An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
| An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
| Autore | Moreira José <1975-> |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , [2016] |
| Descrizione fisica | 1 online resource (709 pages) : illustrations |
| Disciplina | 621.3815 |
| Collana | Artech House microwave library |
| Soggetto topico |
Equip de test automàtic
Circuits integrats - Proves Circuits integrats d'alta velocitat - Proves Integrated circuits - Testing Automatic test equipment Very high speed integrated circuits |
| ISBN |
9781608079865
1-5231-4621-4 1-60807-986-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards.
3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. |
| Altri titoli varianti |
Guide to automated testing of high-speed interfaces
Automated testing of high-speed interfaces |
| Record Nr. | UNINA-9910792713303321 |
Moreira José <1975->
|
||
| Norwood, Massachusetts : , : Artech House, , [2016] | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
| An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
| Autore | Moreira José <1975-> |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , [2016] |
| Descrizione fisica | 1 online resource (709 pages) : illustrations |
| Disciplina | 621.3815 |
| Collana | Artech House microwave library |
| Soggetto topico |
Equip de test automàtic
Circuits integrats - Proves Circuits integrats d'alta velocitat - Proves Integrated circuits - Testing Automatic test equipment Very high speed integrated circuits |
| ISBN |
9781608079865
1-5231-4621-4 1-60807-986-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards.
3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. |
| Altri titoli varianti |
Guide to automated testing of high-speed interfaces
Automated testing of high-speed interfaces |
| Record Nr. | UNINA-9910809724203321 |
Moreira José <1975->
|
||
| Norwood, Massachusetts : , : Artech House, , [2016] | ||
| Lo trovi qui: Univ. Federico II | ||
| ||