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Atmospheric solar absorption measurements in the 9 to 11 [mu]m region using a diode laser heterodyne spectrometer / / Charles N. Harward, James M. Hoell, Jr
| Atmospheric solar absorption measurements in the 9 to 11 [mu]m region using a diode laser heterodyne spectrometer / / Charles N. Harward, James M. Hoell, Jr |
| Autore | Harward Charles N. |
| Pubbl/distr/stampa | [Washington, D.C.] : , : National Aeronautics and Space Administration, Scientific and Technical Information Branch, , October 1980 |
| Descrizione fisica | 1 online resource (11 pages) : illustrations |
| Collana | NASA technical paper |
| Soggetto topico |
Diodes
Heterodyning Laser spectroscopy Spectrophotometers Spectroradiometers Remote sensing - Equipment and supplies Solar radiation |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Atmospheric solar absorption measurements in the 9 to 11 um region using a diode laser heterodyne spectrometer |
| Record Nr. | UNINA-9910707471303321 |
Harward Charles N.
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| [Washington, D.C.] : , : National Aeronautics and Space Administration, Scientific and Technical Information Branch, , October 1980 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Deep diode arrays for X-ray detection / / principal investigator, Jay N. Zemel
| Deep diode arrays for X-ray detection / / principal investigator, Jay N. Zemel |
| Autore | Zemel Jay N. |
| Pubbl/distr/stampa | Philadelphia, Pa. : , : University of Pennsylvania, The Moore School of Electrical Engineering |
| Descrizione fisica | 1 online resource (4 unnumbered pages, 83 pages) : illustrations |
| Collana | NASA CR |
| Soggetto topico |
P-n junctions
Temperature gradients X ray spectroscopy Diodes Energy spectra |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910702696803321 |
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Zemel Jay N.
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| Philadelphia, Pa. : , : University of Pennsylvania, The Moore School of Electrical Engineering | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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The effects of reactor radiation on 22-volt silicon voltage-regulator diodes / / by Suzanne T. Weinstein
| The effects of reactor radiation on 22-volt silicon voltage-regulator diodes / / by Suzanne T. Weinstein |
| Autore | Weinstein Suzanne T. |
| Pubbl/distr/stampa | Washington, D.C. : , : National Aeronautics and Space Administration, , November 1968 |
| Descrizione fisica | 1 online resource (ii, 21 pages) : illustrations |
| Collana | NASA/TN |
| Soggetto topico |
Diodes
Electronic equipment Silicon-controlled rectifiers |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910715905503321 |
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Weinstein Suzanne T.
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| Washington, D.C. : , : National Aeronautics and Space Administration, , November 1968 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Emitter and collector sheaths for cesium thermionic diodes with polycrystalline tungsten electrodes / / by James F. Morris
| Emitter and collector sheaths for cesium thermionic diodes with polycrystalline tungsten electrodes / / by James F. Morris |
| Autore | Morris James F. |
| Pubbl/distr/stampa | Washington, D.C. : , : National Aeronautics and Space Administration, , August 1968 |
| Descrizione fisica | 1 online resource (ii, 11 pages) : illustrations |
| Collana | NASA technical note |
| Soggetto topico |
Cesium
Diodes Thermionic emission Polycrystalline semiconductors |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910715019103321 |
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Morris James F.
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| Washington, D.C. : , : National Aeronautics and Space Administration, , August 1968 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Integrated circuits, photodiodes and organic field effect transistors [[electronic resource] /] / Robert McIntire and Pierre Donnell, editors
| Integrated circuits, photodiodes and organic field effect transistors [[electronic resource] /] / Robert McIntire and Pierre Donnell, editors |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2009 |
| Descrizione fisica | 1 online resource (458 p.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) |
McIntireRobert
DonnellPierre |
| Collana | Environmental Research Advances |
| Soggetto topico |
Diodes
Organic field-effect transistors |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-61761-868-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""INTEGRATED CIRCUITS,PHOTODIODES AND ORGANIC FIELDEFFECT TRANSISTORS""; ""CONTENTS""; ""PREFACE""; ""RESEARCH AND REVIEW STUDIES""; ""METAMATERIALS TECHNOLOGY: APPLICATIONTO RADIOFREQUENCY AND MICROWAVE CIRCUITS""; ""ABSTRACT""; ""1. INTRODUCTION TO METAMATERIALS""; ""2. METAMATERIALS IN PLANAR TECHNOLOGY:METAMATERIAL TRANSMISSION LINES""; ""2.1. The Dual Transmission Line Concept""; ""2.2. CL-Loaded Lines: The Composite Right/Left Handed TransmissionLine Concept""; ""2.3. Resonant Type Metamaterial Transmission Lines""; ""3. APPLICATIONS OF METAMATERIAL TRANSMISSION LINES""
""3.1. Metamaterial Filters""""3.1.1. Stop Band Filters: Application to Spurious Suppression in ConventionalFilters""; ""3.1.2. Narrow Band Pass Filters and Diplexers""; ""3.1.3. Wide and Ultra Wide Band (UWB) Pass Filters""; ""3.1.4. Metamaterial Based Filters Subjected to Standard Responses:A Design Methodology""; ""3.2. Enhanced Bandwidth Components""; ""3.3. Multiband Components""; ""4. CONCLUSION""; ""REFERENCES""; ""RELIABILITY ASSESSMENT OF INTEGRATEDCIRCUITS AND ITS MISCONCEPTION""; ""ABSTRACT""; ""I. THE IMPORTANCE OF INTEGRATED CIRCUIT RELIABILITY"" ""II. COMMON RELIABILITY PRACTICES IN INTEGRATEDCIRCUIT INDUSTRY""""1. Process Reliability Test in Wafer Fabrication Manufacturers""; ""2. Product Reliability Tests in IC Assembly and Packaging Manufacturers""; ""3. Highly Accelerated Stress Test (HAST)""; ""III. MISCONCEPTIONS IN COMMON RELIABILITY ASSESSMENTOF INTEGRATED CIRCUITS""; ""1. Zero Failure Represents Good Reliability""; ""2. Higher MTTF Represents Better Reliability""; ""3. MTTF Is the Mean Failure Time""; ""4. Exponential Distribution Is Sufficient to Analyze the Test Data"" ""5. The Higher the Stress, the More Effective Is the Reliability Test""""A. Masked Failure Mechanism""; ""B. Variation of Failure Mechanism""; ""6. All Test Data Are Valid""; ""7. Only One Failure Mechanism Exist in the Failed Units""; ""8. Probability Plot Is Sufficient for Test Data Analysis""; ""9. Small Sample Size Is Sufficient""; ""10. The Important of Confidence Interval""; ""IV. CONCLUSION""; ""REFERENCES""; ""DESIGN OF A MULTICHANNEL INTEGRATEDBIOSENSOR CHIP AND MICROELECTRONIC SYSTEMFOR EXTRACELLULAR NEURAL RECORDING""; ""ABSTRACT""; ""1. INTRODUCTION""; ""2. SYSTEM OVERVIEW"" ""3. SYSTEM ARCHITECTURE AND DESIGN""""3.1. Neural Signal Input""; ""3.2. Preamplifier Buffers""; ""3.3. Analysis and Design of the Two-Stage Amplifier BasedPreamplifier Buffer""; ""3.3.1. Device Model""; ""3.3.2. Frequency Response and Pole/Zero Locations""; ""3.3.3. Output Swing""; ""3.3.4. Common-Mode Input Range""; ""3.3.5. Internal Slew Rate""; ""3.3.6. External Slew Rate""; ""3.3.7. Systematic Input-Referred Offset Voltage Minimization""; ""3.3.8. Input-Referred Thermal Noise""; ""3.3.9. Preamplifier Buffer Design""; ""3.4. Channels Addressing and Sequencing"" ""3.5. Biasing Circuitry"" |
| Record Nr. | UNINA-9910465406503321 |
| New York, : Nova Science Publishers, c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Integrated circuits, photodiodes and organic field effect transistors [[electronic resource] /] / Robert McIntire and Pierre Donnell, editors
| Integrated circuits, photodiodes and organic field effect transistors [[electronic resource] /] / Robert McIntire and Pierre Donnell, editors |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2009 |
| Descrizione fisica | 1 online resource (458 p.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) |
McIntireRobert
DonnellPierre |
| Collana | Environmental Research Advances |
| Soggetto topico |
Diodes
Organic field-effect transistors |
| ISBN | 1-61761-868-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""INTEGRATED CIRCUITS,PHOTODIODES AND ORGANIC FIELDEFFECT TRANSISTORS""; ""CONTENTS""; ""PREFACE""; ""RESEARCH AND REVIEW STUDIES""; ""METAMATERIALS TECHNOLOGY: APPLICATIONTO RADIOFREQUENCY AND MICROWAVE CIRCUITS""; ""ABSTRACT""; ""1. INTRODUCTION TO METAMATERIALS""; ""2. METAMATERIALS IN PLANAR TECHNOLOGY:METAMATERIAL TRANSMISSION LINES""; ""2.1. The Dual Transmission Line Concept""; ""2.2. CL-Loaded Lines: The Composite Right/Left Handed TransmissionLine Concept""; ""2.3. Resonant Type Metamaterial Transmission Lines""; ""3. APPLICATIONS OF METAMATERIAL TRANSMISSION LINES""
""3.1. Metamaterial Filters""""3.1.1. Stop Band Filters: Application to Spurious Suppression in ConventionalFilters""; ""3.1.2. Narrow Band Pass Filters and Diplexers""; ""3.1.3. Wide and Ultra Wide Band (UWB) Pass Filters""; ""3.1.4. Metamaterial Based Filters Subjected to Standard Responses:A Design Methodology""; ""3.2. Enhanced Bandwidth Components""; ""3.3. Multiband Components""; ""4. CONCLUSION""; ""REFERENCES""; ""RELIABILITY ASSESSMENT OF INTEGRATEDCIRCUITS AND ITS MISCONCEPTION""; ""ABSTRACT""; ""I. THE IMPORTANCE OF INTEGRATED CIRCUIT RELIABILITY"" ""II. COMMON RELIABILITY PRACTICES IN INTEGRATEDCIRCUIT INDUSTRY""""1. Process Reliability Test in Wafer Fabrication Manufacturers""; ""2. Product Reliability Tests in IC Assembly and Packaging Manufacturers""; ""3. Highly Accelerated Stress Test (HAST)""; ""III. MISCONCEPTIONS IN COMMON RELIABILITY ASSESSMENTOF INTEGRATED CIRCUITS""; ""1. Zero Failure Represents Good Reliability""; ""2. Higher MTTF Represents Better Reliability""; ""3. MTTF Is the Mean Failure Time""; ""4. Exponential Distribution Is Sufficient to Analyze the Test Data"" ""5. The Higher the Stress, the More Effective Is the Reliability Test""""A. Masked Failure Mechanism""; ""B. Variation of Failure Mechanism""; ""6. All Test Data Are Valid""; ""7. Only One Failure Mechanism Exist in the Failed Units""; ""8. Probability Plot Is Sufficient for Test Data Analysis""; ""9. Small Sample Size Is Sufficient""; ""10. The Important of Confidence Interval""; ""IV. CONCLUSION""; ""REFERENCES""; ""DESIGN OF A MULTICHANNEL INTEGRATEDBIOSENSOR CHIP AND MICROELECTRONIC SYSTEMFOR EXTRACELLULAR NEURAL RECORDING""; ""ABSTRACT""; ""1. INTRODUCTION""; ""2. SYSTEM OVERVIEW"" ""3. SYSTEM ARCHITECTURE AND DESIGN""""3.1. Neural Signal Input""; ""3.2. Preamplifier Buffers""; ""3.3. Analysis and Design of the Two-Stage Amplifier BasedPreamplifier Buffer""; ""3.3.1. Device Model""; ""3.3.2. Frequency Response and Pole/Zero Locations""; ""3.3.3. Output Swing""; ""3.3.4. Common-Mode Input Range""; ""3.3.5. Internal Slew Rate""; ""3.3.6. External Slew Rate""; ""3.3.7. Systematic Input-Referred Offset Voltage Minimization""; ""3.3.8. Input-Referred Thermal Noise""; ""3.3.9. Preamplifier Buffer Design""; ""3.4. Channels Addressing and Sequencing"" ""3.5. Biasing Circuitry"" |
| Record Nr. | UNINA-9910791834003321 |
| New York, : Nova Science Publishers, c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Investigation of slow-axis beam quality degradation in high-power broad area diode lasers / / vorgelegt von Martin Winterfeldt, aus Schwerin (Meckl.)
| Investigation of slow-axis beam quality degradation in high-power broad area diode lasers / / vorgelegt von Martin Winterfeldt, aus Schwerin (Meckl.) |
| Autore | Winterfeldt Martin |
| Edizione | [1. Auflage.] |
| Pubbl/distr/stampa | Göttingen : , : Cuvillier Verlag, , [2018] |
| Descrizione fisica | 1 online resource (159 pages) |
| Disciplina | 621.3815 |
| Collana | Innovationen mit Mikrowellen und Licht. Forschungsberichte aus dem Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik |
| Soggetto topico | Diodes |
| ISBN | 3-7369-8733-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910795416403321 |
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Winterfeldt Martin
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| Göttingen : , : Cuvillier Verlag, , [2018] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Investigation of slow-axis beam quality degradation in high-power broad area diode lasers / / vorgelegt von Martin Winterfeldt, aus Schwerin (Meckl.)
| Investigation of slow-axis beam quality degradation in high-power broad area diode lasers / / vorgelegt von Martin Winterfeldt, aus Schwerin (Meckl.) |
| Autore | Winterfeldt Martin |
| Edizione | [1. Auflage.] |
| Pubbl/distr/stampa | Göttingen : , : Cuvillier Verlag, , [2018] |
| Descrizione fisica | 1 online resource (159 pages) |
| Disciplina | 621.3815 |
| Collana | Innovationen mit Mikrowellen und Licht. Forschungsberichte aus dem Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik |
| Soggetto topico | Diodes |
| ISBN | 3-7369-8733-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910809630303321 |
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Winterfeldt Martin
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| Göttingen : , : Cuvillier Verlag, , [2018] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Preliminary study of a thermionic reactor core composed of short-length externally fueled diodes / / by Howard G. Yacobucci
| Preliminary study of a thermionic reactor core composed of short-length externally fueled diodes / / by Howard G. Yacobucci |
| Autore | Yacobucci Howard G. |
| Pubbl/distr/stampa | Washington, D.C. : , : National Aeronautics and Space Administration, , September 1968 |
| Descrizione fisica | 1 online resource (iv, 64 pages) : illustrations |
| Collana | NASA technical note |
| Soggetto topico |
Thermionic converters
Diodes |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910714048403321 |
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Yacobucci Howard G.
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| Washington, D.C. : , : National Aeronautics and Space Administration, , September 1968 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Python scripts for automation of current-voltage testing of semiconductor devices (FY17) / / by Bryan H Zhao, Randy P Tompkins
| Python scripts for automation of current-voltage testing of semiconductor devices (FY17) / / by Bryan H Zhao, Randy P Tompkins |
| Autore | Zhao Bryan H. |
| Pubbl/distr/stampa | Adelphi, MD : , : US Army Research Laboratory, , Jan 2017 |
| Descrizione fisica | 1 online resource (iv, 42 pages) : color illustration |
| Collana | ARL-TR |
| Soggetto topico |
Gallium nitride
Diodes Python (Computer program language) Electric currents, Alternating - Testing Electromotive force - Testing |
| Soggetto genere / forma | Technical reports. |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Python scripts for automation of current-voltage testing of semiconductor devices |
| Record Nr. | UNINA-9910711500003321 |
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Zhao Bryan H.
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| Adelphi, MD : , : US Army Research Laboratory, , Jan 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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