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Characterization of solid materials and heterogeneous catalysts [[electronic resource] ] : from structure to surface reactivity / / edited by Michel Che and Jacques C. Védrine
| Characterization of solid materials and heterogeneous catalysts [[electronic resource] ] : from structure to surface reactivity / / edited by Michel Che and Jacques C. Védrine |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2012 |
| Descrizione fisica | 1 online resource (1257 p.) |
| Disciplina | 660.2995 |
| Altri autori (Persone) |
CheM (Michel)
VédrineJacques C |
| Soggetto topico |
Catalysts - Analysis
Heterogeneous catalysis Solid state chemistry |
| ISBN |
1-299-46436-X
3-527-64534-9 3-527-64533-0 3-527-64532-2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front Matter -- Molecular/Local Spectroscopies. Infrared Spectroscopy / Fřďric Thibault-Starzyk, Fraṅoise Mauǧ -- Raman and UV-Raman Spectroscopies / Fengtao Fan, Zhaochi Feng, Can Li -- Electronic Spectroscopy: Ultra Violet-Visible and near IR Spectroscopies / Friederike C Jentoft -- Photoluminescence Spectroscopy / Masaya Matsuoka, Masakazu Saito, Masakazu Anpo -- Neutron Scattering / Herv̌ Jobic -- Sum Frequency Generation and Infrared Reflection Absorption Spectroscopy / Karin Ft̲tinger, Christian Weilach, Gunther Rupprechter -- Infra Red Reflection Absorption Spectroscopy and Polarisation Modulation-IRRAS / Christophe M̌thivier, Claire-Marie Pradier -- Nuclear Magnetic Resonance Spectroscopy / Lynn F Gladden, Michal Lutecki, James McGregor -- Electron Paramagnetic Resonance Spectroscopy / Piotr Pietrzyk, Zbigniew Sojka, Elio Giamello -- Ms̲sbauer Spectroscopy / Lorenzo Stievano, Friedrich E Wagner -- Low Energy Ion Scattering and Secondary Ion Mass Spectrometry / Norbert Kruse, Sergey Chenakin -- X-Ray Absorption Spectroscopy / Christophe Geantet, Christophe Pichon -- Auger Electron, X ray and UV Photoelectron Spectroscopies / Wolfgang Grunert -- Single Molecule Spectroscopy / Timo Lebold, Jens Michaelis, Thomas Bein, Christoph Br̃uchle -- Macroscopic Techniques. X-Ray Diffraction and Small Angle X-Ray Scattering / Malte Behrens, Robert Schlg̲l -- Transmission Electron Microscopy / John Meurig Thomas, Caterina Ducati -- Scanning Probe Microscopy and Spectroscopy / Tomoaki Nishino -- Thermal Methods / Adrien Mekki-Berrada, Aline Auroux -- Surface Area/Porosity, Adsorption, Diffusion / Philip L Llewellyn, Emily Bloch, Sandrine Bourrelly -- Characterization of the Fluid Phase (Gas and/or Liquid). Mass Spectrometry / Sandra Alves, Jean-Claude Tabet -- Chromatographic Methods / Fabrice Bertoncini, Didier Thiebaut, Marion Courtiade, Thomas Dutriez -- Transient Techniques: Temporal Analysis of Products and Steady State Isotopic Transient Kinetic Analysis / Angelos M Efstathiou, John T Gleaves, Gregory S Yablonsky -- Advanced Characterization. Techniques Coupling for Catalyst Characterisation / Andrew M Beale, Matthew G O'Brien, Bert M Weckhuysen -- Quantum Chemistry Methods / Philippe Sautet -- Conclusions -- Index. |
| Record Nr. | UNINA-9910137629003321 |
| Weinheim, : Wiley-VCH, c2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Characterization of solid materials and heterogeneous catalysts [[electronic resource] ] : from structure to surface reactivity / / edited by Michel Che and Jacques C. Védrine
| Characterization of solid materials and heterogeneous catalysts [[electronic resource] ] : from structure to surface reactivity / / edited by Michel Che and Jacques C. Védrine |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2012 |
| Descrizione fisica | 1 online resource (1257 p.) |
| Disciplina | 660.2995 |
| Altri autori (Persone) |
CheM (Michel)
VédrineJacques C |
| Soggetto topico |
Catalysts - Analysis
Heterogeneous catalysis Solid state chemistry |
| ISBN |
1-299-46436-X
3-527-64534-9 3-527-64533-0 3-527-64532-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front Matter -- Molecular/Local Spectroscopies. Infrared Spectroscopy / Fřďric Thibault-Starzyk, Fraṅoise Mauǧ -- Raman and UV-Raman Spectroscopies / Fengtao Fan, Zhaochi Feng, Can Li -- Electronic Spectroscopy: Ultra Violet-Visible and near IR Spectroscopies / Friederike C Jentoft -- Photoluminescence Spectroscopy / Masaya Matsuoka, Masakazu Saito, Masakazu Anpo -- Neutron Scattering / Herv̌ Jobic -- Sum Frequency Generation and Infrared Reflection Absorption Spectroscopy / Karin Ft̲tinger, Christian Weilach, Gunther Rupprechter -- Infra Red Reflection Absorption Spectroscopy and Polarisation Modulation-IRRAS / Christophe M̌thivier, Claire-Marie Pradier -- Nuclear Magnetic Resonance Spectroscopy / Lynn F Gladden, Michal Lutecki, James McGregor -- Electron Paramagnetic Resonance Spectroscopy / Piotr Pietrzyk, Zbigniew Sojka, Elio Giamello -- Ms̲sbauer Spectroscopy / Lorenzo Stievano, Friedrich E Wagner -- Low Energy Ion Scattering and Secondary Ion Mass Spectrometry / Norbert Kruse, Sergey Chenakin -- X-Ray Absorption Spectroscopy / Christophe Geantet, Christophe Pichon -- Auger Electron, X ray and UV Photoelectron Spectroscopies / Wolfgang Grunert -- Single Molecule Spectroscopy / Timo Lebold, Jens Michaelis, Thomas Bein, Christoph Br̃uchle -- Macroscopic Techniques. X-Ray Diffraction and Small Angle X-Ray Scattering / Malte Behrens, Robert Schlg̲l -- Transmission Electron Microscopy / John Meurig Thomas, Caterina Ducati -- Scanning Probe Microscopy and Spectroscopy / Tomoaki Nishino -- Thermal Methods / Adrien Mekki-Berrada, Aline Auroux -- Surface Area/Porosity, Adsorption, Diffusion / Philip L Llewellyn, Emily Bloch, Sandrine Bourrelly -- Characterization of the Fluid Phase (Gas and/or Liquid). Mass Spectrometry / Sandra Alves, Jean-Claude Tabet -- Chromatographic Methods / Fabrice Bertoncini, Didier Thiebaut, Marion Courtiade, Thomas Dutriez -- Transient Techniques: Temporal Analysis of Products and Steady State Isotopic Transient Kinetic Analysis / Angelos M Efstathiou, John T Gleaves, Gregory S Yablonsky -- Advanced Characterization. Techniques Coupling for Catalyst Characterisation / Andrew M Beale, Matthew G O'Brien, Bert M Weckhuysen -- Quantum Chemistry Methods / Philippe Sautet -- Conclusions -- Index. |
| Record Nr. | UNINA-9910830488203321 |
| Weinheim, : Wiley-VCH, c2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Design and applications of hydroxyapatite-based catalysts / / edited by Doan Pham Minh
| Design and applications of hydroxyapatite-based catalysts / / edited by Doan Pham Minh |
| Pubbl/distr/stampa | Weinheim, Germany : , : Wiley-VCH, , [2022] |
| Descrizione fisica | 1 online resource (570 pages) |
| Disciplina | 660.2995 |
| Soggetto topico |
Catalysts - Analysis
Hydroxyapatite Hydroxyapatite coating |
| ISBN |
3-527-83019-7
3-527-83018-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910580256203321 |
| Weinheim, Germany : , : Wiley-VCH, , [2022] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Design and applications of hydroxyapatite-based catalysts / / edited by Doan Pham Minh
| Design and applications of hydroxyapatite-based catalysts / / edited by Doan Pham Minh |
| Pubbl/distr/stampa | Weinheim, Germany : , : Wiley-VCH, , 2022 |
| Descrizione fisica | 1 online resource (570 pages) |
| Disciplina | 660.2995 |
| Soggetto topico |
Catalysts - Analysis
Hydroxyapatite Hydroxyapatite coating |
| ISBN |
3-527-83019-7
3-527-83018-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910830296603321 |
| Weinheim, Germany : , : Wiley-VCH, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Spectroscopy in catalysis [[electronic resource] ] : an introduction / / J.W. Niemantsverdriet
| Spectroscopy in catalysis [[electronic resource] ] : an introduction / / J.W. Niemantsverdriet |
| Autore | Niemantsverdriet J. W |
| Edizione | [3rd completely rev. and enl. ed.] |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH |
| Descrizione fisica | 1 online resource (346 p.) |
| Disciplina |
541.395
543.0858 |
| Soggetto topico |
Catalysis
Spectrum analysis Catalysts - Analysis |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-08797-1
1-282-11840-4 9786612118401 9786611087975 3-527-61134-7 3-527-61135-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Spectroscopy in Catalysis; Contents; Preface; List of Acronyms; 1 Introduction; 1.1 Heterogeneous Catalysis; 1.2 The Aim of Catalyst Characterization; 1.3 Spectroscopic Techniques; 1.4 Research Strategies; References; 2 Temperature-Programmed Techniques; 2.1 Introduction; 2.2 Temperature-Programmed Reduction; 2.2.1 Thermodynamics of Reduction; 2.2.2 Reduction Mechanisms; 2.2.3 Applications; 2.3 Temperature-Programmed Sulfidation; 2.4 Temperature-Programmed Reaction Spectroscopy; 2.5 Temperature-Programmed Desorption; 2.5.1 TPD Analysis; 2.5.2 Desorption in the Transition State Theory
2.6 Temperature-Programmed Reaction Spectroscopy in UHVReferences; 3 Photoemission and Auger Spectroscopy; 3.1 Introduction; 3.2 X-Ray Photoelectron Spectroscopy (XPS); 3.2.1 XPS Intensities and Sample Composition; 3.2.2 XPS Binding Energies and Oxidation States; 3.2.3 Shake Up, Shake Off, Multiplet Splitting and Plasmon Excitations; 3.2.4 Experimental Aspects of XPS; 3.2.5 Charging and Sample Damage; 3.2.6 Dispersion of Supported Particles from XPS; 3.2.7 Angle-Dependent XPS; 3.2.8 In-Situ and Real Time XPS Studies; 3.3 Ultraviolet Photoelectron Spectroscopy (UPS) 3.3.1 Photoemission of Adsorbed Xenon3.4 Auger Electron Spectroscopy; 3.4.1 Energy of Auger Peaks; 3.4.2 Intensity of Auger Peaks; 3.4.3 Application of AES in Catalytic Surface Science; 3.4.4 Scanning Auger Spectroscopy; 3.4.5 Depth-Sensitive Information from AES; References; 4 The Ion Spectroscopies; 4.1 Introduction; 4.2 Secondary Ion Mass Spectrometry (SIMS); 4.2.1 Theory of SIMS; 4.2.2 Electron and Photon Emission under Ion Bombardment; 4.2.3 Energy Distribution of Secondary Ions; 4.2.4 The Ionization Probability; 4.2.5 Emission of Molecular Clusters; 4.2.6 Conditions for Static SIMS 4.2.7 Charging of Insulating Samples4.2.8 Applications on Catalysts; 4.2.9 Model Catalysts; 4.2.10 Single Crystal Studies; 4.2.11 Concluding Remarks; 4.3 Secondary Neutral Mass Spectrometry (SNMS); 4.4 Ion Scattering: The Collision Process; 4.5 Rutherford Backscattering Spectrometry (RBS); 4.6 Low-Energy Ion Scattering (LEIS); 4.6.1 Neutralization; 4.6.2 Applications of LEIS in Catalysis; References; 5 Mössbauer Spectroscopy; 5.1 Introduction; 5.2 The Mössbauer Effect; 5.3 Mössbauer Spectroscopy; 5.3.1 Isomer Shift; 5.3.2 Electric Quadrupole Splitting; 5.3.3 Magnetic Hyperfine Splitting 5.3.4 Intensity5.4 Mössbauer Spectroscopy in Catalyst Characterization; 5.4.1 In-Situ Mössbauer Spectroscopy at Cryogenic Temperatures; 5.4.2 Particle Size Determination; 5.4.3 Kinetics of Solid-State Reactions from Single Velocity Experiments; 5.4.4 In-Situ Mössbauer Spectroscopy Under Reaction Conditions; 5.4.5 Mössbauer Spectroscopy of Elements Other Than Iron; 5.5 Conclusion; References; 6 Diffraction and Extended X-Ray Absorption Fine Structure (EXAFS); 6.1 Introduction; 6.2 X-Ray Diffraction; 6.2.1 In-Situ XRD: Kinetics of Solid-State Reactions; 6.2.2 Concluding Remarks 6.3 Low-Energy Electron Diffraction (LEED) |
| Record Nr. | UNINA-9910144333703321 |
Niemantsverdriet J. W
|
||
| Weinheim, : Wiley-VCH | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Spectroscopy in catalysis [[electronic resource] ] : an introduction / / J.W. Niemantsverdriet
| Spectroscopy in catalysis [[electronic resource] ] : an introduction / / J.W. Niemantsverdriet |
| Autore | Niemantsverdriet J. W |
| Edizione | [3rd completely rev. and enl. ed.] |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH |
| Descrizione fisica | 1 online resource (346 p.) |
| Disciplina |
541.395
543.0858 |
| Soggetto topico |
Catalysis
Spectrum analysis Catalysts - Analysis |
| ISBN |
1-281-08797-1
1-282-11840-4 9786612118401 9786611087975 3-527-61134-7 3-527-61135-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Spectroscopy in Catalysis; Contents; Preface; List of Acronyms; 1 Introduction; 1.1 Heterogeneous Catalysis; 1.2 The Aim of Catalyst Characterization; 1.3 Spectroscopic Techniques; 1.4 Research Strategies; References; 2 Temperature-Programmed Techniques; 2.1 Introduction; 2.2 Temperature-Programmed Reduction; 2.2.1 Thermodynamics of Reduction; 2.2.2 Reduction Mechanisms; 2.2.3 Applications; 2.3 Temperature-Programmed Sulfidation; 2.4 Temperature-Programmed Reaction Spectroscopy; 2.5 Temperature-Programmed Desorption; 2.5.1 TPD Analysis; 2.5.2 Desorption in the Transition State Theory
2.6 Temperature-Programmed Reaction Spectroscopy in UHVReferences; 3 Photoemission and Auger Spectroscopy; 3.1 Introduction; 3.2 X-Ray Photoelectron Spectroscopy (XPS); 3.2.1 XPS Intensities and Sample Composition; 3.2.2 XPS Binding Energies and Oxidation States; 3.2.3 Shake Up, Shake Off, Multiplet Splitting and Plasmon Excitations; 3.2.4 Experimental Aspects of XPS; 3.2.5 Charging and Sample Damage; 3.2.6 Dispersion of Supported Particles from XPS; 3.2.7 Angle-Dependent XPS; 3.2.8 In-Situ and Real Time XPS Studies; 3.3 Ultraviolet Photoelectron Spectroscopy (UPS) 3.3.1 Photoemission of Adsorbed Xenon3.4 Auger Electron Spectroscopy; 3.4.1 Energy of Auger Peaks; 3.4.2 Intensity of Auger Peaks; 3.4.3 Application of AES in Catalytic Surface Science; 3.4.4 Scanning Auger Spectroscopy; 3.4.5 Depth-Sensitive Information from AES; References; 4 The Ion Spectroscopies; 4.1 Introduction; 4.2 Secondary Ion Mass Spectrometry (SIMS); 4.2.1 Theory of SIMS; 4.2.2 Electron and Photon Emission under Ion Bombardment; 4.2.3 Energy Distribution of Secondary Ions; 4.2.4 The Ionization Probability; 4.2.5 Emission of Molecular Clusters; 4.2.6 Conditions for Static SIMS 4.2.7 Charging of Insulating Samples4.2.8 Applications on Catalysts; 4.2.9 Model Catalysts; 4.2.10 Single Crystal Studies; 4.2.11 Concluding Remarks; 4.3 Secondary Neutral Mass Spectrometry (SNMS); 4.4 Ion Scattering: The Collision Process; 4.5 Rutherford Backscattering Spectrometry (RBS); 4.6 Low-Energy Ion Scattering (LEIS); 4.6.1 Neutralization; 4.6.2 Applications of LEIS in Catalysis; References; 5 Mössbauer Spectroscopy; 5.1 Introduction; 5.2 The Mössbauer Effect; 5.3 Mössbauer Spectroscopy; 5.3.1 Isomer Shift; 5.3.2 Electric Quadrupole Splitting; 5.3.3 Magnetic Hyperfine Splitting 5.3.4 Intensity5.4 Mössbauer Spectroscopy in Catalyst Characterization; 5.4.1 In-Situ Mössbauer Spectroscopy at Cryogenic Temperatures; 5.4.2 Particle Size Determination; 5.4.3 Kinetics of Solid-State Reactions from Single Velocity Experiments; 5.4.4 In-Situ Mössbauer Spectroscopy Under Reaction Conditions; 5.4.5 Mössbauer Spectroscopy of Elements Other Than Iron; 5.5 Conclusion; References; 6 Diffraction and Extended X-Ray Absorption Fine Structure (EXAFS); 6.1 Introduction; 6.2 X-Ray Diffraction; 6.2.1 In-Situ XRD: Kinetics of Solid-State Reactions; 6.2.2 Concluding Remarks 6.3 Low-Energy Electron Diffraction (LEED) |
| Record Nr. | UNINA-9910830476703321 |
|
Niemantsverdriet J. W
|
||
| Weinheim, : Wiley-VCH | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
