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Electrical Design of Advanced Packaging and Systems Symposium : [proceedings]
| Electrical Design of Advanced Packaging and Systems Symposium : [proceedings] |
| Pubbl/distr/stampa | Piscataway, NJ : , : Institute of Electrical and Electronic Engineers |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Design and construction
Electronic packaging - Design Electronic systems - Design and construction Signal integrity (Electronics) Circuits intégrés - Conception et construction Intégrité de signal (Électronique) |
| Soggetto genere / forma | Periodicals. |
| ISSN | 2151-1233 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
IEEE Electrical Design of Advanced Packaging and Systems Symposium
IEEE Electrical Design of Advanced Package & Systems Symposium Proceedings IEEE EDAPS EDAPS |
| Record Nr. | UNINA-9910626157103321 |
| Piscataway, NJ : , : Institute of Electrical and Electronic Engineers | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
| Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits |
| Pubbl/distr/stampa | Piscataway, N.J., : IEEE Service Center |
| Disciplina | 621 |
| Soggetto topico |
Integrated circuits - Design and construction
Integrated circuits - Testing Microelectronics - Research Circuits intégrés - Conception et construction Microélectronique - Recherche |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. |
| ISSN | 1946-1550 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
IPFA ... proceedings
Proceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits International Symposium on the Physical and Failure Analysis of Integrated Circuits .. IEEE ... International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| Record Nr. | UNINA-9910625173203321 |
| Piscataway, N.J., : IEEE Service Center | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
