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Biblioteca

MARC Lista (tabellare)
2830-2021 : IEEE Standard for Technical Framework and Requirements of Trusted Execution Environment based Shared Machine Learning / / Institute of Electrical and Electronics Engineers
2830-2021 : IEEE Standard for Technical Framework and Requirements of Trusted Execution Environment based Shared Machine Learning / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa New York, NY, USA : , : IEEE, , 2021
Descrizione fisica 1 online resource (23 pages)
Disciplina 006.31
Soggetto topico Machine learning
Deep learning (Machine learning)
Reinforcement learning
Computational learning theory
ISBN 1-5044-7724-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910503501803321
New York, NY, USA : , : IEEE, , 2021
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2830-2021 : IEEE Standard for Technical Framework and Requirements of Trusted Execution Environment based Shared Machine Learning / / Institute of Electrical and Electronics Engineers
2830-2021 : IEEE Standard for Technical Framework and Requirements of Trusted Execution Environment based Shared Machine Learning / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa New York, NY, USA : , : IEEE, , 2021
Descrizione fisica 1 online resource (23 pages)
Disciplina 006.31
Soggetto topico Machine learning
Deep learning (Machine learning)
Reinforcement learning
Computational learning theory
ISBN 1-5044-7724-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996574913703316
New York, NY, USA : , : IEEE, , 2021
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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Advanced analytics and deep learning models / / Shaveta Malik, Amit Kumar Tyagi and Archana Mire, editors
Advanced analytics and deep learning models / / Shaveta Malik, Amit Kumar Tyagi and Archana Mire, editors
Pubbl/distr/stampa Hoboken, NJ : , : John Wiley & Sons, Inc., , [2022]
Descrizione fisica 1 online resource (375 pages)
Disciplina 006.31
Collana Next Generation Computing and Communication Engineering Ser.
Soggetto topico Big data
Deep learning (Machine learning)
Artificial intelligence
ISBN 1-119-79243-6
1-119-79241-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910573097503321
Hoboken, NJ : , : John Wiley & Sons, Inc., , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advanced analytics and deep learning models / / Shaveta Malik, Amit Kumar Tyagi and Archana Mire, editors
Advanced analytics and deep learning models / / Shaveta Malik, Amit Kumar Tyagi and Archana Mire, editors
Pubbl/distr/stampa Hoboken, NJ : , : John Wiley & Sons, Inc., , [2022]
Descrizione fisica 1 online resource (375 pages)
Disciplina 006.31
Collana Next Generation Computing and Communication Engineering Ser.
Soggetto topico Big data
Deep learning (Machine learning)
Artificial intelligence
ISBN 1-119-79243-6
1-119-79241-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910642849403321
Hoboken, NJ : , : John Wiley & Sons, Inc., , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advanced analytics and deep learning models / / Shaveta Malik, Amit Kumar Tyagi and Archana Mire, editors
Advanced analytics and deep learning models / / Shaveta Malik, Amit Kumar Tyagi and Archana Mire, editors
Pubbl/distr/stampa Hoboken, NJ : , : John Wiley & Sons, Inc., , [2022]
Descrizione fisica 1 online resource (375 pages)
Disciplina 006.31
Collana Next Generation Computing and Communication Engineering
Soggetto topico Deep learning (Machine learning)
Artificial intelligence
Big data
ISBN 1-119-79243-6
1-119-79241-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910830819303321
Hoboken, NJ : , : John Wiley & Sons, Inc., , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advanced Machine Learning and Deep Learning Approaches for Remote Sensing / / edited by Gwanggil Jeon
Advanced Machine Learning and Deep Learning Approaches for Remote Sensing / / edited by Gwanggil Jeon
Pubbl/distr/stampa [Place of publication not identified] : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2023
Descrizione fisica 1 online resource (362 pages)
Disciplina 621.3678
Soggetto topico Deep learning (Machine learning)
Machine learning
Remote sensing
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910734348503321
[Place of publication not identified] : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2023
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advances and Applications in Deep Learning / / edited by Marco Antonio Aceves-Fernandez
Advances and Applications in Deep Learning / / edited by Marco Antonio Aceves-Fernandez
Pubbl/distr/stampa London : , : IntechOpen, , 2020
Descrizione fisica 1 online resource (xiii, 122 pages) : illustrations
Disciplina 006.31
Collana Artificial Intelligence
Soggetto topico Deep learning (Machine learning)
ISBN 1-83962-879-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910431355603321
London : , : IntechOpen, , 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advances and Applications in Deep Learning / / edited by Marco Antonio Aceves-Fernandez
Advances and Applications in Deep Learning / / edited by Marco Antonio Aceves-Fernandez
Pubbl/distr/stampa London, England : , : IntechOpen, , 2020
Descrizione fisica 1 online resource (122 pages)
Disciplina 006.31
Collana Artificial Intelligence
Soggetto topico Deep learning (Machine learning)
Artificial intelligence
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910688212303321
London, England : , : IntechOpen, , 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advances in Electromagnetics Empowered by Artificial Intelligence and Deep Learning
Advances in Electromagnetics Empowered by Artificial Intelligence and Deep Learning
Autore Campbell Sawyer D
Edizione [1st ed.]
Pubbl/distr/stampa Newark : , : John Wiley & Sons, Incorporated, , 2023
Descrizione fisica 1 online resource (595 pages)
Disciplina 537.0285/63
Altri autori (Persone) WernerDouglas H
Collana IEEE Press Series on Electromagnetic Wave Theory Series
Soggetto topico Artificial intelligence
Deep learning (Machine learning)
ISBN 9781119853923
1119853923
9781119853909
1119853907
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover -- Title Page -- Copyright -- Contents -- About the Editors -- List of Contributors -- Preface -- Part I Introduction to AI‐Based Regression and Classification -- Chapter 1 Introduction to Neural Networks -- 1.1 Taxonomy -- 1.1.1 Supervised Versus Unsupervised Learning -- 1.1.2 Regression Versus Classification -- 1.1.3 Training, Validation, and Test Sets -- 1.2 Linear Regression -- 1.2.1 Objective Functions -- 1.2.2 Stochastic Gradient Descent -- 1.3 Logistic Classification -- 1.4 Regularization -- 1.5 Neural Networks -- 1.6 Convolutional Neural Networks -- 1.6.1 Convolutional Layers -- 1.6.2 Pooling Layers -- 1.6.3 Highway Connections -- 1.6.4 Recurrent Layers -- 1.7 Conclusion -- References -- Chapter 2 Overview of Recent Advancements in Deep Learning and Artificial Intelligence -- 2.1 Deep Learning -- 2.1.1 Supervised Learning -- 2.1.1.1 Conventional Approaches
Record Nr. UNINA-9911019109303321
Campbell Sawyer D  
Newark : , : John Wiley & Sons, Incorporated, , 2023
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Adversarial machine learning : attack surfaces, defence mechanisms, learning theories in artificial intelligence / / Aneesh Sreevallabh Chivukula [and four others]
Adversarial machine learning : attack surfaces, defence mechanisms, learning theories in artificial intelligence / / Aneesh Sreevallabh Chivukula [and four others]
Autore Sreevallabh Chivukula Aneesh
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Cham, Switzerland : , : Springer Nature Switzerland AG, , [2023]
Descrizione fisica 1 online resource (314 pages)
Disciplina 005.8
Soggetto topico Computer security
Deep learning (Machine learning)
ISBN 3-030-99772-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Adversarial Machine Learning -- Adversarial Deep Learning -- Security and Privacy in Adversarial Learning -- Game-Theoretical Attacks with Adversarial Deep Learning Models -- Physical Attacks in the Real World -- Adversarial Defense Mechanisms -- Adversarial Learning for Privacy Preservation.
Record Nr. UNISA-996547955603316
Sreevallabh Chivukula Aneesh  
Cham, Switzerland : , : Springer Nature Switzerland AG, , [2023]
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui