1998 IEEE Autotestcon proceedings : [Autotestcon '98] : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : [24-27 August, 1998, Salt Lake City, Utah]
| 1998 IEEE Autotestcon proceedings : [Autotestcon '98] : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : [24-27 August, 1998, Salt Lake City, Utah] |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 1998 |
| Disciplina | 670.42/5 |
| Soggetto topico |
Systems engineering - Testing
Automatic test equipment - Testing Avionics - Testing Military supplies Motor vehicles Mechanical Engineering Mechanical Engineering - General Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212597603316 |
| [Place of publication not identified], : IEEE, 1998 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1998 IEEE Autotestcon proceedings : [Autotestcon '98] : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : [24-27 August, 1998, Salt Lake City, Utah]
| 1998 IEEE Autotestcon proceedings : [Autotestcon '98] : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : [24-27 August, 1998, Salt Lake City, Utah] |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 1998 |
| Disciplina | 670.42/5 |
| Soggetto topico |
Systems engineering - Testing
Automatic test equipment - Testing Avionics - Testing Military supplies Motor vehicles Mechanical Engineering Mechanical Engineering - General Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872826503321 |
| [Place of publication not identified], : IEEE, 1998 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
| The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1990 |
| Disciplina | 621.381/5 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Automatic test equipment - Testing Semiconductors Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211380203316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1990 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
| The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1990 |
| Disciplina | 621.381/5 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Automatic test equipment - Testing Semiconductors Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872638003321 |
| [Place of publication not identified], : IEEE Computer Society Press, 1990 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||