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1484.12.3-2020 - IEEE Standard for Learning Technology--Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata / / Institute of Electrical and Electronics Engineers
| 1484.12.3-2020 - IEEE Standard for Learning Technology--Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2020 |
| Descrizione fisica | 1 online resource (58 pages) |
| Disciplina | 621.381 |
| Soggetto topico |
Digital electronics - Standards
XML (Document markup language) |
| ISBN | 1-5044-6548-2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 1484.12.3-2020 - IEEE Standard for Learning Technology--Extensible Markup Language |
| Record Nr. | UNINA-9910389549403321 |
| New York, New York : , : IEEE, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1484.12.3-2020 - IEEE Standard for Learning Technology--Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata / / Institute of Electrical and Electronics Engineers
| 1484.12.3-2020 - IEEE Standard for Learning Technology--Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2020 |
| Descrizione fisica | 1 online resource (58 pages) |
| Disciplina | 621.381 |
| Soggetto topico |
Digital electronics - Standards
XML (Document markup language) |
| ISBN | 1-5044-6548-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 1484.12.3-2020 - IEEE Standard for Learning Technology--Extensible Markup Language |
| Record Nr. | UNISA-996574843403316 |
| New York, New York : , : IEEE, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) : IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description / / Institute of Electrical and Electronics Engineers
| IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) : IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2018 |
| Descrizione fisica | 1 online resource (747 pages) |
| Disciplina | 621.3 |
| Soggetto topico |
Digital electronics - Standards
Standards, Engineering |
| ISBN | 1-5044-4567-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1671.3-2017 - IEEE Standard for Automatic Test Markup Language
IEEE Std 1671.3-2017 |
| Record Nr. | UNINA-9910280888303321 |
| New York, New York : , : IEEE, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) : IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description / / Institute of Electrical and Electronics Engineers
| IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) : IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2018 |
| Descrizione fisica | 1 online resource (747 pages) |
| Disciplina | 621.3 |
| Soggetto topico |
Digital electronics - Standards
Standards, Engineering |
| ISBN | 1-5044-4567-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1671.3-2017 - IEEE Standard for Automatic Test Markup Language
IEEE Std 1671.3-2017 |
| Record Nr. | UNISA-996279606103316 |
| New York, New York : , : IEEE, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
