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11th Workshop on Crystalline Silicon Solar Cell Materials and Processes : August 19-22, 2001, Holiday Inn, Estes Park, Colorado : extended abstracts and papers / / workshop chairman/editor: B.L. Sopori
| 11th Workshop on Crystalline Silicon Solar Cell Materials and Processes : August 19-22, 2001, Holiday Inn, Estes Park, Colorado : extended abstracts and papers / / workshop chairman/editor: B.L. Sopori |
| Pubbl/distr/stampa | Golden, Colo. : , : National Renewable Energy Laboratory, , August 2001 |
| Descrizione fisica | 1 online resource (304 pages) : illustrations |
| Collana | NREL/BK |
| Soggetto topico |
Silicon - Defects
Crystal growth Energy Accounting Silicon Solar Cells Fabrication Silicon Mechanical Properties Impurities Contractors Gettering Manufacturing Passivation Defects Solar Cells Microelectronics |
| Soggetto genere / forma | Conference papers and proceedings. |
| Soggetto non controllato | Si Solar Cell - Crystalline Solar Cell - Materials And Processes |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 11th Workshop on Crystalline Silicon Solar Cell Materials and Processes |
| Record Nr. | UNINA-9910706546503321 |
| Golden, Colo. : , : National Renewable Energy Laboratory, , August 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Arcjet cathode phenomena [[electronic resource] /] / Francis M. Curran and Thomas W. Haag and John F. Raquet
| Arcjet cathode phenomena [[electronic resource] /] / Francis M. Curran and Thomas W. Haag and John F. Raquet |
| Autore | Curran Francis M |
| Pubbl/distr/stampa | [Washington, D.C.] : , : National Aeronautics and Space Administration, , [1989] |
| Descrizione fisica | 15 pages : digital, PDF file |
| Altri autori (Persone) |
HaagThomas W
RaquetJohn F |
| Collana | NASA technical memorandum |
| Soggetto topico |
Arc jet engines
Cathodes Cracks Defects Surface properties Thermal degradation Voids |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910698090403321 |
Curran Francis M
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| [Washington, D.C.] : , : National Aeronautics and Space Administration, , [1989] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Binomial test method for determining probability of detection capability for fracture critical applications [[electronic resource] /] / Edward R. Generazio
| Binomial test method for determining probability of detection capability for fracture critical applications [[electronic resource] /] / Edward R. Generazio |
| Autore | Generazio Edward R |
| Pubbl/distr/stampa | Hampton, Va. : , : National Aeronautics and Space Administration, Langley Research Center, , [2011] |
| Descrizione fisica | 1 online resource (33 pages) : illustrations (some color) |
| Altri autori (Persone) | NorburyJohn W |
| Collana | NASA/TP |
| Soggetto topico |
Probability theory
Experiment design Detection Nondestructive tests Defects |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910701449803321 |
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Generazio Edward R
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| Hampton, Va. : , : National Aeronautics and Space Administration, Langley Research Center, , [2011] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Defects of Solid Semiconductor Structures
| Defects of Solid Semiconductor Structures |
| Autore | Riccio Michele |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Zurich : , : Trans Tech Publications, Limited, , 2024 |
| Descrizione fisica | 1 online resource (179 pages) |
| Altri autori (Persone) |
IraceAndrea
BreglioGiovanni |
| Collana | Defect and Diffusion Forum |
| Soggetto topico |
Defects
Silicon carbide |
| ISBN |
9783036416359
3036416358 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Intro -- Defects of Solid Semiconductor Structures -- Preface -- Table of Contents -- Evaluation of Basal Plane Dislocation Behavior near Epilayer and Substrate Interface -- Body Diode Reliability of 4H-SiC MOSFETs as a Function of Epitaxial Process Parameter -- Accuracy of EVC Method for the PiN Diode Pattern on SiC Epi-Wafer -- Study on Quantification of Correlation between Current Density and UV Irradiation Intensity, Leading to Bar Shaped 1SSF Expansion -- Early Detection of Bar-Shaped 1SSF before Expansion by PL Imaging -- Analysis of Forward Bias Degradation Reduction in 4H-SiC PiN Diodes on Bonded Substrates -- Investigation of Dislocation Behaviors in 4H-SiC Substrate during Post-Growth Thermal Treatment -- The Role of Defects on SiC Device Performance and Ways to Mitigate them -- Emission of Trapped Electrons from the 4H-SiC/SiO2-Interface via Photon-Irradiance at Cryogenic Temperatures -- SiC MOSFET Gate Oxide Quality Improvement Method in Furnace Thermal Oxidation with Lower Pressure Control -- Investigating Dislocation Arrays Induced by Seed Scratches during PVT 4H-SiC Crystal Growth Using Synchrotron X-Ray Topography -- Crystal Originated Defect Monitoring and Reduction in Production Grade SmartSiC™ Engineered Substrates -- Analysis of Lattice Damage in 4H-SiC Epiwafers Implanted with High Energy Al Ions at Elevated Temperatures -- Near-Interface Defect Decomposition during NO Annealing Analyzed by Molecular Dynamics Simulations -- Differences between Polar-Face and Non-Polar Face 4H-SiC/SiO2 Interfaces Revealed by Magnetic Resonance Spectroscopy -- Investigation of BPD Faulting under Extreme Carrier Injection in Room vs High Temperature Implanted 3.3kV SiC MOSFETs -- Epitaxial Defectivity Characterization Combining Surface Voltage and Photoluminescence Mapping on 200mm 4H-SiC Wafers.
Buffer Layer Dependence of Defectivity in 200mm 4H-SiC Homoepitaxy -- A Study of Process Interruptions during Pre- and Post-Buffer Layer Epitaxial Growth for Defect Reduction in 4H SiC -- Practical Improvement of Noncontact Production Monitoring of Doping in SiC Wafers with Extended Epilayer Defects -- Analysis of Defect Structures during the Early-Stages of PVT Growth of 4H-SiC Crystals -- Development of 3-Channel Inspection Analysis Technique for Defects of SiC Epitaxial Wafers Using Optical Inspection, Photoluminescence and X-Ray Topography -- High-Volume SiC Epitaxial Layer Manufacturing-Maintaining High Materials Quality of Lab Results in Production -- Non-Destructive Quantification of In-Plane Depth Distribution of Sub-Surface Damage on 4H-SiC Wafers Using Laser Light Scattering -- Macro Step Bunching/Debunching Engineering on 4° off 4H-SiC (0001) to Control the BPD-TED Conversion Ratio by Dynamic AGE-Ing® -- Charge Carrier Capture by Prominent Defect Centers in 4H-SiC -- Keyword Index -- Author Index. |
| Record Nr. | UNINA-9911006725003321 |
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Riccio Michele
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| Zurich : , : Trans Tech Publications, Limited, , 2024 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Fault detection [[electronic resource] ] : theory, methods and systems / / Lea M. Simon, editor
| Fault detection [[electronic resource] ] : theory, methods and systems / / Lea M. Simon, editor |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2011 |
| Descrizione fisica | 1 online resource (316 p.) |
| Disciplina | 620/.0044 |
| Altri autori (Persone) | SimonLea M |
| Collana | Engineering tools, techniques and tables |
| Soggetto topico |
Defects
Fault location (Engineering) |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-61728-441-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""FAULT DETECTION: THEORY, METHODS AND SYSTEMS ""; ""FAULT DETECTION: THEORY, METHODS AND SYSTEMS""; ""CONTENTS ""; ""PREFACE ""; ""ADVANCED SYSTEM FOR AUTOMATICALLY DETECTING FAULTS OCCURRING IN BEARINGS ""; ""Abstract ""; ""Section 1. Introduction ""; ""1.1. The Background of Machinery Fault Detection ""; ""1.2. The Motivation to Develop an Automatic System for Detecting Bearing Faults ""; ""1.3. The Review of the Maintenance Approaches ""; ""1.3.1. The Run-to-Breakdown Approach ""; ""1.3.2. The Time-Based Preventive Maintenance Approach ""
""1.3.3. The Condition-Based Maintenance Approach """"1.3.4. The Advantages for Adopting the Conditional-based Maintenance Approach ""; ""Section 2. The Review of the Machinery Fault Detection Methodology ""; ""2.1. Transducer Used for Measuring Vibration Signal ""; ""2.2. Vibration Measurement ""; ""2.3. Vibration Trend ""; ""2.4. The Introduction of Fast Fourier Transform (FFT) ""; ""2.4.1. The Principal of Fast Fourier Transform ""; ""2.4.2. The Limitations of the Existing FFT ""; ""2.5. The Introduction of Wavelet Transform ""; ""2.5.1. The Principal of Wavelet Transform "" ""2.5.2. The Limitations of Existing Wavelet Transform """"2.6. The Introduction of the Reassignment Wavelet Transform ""; ""2.6.1. The Principal of Reassignment ""; ""2.6.2. The Definition of Reassignment Wavelet Transform ""; ""2.7. The Use of the Higher Order Statistics in Machinery Fault Detection ""; ""2.7.1. Kurtosis ""; ""2.7.2. Spectral Kurtosis ""; ""2.7.3. Root Mean Square ""; ""2.7.4. The Rationale of Proposing a Novel Spectral RMS x Kurtosis for Effective Bearing Fault Detection ""; ""2.7.5. Spectral RMS x Kurtosis "" ""2.8. The Evolution of Reassignment Wavelet Based Spectrum RMS X Kurtosis """"Section 3. The Design of the Virtual Based Automatic Fault Detection System ""; ""3.1. Development of a Single Tasked Data Acquisition Program ""; ""3.2. Implementation of the Reassignment Wavelet Analysis ""; ""3.3. Screen Flow Design and Functionality ""; ""3.4. Time Domain Analysis ""; ""3.5. Data Storage and Extraction ""; ""3.6. The Layout of the Hardware Configuration ""; ""Section 4. Experiment on Laboratory Machinery Fault Simulator ""; ""4.1. The Bearing Fault Demonstrator "" ""4.2. The Rolling Element Bearings """"4.3. Artificially Induced Bearing Defects ""; ""4.4. A Comparison Study of Conventional Wavelet and Reassignment Wavelet ""; ""4.5. Bearing Fault Detection by Using RMS and Kurtosis ""; ""4.6. Detection of a Normal Condition Signal and Motor Signature ""; ""4.7. The Analysis of the Bearing Signal Collected from a Bearing with a Ball Defect ""; ""4.8. The Analysis of Bearing Signals Collected from Bearings with Outer Race and Inner Race Defects ""; ""4.9. Experimental Analysis with Computer Generated Noise Simulation "" ""Section 5. Experiments on Industrial Machines "" |
| Record Nr. | UNINA-9910461363603321 |
| New York, : Nova Science Publishers, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Fault detection [[electronic resource] ] : theory, methods and systems / / Lea M. Simon, editor
| Fault detection [[electronic resource] ] : theory, methods and systems / / Lea M. Simon, editor |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2011 |
| Descrizione fisica | 1 online resource (316 p.) |
| Disciplina | 620/.0044 |
| Altri autori (Persone) | SimonLea M |
| Collana | Engineering tools, techniques and tables |
| Soggetto topico |
Defects
Fault location (Engineering) |
| ISBN | 1-61728-441-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""FAULT DETECTION: THEORY, METHODS AND SYSTEMS ""; ""FAULT DETECTION: THEORY, METHODS AND SYSTEMS""; ""CONTENTS ""; ""PREFACE ""; ""ADVANCED SYSTEM FOR AUTOMATICALLY DETECTING FAULTS OCCURRING IN BEARINGS ""; ""Abstract ""; ""Section 1. Introduction ""; ""1.1. The Background of Machinery Fault Detection ""; ""1.2. The Motivation to Develop an Automatic System for Detecting Bearing Faults ""; ""1.3. The Review of the Maintenance Approaches ""; ""1.3.1. The Run-to-Breakdown Approach ""; ""1.3.2. The Time-Based Preventive Maintenance Approach ""
""1.3.3. The Condition-Based Maintenance Approach """"1.3.4. The Advantages for Adopting the Conditional-based Maintenance Approach ""; ""Section 2. The Review of the Machinery Fault Detection Methodology ""; ""2.1. Transducer Used for Measuring Vibration Signal ""; ""2.2. Vibration Measurement ""; ""2.3. Vibration Trend ""; ""2.4. The Introduction of Fast Fourier Transform (FFT) ""; ""2.4.1. The Principal of Fast Fourier Transform ""; ""2.4.2. The Limitations of the Existing FFT ""; ""2.5. The Introduction of Wavelet Transform ""; ""2.5.1. The Principal of Wavelet Transform "" ""2.5.2. The Limitations of Existing Wavelet Transform """"2.6. The Introduction of the Reassignment Wavelet Transform ""; ""2.6.1. The Principal of Reassignment ""; ""2.6.2. The Definition of Reassignment Wavelet Transform ""; ""2.7. The Use of the Higher Order Statistics in Machinery Fault Detection ""; ""2.7.1. Kurtosis ""; ""2.7.2. Spectral Kurtosis ""; ""2.7.3. Root Mean Square ""; ""2.7.4. The Rationale of Proposing a Novel Spectral RMS x Kurtosis for Effective Bearing Fault Detection ""; ""2.7.5. Spectral RMS x Kurtosis "" ""2.8. The Evolution of Reassignment Wavelet Based Spectrum RMS X Kurtosis """"Section 3. The Design of the Virtual Based Automatic Fault Detection System ""; ""3.1. Development of a Single Tasked Data Acquisition Program ""; ""3.2. Implementation of the Reassignment Wavelet Analysis ""; ""3.3. Screen Flow Design and Functionality ""; ""3.4. Time Domain Analysis ""; ""3.5. Data Storage and Extraction ""; ""3.6. The Layout of the Hardware Configuration ""; ""Section 4. Experiment on Laboratory Machinery Fault Simulator ""; ""4.1. The Bearing Fault Demonstrator "" ""4.2. The Rolling Element Bearings """"4.3. Artificially Induced Bearing Defects ""; ""4.4. A Comparison Study of Conventional Wavelet and Reassignment Wavelet ""; ""4.5. Bearing Fault Detection by Using RMS and Kurtosis ""; ""4.6. Detection of a Normal Condition Signal and Motor Signature ""; ""4.7. The Analysis of the Bearing Signal Collected from a Bearing with a Ball Defect ""; ""4.8. The Analysis of Bearing Signals Collected from Bearings with Outer Race and Inner Race Defects ""; ""4.9. Experimental Analysis with Computer Generated Noise Simulation "" ""Section 5. Experiments on Industrial Machines "" |
| Record Nr. | UNINA-9910789912603321 |
| New York, : Nova Science Publishers, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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On the determination of the origin of linear anomaly in the macrostructure of VPPA welded 2219-T87 aluminum alloy [[electronic resource] ] : preliminary report / / by W. A. Jemian
| On the determination of the origin of linear anomaly in the macrostructure of VPPA welded 2219-T87 aluminum alloy [[electronic resource] ] : preliminary report / / by W. A. Jemian |
| Autore | Jemian W. A |
| Pubbl/distr/stampa | Huntsville, Ala. : , : National Aeronautics and Space Administration, George C. Marshall Space Flight Center, Materials and Processes Laboratory, Science and Engineering Directorate, , [1986] |
| Descrizione fisica | 1 online resource (v, 23 pages) : illustrations |
| Collana | NASA contractor report |
| Soggetto topico |
Aluminum alloys
Anomalies Defects Fine structure Linearity Plasma arc welding Polarity Variability Weld tests |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | On the determination of the origin of linear anomaly in the macrostructure of VPPA welded 2219-T87 aluminum alloy |
| Record Nr. | UNINA-9910701805603321 |
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Jemian W. A
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| Huntsville, Ala. : , : National Aeronautics and Space Administration, George C. Marshall Space Flight Center, Materials and Processes Laboratory, Science and Engineering Directorate, , [1986] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Unit-sphere anisotropic multiaxial stochastic-strength model probability density distribution for the orientation of critical flaws / / Noel N. Nemeth
| Unit-sphere anisotropic multiaxial stochastic-strength model probability density distribution for the orientation of critical flaws / / Noel N. Nemeth |
| Autore | Nemeth Noel N. |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , September 2013 |
| Descrizione fisica | 1 online resource (38 pages) : illustrations (some color) |
| Collana | NASA/TM |
| Soggetto topico |
Anisotropy
Attitude (inclination) Axial loads Cracking (fracturing) Defects Failure modes Probability density functions |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910702431603321 |
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Nemeth Noel N.
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , September 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Soggetto topico
-
Defects
(8)
- Fault location (Engineering) (2)
- Aluminum alloys (1)
- Anisotropy (1)
- Anomalies (1)