Error analysis and calibration uncertainty of capacitance standards at NIST [[electronic resource] /] / Y. May Chang |
Autore | Chang Y. May |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2000] |
Descrizione fisica | 1 online resource (1 volumes (various pagings)) : illustrations |
Collana |
NIST special publication
NIST measurement services |
Soggetto topico |
Capacitance meters - Calibration
Electric capacity - Standards - United States |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910700124303321 |
Chang Y. May | ||
Gaithersburg, MD : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2000] | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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NIST measurement assurance program for capacitance standards at 1 kHz / / Y. May. Chang |
Autore | Chang Y. May |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1996 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | ChangY. May |
Collana | NIST technical note |
Soggetto topico |
Capacitance meters - Calibration
Electric capacity - Standards - United States |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910711205403321 |
Chang Y. May | ||
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1996 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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