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Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes / / C.M. Schnabel [and six others]
| Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes / / C.M. Schnabel [and six others] |
| Autore | Schnabel C. M. |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , February 2000 |
| Descrizione fisica | 1 online resource (4 pages) : illustrations |
| Collana | NASA/TM |
| Soggetto topico |
Correlation
Synchrotrons Topography Beam currents Electron beams Schottky diodes Crystal defects |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Correlation of electron-beam-induced current and synchrotron white-beam X-ray topography imaged defects and epilayer growth pits in 6H-SiC Schottky diodes |
| Record Nr. | UNINA-9910706231503321 |
Schnabel C. M.
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , February 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Electrical impact of SiC structural crystal defects on high electric field devices / / Philip G. Neudeck
| Electrical impact of SiC structural crystal defects on high electric field devices / / Philip G. Neudeck |
| Autore | Neudeck Philip G. |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , December 1999 |
| Descrizione fisica | 1 online resource (6 pages) : illustrations |
| Collana | NASA/TM |
| Soggetto topico |
Crystal defects
Silicon Electric fields Electrical properties Switching |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Electrical impact of silicon carbide structural crystal defects on high electric field devices |
| Record Nr. | UNINA-9910706124003321 |
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Neudeck Philip G.
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , December 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Soggetto topico
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Crystal defects
(2)
- Beam currents (1)
- Correlation (1)
- Electric fields (1)
- Electrical properties (1)