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Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only / / edited by: Paolo Scardi and Robert E. Dinnebier
| Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only / / edited by: Paolo Scardi and Robert E. Dinnebier |
| Pubbl/distr/stampa | Stafa-Zurich, Switzerland ; ; Enfield, New Hampshire : , : Trans Tech, , 2010 |
| Descrizione fisica | 1 online resource (222 p.) |
| Disciplina | 535/.42028551 |
| Altri autori (Persone) |
ScardiP (Paolo)
DinnebierRobert E |
| Collana | Materials science forum |
| Soggetto topico |
Diffraction - Mathematics
Diffraction - Computer simulation |
| Soggetto genere / forma | Electronic books. |
| ISBN | 3-03813-333-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Extending the Reach of Powder Diffraction Modelling; Preface; Table of Contents; Advanced Input Files & Parametric Quantitative Analysis Using Topas; Problem Solving with the TOPAS Macro Language: Corrections and Constraints in Simulated Annealing and Rietveld Refinement; Robust Refinement as Implemented in TOPAS; In Situ Diffraction Studies: Thermal Decomposition of a Natural Plumbojarosite and the Development of Rietveld-Based Data Analysis Techniques
Molecular Motion by Refinement of TLS Matrices from High Resolution Laboratory Powder Diffraction Data: Implementation in the Program TOPAS and Application to Crystalline NaphthaleneSimulated Annealing Approach for Global Minimum Verification in Modeling of Pressure-Volume Dependence by Equations of State Obtained by High-Pressure Diffraction; Direct Access to the Order Parameter: Parameterized Symmetry Modes and Rigid Body Movements as a Function of Temperature; "Powder 3D Parametric"- A program for Automated Sequential and Parametric Rietveld Refinement Using Topas MEM Calculations on Apatites Containing Peroxide Using BAYMEM and TOPASProtein Powder Diffraction Analysis with TOPAS; Composition-Induced Microstrain Broadening: From Pattern Decomposition to whole Powder Pattern Modelling Procedures; WPPM: Microstructural Analysis beyond the Rietveld Method; WPPM: Advances in the Modeling of Dislocation Line Broadening; Domain Size Analysis in the Rietveld Method; The Application of the Fundamental Parameters Approach as Implemented in TOPAS to Divergent Beam Powder Diffraction Data; Keywords Index; Authors Index |
| Record Nr. | UNINA-9910462537503321 |
| Stafa-Zurich, Switzerland ; ; Enfield, New Hampshire : , : Trans Tech, , 2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only / / edited by: Paolo Scardi and Robert E. Dinnebier
| Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only / / edited by: Paolo Scardi and Robert E. Dinnebier |
| Pubbl/distr/stampa | Stafa-Zurich, Switzerland ; ; Enfield, New Hampshire : , : Trans Tech, , 2010 |
| Descrizione fisica | 1 online resource (222 p.) |
| Disciplina | 535/.42028551 |
| Altri autori (Persone) |
ScardiP (Paolo)
DinnebierRobert E |
| Collana | Materials science forum |
| Soggetto topico |
Diffraction - Mathematics
Diffraction - Computer simulation |
| ISBN | 3-03813-333-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Extending the Reach of Powder Diffraction Modelling; Preface; Table of Contents; Advanced Input Files & Parametric Quantitative Analysis Using Topas; Problem Solving with the TOPAS Macro Language: Corrections and Constraints in Simulated Annealing and Rietveld Refinement; Robust Refinement as Implemented in TOPAS; In Situ Diffraction Studies: Thermal Decomposition of a Natural Plumbojarosite and the Development of Rietveld-Based Data Analysis Techniques
Molecular Motion by Refinement of TLS Matrices from High Resolution Laboratory Powder Diffraction Data: Implementation in the Program TOPAS and Application to Crystalline NaphthaleneSimulated Annealing Approach for Global Minimum Verification in Modeling of Pressure-Volume Dependence by Equations of State Obtained by High-Pressure Diffraction; Direct Access to the Order Parameter: Parameterized Symmetry Modes and Rigid Body Movements as a Function of Temperature; "Powder 3D Parametric"- A program for Automated Sequential and Parametric Rietveld Refinement Using Topas MEM Calculations on Apatites Containing Peroxide Using BAYMEM and TOPASProtein Powder Diffraction Analysis with TOPAS; Composition-Induced Microstrain Broadening: From Pattern Decomposition to whole Powder Pattern Modelling Procedures; WPPM: Microstructural Analysis beyond the Rietveld Method; WPPM: Advances in the Modeling of Dislocation Line Broadening; Domain Size Analysis in the Rietveld Method; The Application of the Fundamental Parameters Approach as Implemented in TOPAS to Divergent Beam Powder Diffraction Data; Keywords Index; Authors Index |
| Record Nr. | UNINA-9910790310703321 |
| Stafa-Zurich, Switzerland ; ; Enfield, New Hampshire : , : Trans Tech, , 2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only / / edited by: Paolo Scardi and Robert E. Dinnebier
| Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only / / edited by: Paolo Scardi and Robert E. Dinnebier |
| Pubbl/distr/stampa | Stafa-Zurich, Switzerland ; ; Enfield, New Hampshire : , : Trans Tech, , 2010 |
| Descrizione fisica | 1 online resource (222 p.) |
| Disciplina | 535/.42028551 |
| Altri autori (Persone) |
ScardiP (Paolo)
DinnebierRobert E |
| Collana | Materials science forum |
| Soggetto topico |
Diffraction - Mathematics
Diffraction - Computer simulation |
| ISBN | 3-03813-333-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Extending the Reach of Powder Diffraction Modelling; Preface; Table of Contents; Advanced Input Files & Parametric Quantitative Analysis Using Topas; Problem Solving with the TOPAS Macro Language: Corrections and Constraints in Simulated Annealing and Rietveld Refinement; Robust Refinement as Implemented in TOPAS; In Situ Diffraction Studies: Thermal Decomposition of a Natural Plumbojarosite and the Development of Rietveld-Based Data Analysis Techniques
Molecular Motion by Refinement of TLS Matrices from High Resolution Laboratory Powder Diffraction Data: Implementation in the Program TOPAS and Application to Crystalline NaphthaleneSimulated Annealing Approach for Global Minimum Verification in Modeling of Pressure-Volume Dependence by Equations of State Obtained by High-Pressure Diffraction; Direct Access to the Order Parameter: Parameterized Symmetry Modes and Rigid Body Movements as a Function of Temperature; "Powder 3D Parametric"- A program for Automated Sequential and Parametric Rietveld Refinement Using Topas MEM Calculations on Apatites Containing Peroxide Using BAYMEM and TOPASProtein Powder Diffraction Analysis with TOPAS; Composition-Induced Microstrain Broadening: From Pattern Decomposition to whole Powder Pattern Modelling Procedures; WPPM: Microstructural Analysis beyond the Rietveld Method; WPPM: Advances in the Modeling of Dislocation Line Broadening; Domain Size Analysis in the Rietveld Method; The Application of the Fundamental Parameters Approach as Implemented in TOPAS to Divergent Beam Powder Diffraction Data; Keywords Index; Authors Index |
| Record Nr. | UNINA-9910816931603321 |
| Stafa-Zurich, Switzerland ; ; Enfield, New Hampshire : , : Trans Tech, , 2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The method of the generalised eikonal : new approaches in the diffraction theory / / Michael V. Vesnik
| The method of the generalised eikonal : new approaches in the diffraction theory / / Michael V. Vesnik |
| Autore | Vesnik Michael V. |
| Pubbl/distr/stampa | Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2015 |
| Descrizione fisica | 1 online resource (216 p.) |
| Disciplina | 535/.42 |
| Altri autori (Persone) | YakushSergey |
| Collana | De Gruyter Studies in Mathematical Physics |
| Soggetto topico | Diffraction - Mathematics |
| Soggetto genere / forma | Electronic books. |
| ISBN |
3-11-031129-1
3-11-038301-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front matter -- Preface -- Contents -- Introduction -- 1 Method of Generalized Eikonal -- 2 Solution of Two-dimensional Problems by the Method of Generalized Eikonal -- 3 Application of Two-dimensional Solutions to Three-dimensional Problems -- 4 Diffraction by a Plane Perfectly Conducting Angular Sector (Heuristic Approach) -- 5 Propagation of Radio Waves in Urban Environment (Deterministic Approach) -- 6 Analytical Heuristic Solution for Wave Diffraction by a Plane Polygonal Scatterer -- 7 Conclusion -- A Application of Stokes Theorem to Diffraction Problems -- B Rigorous Two-dimensional Solution for Diffraction by Half-plane -- C Application of Imaginary Edge in Diffraction Problems -- D Summary of Formulas for Diffraction by Plane Angular Sector -- E Fresnel Integral and its Properties -- F Generalized Fresnel Integral and Its Properties -- G Electromagnetic Wave Diffraction by Semi-transparent Plate in the Physical Optics Approximation -- H Generalized Diffraction Coefficient and its Application to Diffraction Problems -- Bibliography -- Index -- Backmatter |
| Record Nr. | UNINA-9910460794103321 |
Vesnik Michael V.
|
||
| Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The method of the generalised eikonal : new approaches in the diffraction theory / / Michael V. Vesnik
| The method of the generalised eikonal : new approaches in the diffraction theory / / Michael V. Vesnik |
| Autore | Vesnik Michael V. |
| Pubbl/distr/stampa | Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2015 |
| Descrizione fisica | 1 online resource (216 p.) |
| Disciplina | 535/.42 |
| Altri autori (Persone) | YakushSergey |
| Collana | De Gruyter Studies in Mathematical Physics |
| Soggetto topico | Diffraction - Mathematics |
| ISBN |
3-11-031129-1
3-11-038301-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front matter -- Preface -- Contents -- Introduction -- 1 Method of Generalized Eikonal -- 2 Solution of Two-dimensional Problems by the Method of Generalized Eikonal -- 3 Application of Two-dimensional Solutions to Three-dimensional Problems -- 4 Diffraction by a Plane Perfectly Conducting Angular Sector (Heuristic Approach) -- 5 Propagation of Radio Waves in Urban Environment (Deterministic Approach) -- 6 Analytical Heuristic Solution for Wave Diffraction by a Plane Polygonal Scatterer -- 7 Conclusion -- A Application of Stokes Theorem to Diffraction Problems -- B Rigorous Two-dimensional Solution for Diffraction by Half-plane -- C Application of Imaginary Edge in Diffraction Problems -- D Summary of Formulas for Diffraction by Plane Angular Sector -- E Fresnel Integral and its Properties -- F Generalized Fresnel Integral and Its Properties -- G Electromagnetic Wave Diffraction by Semi-transparent Plate in the Physical Optics Approximation -- H Generalized Diffraction Coefficient and its Application to Diffraction Problems -- Bibliography -- Index -- Backmatter |
| Record Nr. | UNINA-9910797440503321 |
|
Vesnik Michael V.
|
||
| Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The method of the generalised eikonal : new approaches in the diffraction theory / / Michael V. Vesnik
| The method of the generalised eikonal : new approaches in the diffraction theory / / Michael V. Vesnik |
| Autore | Vesnik Michael V. |
| Pubbl/distr/stampa | Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2015 |
| Descrizione fisica | 1 online resource (216 p.) |
| Disciplina | 535/.42 |
| Altri autori (Persone) | YakushSergey |
| Collana | De Gruyter Studies in Mathematical Physics |
| Soggetto topico | Diffraction - Mathematics |
| ISBN |
3-11-031129-1
3-11-038301-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front matter -- Preface -- Contents -- Introduction -- 1 Method of Generalized Eikonal -- 2 Solution of Two-dimensional Problems by the Method of Generalized Eikonal -- 3 Application of Two-dimensional Solutions to Three-dimensional Problems -- 4 Diffraction by a Plane Perfectly Conducting Angular Sector (Heuristic Approach) -- 5 Propagation of Radio Waves in Urban Environment (Deterministic Approach) -- 6 Analytical Heuristic Solution for Wave Diffraction by a Plane Polygonal Scatterer -- 7 Conclusion -- A Application of Stokes Theorem to Diffraction Problems -- B Rigorous Two-dimensional Solution for Diffraction by Half-plane -- C Application of Imaginary Edge in Diffraction Problems -- D Summary of Formulas for Diffraction by Plane Angular Sector -- E Fresnel Integral and its Properties -- F Generalized Fresnel Integral and Its Properties -- G Electromagnetic Wave Diffraction by Semi-transparent Plate in the Physical Optics Approximation -- H Generalized Diffraction Coefficient and its Application to Diffraction Problems -- Bibliography -- Index -- Backmatter |
| Record Nr. | UNINA-9910824032703321 |
|
Vesnik Michael V.
|
||
| Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
