equipment - Reliability
Electric circuit analysis
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Circuit analysis
Record Nr. UNINA-9910697349203321
Washington, DC : , : Division of Risk Analysis and Applications, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, , 2003
Materiale a stampa
Lo trovi qui: Univ. Federico II
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