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MARC Lista (tabellare)
Amplitude modulation atomic force microscopy / / Ricardo Garcia
Amplitude modulation atomic force microscopy / / Ricardo Garcia
Autore Garcia Arrojo Ricardo
Pubbl/distr/stampa Weinheim, Germany, : Wiley-VCH, 2010
Descrizione fisica 1 online resource (195 p.)
Disciplina 502.82
Soggetto topico Atomic force microscopy
Amplitude modulation
ISBN 3-527-64394-X
1-282-78390-4
9786612783906
3-527-63218-2
3-527-63219-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Amplitude Modulation Atomic Force Microscopy; Contents; Preface; Annotation List; 1 Introduction; 2 Instrumental and Conceptual Aspects; 3 Tip-Surface Interaction Forces; 4 Theory of Amplitude Modulation AFM; 5 Advanced Theory of Amplitude Modulation AFM; 6 Amplitude Modulation AFM in Liquid; 7 Phase Imaging Atomic Force Microscopy; 8 Resolution, Noise, and Sensitivity; 9 Multifrequency Atomic Force Microscopy; 10 Beyond Topographic Imaging; References; Index
Record Nr. UNINA-9910876716103321
Garcia Arrojo Ricardo  
Weinheim, Germany, : Wiley-VCH, 2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Amplitude modulation atomic force microscopy [[electronic resource] /] / Ricardo Garcia
Amplitude modulation atomic force microscopy [[electronic resource] /] / Ricardo Garcia
Autore García Arrojo Ricardo
Pubbl/distr/stampa Weinheim, Germany, : Wiley-VCH, 2010
Descrizione fisica 1 online resource (195 p.)
Disciplina 502.82
Soggetto topico Atomic force microscopy
Amplitude modulation
Soggetto genere / forma Electronic books.
ISBN 3-527-64394-X
1-282-78390-4
9786612783906
3-527-63218-2
3-527-63219-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Amplitude Modulation Atomic Force Microscopy; Contents; Preface; Annotation List; 1 Introduction; 2 Instrumental and Conceptual Aspects; 3 Tip-Surface Interaction Forces; 4 Theory of Amplitude Modulation AFM; 5 Advanced Theory of Amplitude Modulation AFM; 6 Amplitude Modulation AFM in Liquid; 7 Phase Imaging Atomic Force Microscopy; 8 Resolution, Noise, and Sensitivity; 9 Multifrequency Atomic Force Microscopy; 10 Beyond Topographic Imaging; References; Index
Record Nr. UNINA-9910140765603321
García Arrojo Ricardo  
Weinheim, Germany, : Wiley-VCH, 2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Amplitude modulation atomic force microscopy [[electronic resource] /] / Ricardo Garcia
Amplitude modulation atomic force microscopy [[electronic resource] /] / Ricardo Garcia
Autore García Arrojo Ricardo
Pubbl/distr/stampa Weinheim, Germany, : Wiley-VCH, 2010
Descrizione fisica 1 online resource (195 p.)
Disciplina 502.82
Soggetto topico Atomic force microscopy
Amplitude modulation
ISBN 3-527-64394-X
1-282-78390-4
9786612783906
3-527-63218-2
3-527-63219-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Amplitude Modulation Atomic Force Microscopy; Contents; Preface; Annotation List; 1 Introduction; 2 Instrumental and Conceptual Aspects; 3 Tip-Surface Interaction Forces; 4 Theory of Amplitude Modulation AFM; 5 Advanced Theory of Amplitude Modulation AFM; 6 Amplitude Modulation AFM in Liquid; 7 Phase Imaging Atomic Force Microscopy; 8 Resolution, Noise, and Sensitivity; 9 Multifrequency Atomic Force Microscopy; 10 Beyond Topographic Imaging; References; Index
Record Nr. UNINA-9910830112903321
García Arrojo Ricardo  
Weinheim, Germany, : Wiley-VCH, 2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Atomic force microscopy [[electronic resource] ] : understanding basic modes and advanced applications / / Greg Haugstad
Atomic force microscopy [[electronic resource] ] : understanding basic modes and advanced applications / / Greg Haugstad
Autore Haugstad Greg <1963->
Pubbl/distr/stampa Hoboken, N.J., : John Wiley & Sons, c2012
Descrizione fisica 1 online resource (488 p.)
Disciplina 620/.5
Soggetto topico Atomic force microscopy
Scanning proble microscopy
ISBN 1-283-64602-1
1-118-36069-9
1-118-36068-0
1-118-36066-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications; Contents; Preface; Acknowledgments; 1. Overview of AFM; 1.1. The Essence of the Technique; 1.2. Property Sensitive Imaging: Vertical Touching and Sliding Friction; 1.3. Modifying a Surface with a Tip; 1.4. Dynamic (or "AC" or "Tapping") Modes: Delicate Imaging with Property Sensitivity; 1.5. Force Curves Plus Mapping in Liquid; 1.6. Rate, Temperature, and Humidity-Dependent Characterization; 1.7. Long-Range Force Imaging Modes; 1.8. Pedagogy of Chapters; References; 2. Distance-Dependent Interactions
2.1. General Analogies and Types of Forces2.2. Van der Waals and Electrostatic Forces in a Tip-Sample System; 2.2.1. Dipole-Dipole Forces; 2.2.2. Electrostatic Forces; 2.3. Contact Forces and Mechanical Compliance; 2.4. Dynamic Probing of Distance-Dependent Forces; 2.4.1. Importance of Force Gradient; 2.4.2. Damped, Driven Oscillator: Concepts and Mathematics; 2.4.3. Effect of Tip-Sample Interaction on Oscillator; 2.4.4. Energy Dissipation in Tip-Sample Interaction; 2.5. Other Distance-Dependent Attraction and Repulsion: Electrostatic and Molecular Forces in Air and Liquids
2.5.1. Electrostatic Forces in Liquids: Superimposed on Van der Waals Forces2.5.2. Molecular-Structure Forces in Liquids; 2.5.3. Macromolecular Steric Forces in Liquids; 2.5.4. Derjaguin Approximation: Colloid Probe AFM; 2.5.5. Macromolecular Extension Forces (Air and Liquid Media); 2.6. Rate/Time Effects; 2.6.1. Viscoelasticity; 2.6.2. Stress-Modified Thermal Activation; 2.6.3. Relevance to Other Topics of Chapter 2; References; 3. Z-Dependent Force Measurements with AFM; 3.1. Revisit Ideal Concept; 3.2. Force-Z Measurement Components: Tip/Cantilever/Laser/Photodetector/Z Scanner
3.2.1. Basic Concepts and Interrelationships3.2.2. Tip-Sample Distance; 3.2.3. Finer Quantitative Issues in Force-Distance Measurements; 3.3. Physical Hysteresis; 3.4. Optical Artifacts; 3.5. Z Scanner/Sensor Hardware: Nonidealities; 3.6. Additional Force-Curve Analysis Examples; 3.6.1. Glassy Polymer, Rigid Cantilever; 3.6.2. Gels, Soft Cantilever; 3.6.3. Molecular-Chain Bridging Adhesion; 3.6.4. Bias-Dependent Electrostatic Forces in Air; 3.6.5. Screened Electrostatic Forces in Aqueous Medium; 3.7. Cantilever Spring Constant Calibration; References; 4. Topographic Imaging
4.1. Idealized Concepts4.2. The Real World; 4.2.1. The Basics: Block Descriptions of AFM Hardware; 4.2.2. The Nature of the Collected Data; 4.2.3. Choosing Setpoint: Effects on Tip-Sample Interaction and Thereby on Images; 4.2.4. Finite Response of Feedback Control System; 4.2.5. Realities of Piezoscanners: Use of Closed-Loop Scanning; 4.2.6. Shape of Tip and Surface; 4.2.7. Other Realities and Operational Difficulties-Variable Background, Drift, Experimental Geometry; References; 5. Probing Material Properties I: Phase Imaging
5.1. Phase Measurement as a Diagnostic of Interaction Regime and Bistability
Record Nr. UNINA-9910137615403321
Haugstad Greg <1963->  
Hoboken, N.J., : John Wiley & Sons, c2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Atomic force microscopy : understanding basic modes and advanced applications / / Greg Haugstad
Atomic force microscopy : understanding basic modes and advanced applications / / Greg Haugstad
Autore Haugstad Greg <1963->
Edizione [1st ed.]
Pubbl/distr/stampa Hoboken, N.J., : John Wiley & Sons, c2012
Descrizione fisica 1 online resource (488 p.)
Disciplina 620/.5
Soggetto topico Atomic force microscopy
Scanning proble microscopy
ISBN 1-283-64602-1
1-118-36069-9
1-118-36068-0
1-118-36066-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications; Contents; Preface; Acknowledgments; 1. Overview of AFM; 1.1. The Essence of the Technique; 1.2. Property Sensitive Imaging: Vertical Touching and Sliding Friction; 1.3. Modifying a Surface with a Tip; 1.4. Dynamic (or "AC" or "Tapping") Modes: Delicate Imaging with Property Sensitivity; 1.5. Force Curves Plus Mapping in Liquid; 1.6. Rate, Temperature, and Humidity-Dependent Characterization; 1.7. Long-Range Force Imaging Modes; 1.8. Pedagogy of Chapters; References; 2. Distance-Dependent Interactions
2.1. General Analogies and Types of Forces2.2. Van der Waals and Electrostatic Forces in a Tip-Sample System; 2.2.1. Dipole-Dipole Forces; 2.2.2. Electrostatic Forces; 2.3. Contact Forces and Mechanical Compliance; 2.4. Dynamic Probing of Distance-Dependent Forces; 2.4.1. Importance of Force Gradient; 2.4.2. Damped, Driven Oscillator: Concepts and Mathematics; 2.4.3. Effect of Tip-Sample Interaction on Oscillator; 2.4.4. Energy Dissipation in Tip-Sample Interaction; 2.5. Other Distance-Dependent Attraction and Repulsion: Electrostatic and Molecular Forces in Air and Liquids
2.5.1. Electrostatic Forces in Liquids: Superimposed on Van der Waals Forces2.5.2. Molecular-Structure Forces in Liquids; 2.5.3. Macromolecular Steric Forces in Liquids; 2.5.4. Derjaguin Approximation: Colloid Probe AFM; 2.5.5. Macromolecular Extension Forces (Air and Liquid Media); 2.6. Rate/Time Effects; 2.6.1. Viscoelasticity; 2.6.2. Stress-Modified Thermal Activation; 2.6.3. Relevance to Other Topics of Chapter 2; References; 3. Z-Dependent Force Measurements with AFM; 3.1. Revisit Ideal Concept; 3.2. Force-Z Measurement Components: Tip/Cantilever/Laser/Photodetector/Z Scanner
3.2.1. Basic Concepts and Interrelationships3.2.2. Tip-Sample Distance; 3.2.3. Finer Quantitative Issues in Force-Distance Measurements; 3.3. Physical Hysteresis; 3.4. Optical Artifacts; 3.5. Z Scanner/Sensor Hardware: Nonidealities; 3.6. Additional Force-Curve Analysis Examples; 3.6.1. Glassy Polymer, Rigid Cantilever; 3.6.2. Gels, Soft Cantilever; 3.6.3. Molecular-Chain Bridging Adhesion; 3.6.4. Bias-Dependent Electrostatic Forces in Air; 3.6.5. Screened Electrostatic Forces in Aqueous Medium; 3.7. Cantilever Spring Constant Calibration; References; 4. Topographic Imaging
4.1. Idealized Concepts4.2. The Real World; 4.2.1. The Basics: Block Descriptions of AFM Hardware; 4.2.2. The Nature of the Collected Data; 4.2.3. Choosing Setpoint: Effects on Tip-Sample Interaction and Thereby on Images; 4.2.4. Finite Response of Feedback Control System; 4.2.5. Realities of Piezoscanners: Use of Closed-Loop Scanning; 4.2.6. Shape of Tip and Surface; 4.2.7. Other Realities and Operational Difficulties-Variable Background, Drift, Experimental Geometry; References; 5. Probing Material Properties I: Phase Imaging
5.1. Phase Measurement as a Diagnostic of Interaction Regime and Bistability
Record Nr. UNINA-9910814242903321
Haugstad Greg <1963->  
Hoboken, N.J., : John Wiley & Sons, c2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Autore Morris V. J
Edizione [2nd ed.]
Pubbl/distr/stampa London, : Imperial College Press, c2010
Descrizione fisica 1 online resource (423 p.)
Disciplina 570.282
Altri autori (Persone) KirbyA. R
GunningA. P
Soggetto topico Atomic force microscopy
Biology - Technique
Soggetto genere / forma Electronic books.
ISBN 1-282-76003-3
9786612760037
1-84816-468-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; Acknowledgements; CHAPTER 1 AN INTRODUCTION; CHAPTER 2 APPARATUS; 2.1. The atomic force microscope; 2.2. Piezoelectric scanners; 2.3. Probes and cantilevers; 2.3.1. Cantilever geometry; 2.3.2. Tip shape; 2.3.3. Tip functionality; 2.4. Sample holders; 2.4.1. Liquid cells; 2.5. Detection methods; 2.5.1. Optical detectors: laser beam deflection; 2.5.2. Optical detectors: interferometry; 2.5.3. Electrical detectors: electron tunneling; 2.5.4. Electrical detectors: capacitance; 2.5.5. Electrical detectors: piezoelectric cantilevers; 2.6. Control systems; 2.6.1. AFM electronics
2.6.2. Operation of the electronics 2.6.3. Feedback control loops; 2.6.4. Design limitations; 2.6.5. Enhancing the performance of large scanners; 2.7. Vibration isolation: thermal and mechanical; 2.8. Calibration; 2.8.1. Piezoelectric scanner non-linearity; 2.8.2. Tip related factors: convolution; 2.8.3. Calibration standards; 2.8.4. Tips for scanning a calibration specimen; 2.9. Integrated AFMs; 2.9.1. Combined AFM-light microscope (AFM-LM); 2.9.2. 'Submarine' AFM - the combined AFM - Langmuir Trough; 2.9.3. Combined AFM-surface plasmon resonance (AFM-SPR); 2.9.4. Cryo-AFM; References
Useful information sources CHAPTER 3 BASIC PRINCIPLES; 3.1. Forces; 3.1.1. The Van der Waals force and force-distance curves; 3.1.2. The electrostatic force; 3.1.3. Capillary and adhesive forces; 3.1.4. Double layer forces; 3.2. Imaging modes; 3.2.1. Contact dc mode; 3.2.2. Ac modes: Tapping and non-contact; Tapping in air; Tapping under liquid; True, non-contact ac mode; Tuning the cantilever; Influence of drive frequency; 3.2.3. Deflection mode; 3.3. Image types; 3.3.1. Topography; 3.3.2. Frictional force; 3.3.3. Phase; 3.4. Substrates; 3.4.1. Mica; 3.4.2. Glass; 3.4.3. Graphite
3.5. Common problems 3.5.1. Thermal drift; 3.5.2. Multiple tip effects; 3.5.3. The 'pool' artifact; 3.5.4. Optical interference on highly reflective samples; 3.5.5. Sample roughness; 3.5.6. Sample mobility; 3.5.7. Imaging under liquid; 3.6. Getting started; 3.6.1. DNA; 3.6.2. Troublesome large samples; 3.7. Image optimisation; 3.7.1. Grey levels and colour tables; 3.7.2. Brightness and contrast; 3.7.3. High and low pass filtering; 3.7.4. Normalisation and plane fitting; 3.7.5. Despike; 3.7.6. Fourier filtering; 3.7.7. Correlation averaging; 3.7.8. Stereographs and anaglyphs
3.7.9. Do your homework! References; CHAPTER 4 MACROMOLECULES; 4.1. Imaging methods; 4.1.1. Tip adhesion, molecular damage and displacement; 4.1.2. Depositing macromolecules onto substrates; 4.1.3. Metal coated samples; 4.1.4. Imaging in air; 4.1.5. Imaging under non-aqueous liquids; 4.1.6. Binding molecules to the substrate; 4.1.7. Imaging under water or buffers; 4.2. Nucleic acids: DNA; 4.2.1. Imaging DNA; 4.2.2. DNA conformation, size and shape; 4.2.3. DNA-protein interactions; 4.2.4. Location and mapping of specific sites; 4.2.5. Chromosomes; 4.3. Nucleic acids: RNA; 4.4. Polysaccharides
4.4.1. Imaging polysaccharides
Record Nr. UNINA-9910455871203321
Morris V. J  
London, : Imperial College Press, c2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Autore Morris V. J
Edizione [2nd ed.]
Pubbl/distr/stampa London, : Imperial College Press, c2010
Descrizione fisica 1 online resource (423 p.)
Disciplina 570.282
Altri autori (Persone) KirbyA. R
GunningA. P
Soggetto topico Atomic force microscopy
Biology - Technique
ISBN 1-282-76003-3
9786612760037
1-84816-468-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; Acknowledgements; CHAPTER 1 AN INTRODUCTION; CHAPTER 2 APPARATUS; 2.1. The atomic force microscope; 2.2. Piezoelectric scanners; 2.3. Probes and cantilevers; 2.3.1. Cantilever geometry; 2.3.2. Tip shape; 2.3.3. Tip functionality; 2.4. Sample holders; 2.4.1. Liquid cells; 2.5. Detection methods; 2.5.1. Optical detectors: laser beam deflection; 2.5.2. Optical detectors: interferometry; 2.5.3. Electrical detectors: electron tunneling; 2.5.4. Electrical detectors: capacitance; 2.5.5. Electrical detectors: piezoelectric cantilevers; 2.6. Control systems; 2.6.1. AFM electronics
2.6.2. Operation of the electronics 2.6.3. Feedback control loops; 2.6.4. Design limitations; 2.6.5. Enhancing the performance of large scanners; 2.7. Vibration isolation: thermal and mechanical; 2.8. Calibration; 2.8.1. Piezoelectric scanner non-linearity; 2.8.2. Tip related factors: convolution; 2.8.3. Calibration standards; 2.8.4. Tips for scanning a calibration specimen; 2.9. Integrated AFMs; 2.9.1. Combined AFM-light microscope (AFM-LM); 2.9.2. 'Submarine' AFM - the combined AFM - Langmuir Trough; 2.9.3. Combined AFM-surface plasmon resonance (AFM-SPR); 2.9.4. Cryo-AFM; References
Useful information sources CHAPTER 3 BASIC PRINCIPLES; 3.1. Forces; 3.1.1. The Van der Waals force and force-distance curves; 3.1.2. The electrostatic force; 3.1.3. Capillary and adhesive forces; 3.1.4. Double layer forces; 3.2. Imaging modes; 3.2.1. Contact dc mode; 3.2.2. Ac modes: Tapping and non-contact; Tapping in air; Tapping under liquid; True, non-contact ac mode; Tuning the cantilever; Influence of drive frequency; 3.2.3. Deflection mode; 3.3. Image types; 3.3.1. Topography; 3.3.2. Frictional force; 3.3.3. Phase; 3.4. Substrates; 3.4.1. Mica; 3.4.2. Glass; 3.4.3. Graphite
3.5. Common problems 3.5.1. Thermal drift; 3.5.2. Multiple tip effects; 3.5.3. The 'pool' artifact; 3.5.4. Optical interference on highly reflective samples; 3.5.5. Sample roughness; 3.5.6. Sample mobility; 3.5.7. Imaging under liquid; 3.6. Getting started; 3.6.1. DNA; 3.6.2. Troublesome large samples; 3.7. Image optimisation; 3.7.1. Grey levels and colour tables; 3.7.2. Brightness and contrast; 3.7.3. High and low pass filtering; 3.7.4. Normalisation and plane fitting; 3.7.5. Despike; 3.7.6. Fourier filtering; 3.7.7. Correlation averaging; 3.7.8. Stereographs and anaglyphs
3.7.9. Do your homework! References; CHAPTER 4 MACROMOLECULES; 4.1. Imaging methods; 4.1.1. Tip adhesion, molecular damage and displacement; 4.1.2. Depositing macromolecules onto substrates; 4.1.3. Metal coated samples; 4.1.4. Imaging in air; 4.1.5. Imaging under non-aqueous liquids; 4.1.6. Binding molecules to the substrate; 4.1.7. Imaging under water or buffers; 4.2. Nucleic acids: DNA; 4.2.1. Imaging DNA; 4.2.2. DNA conformation, size and shape; 4.2.3. DNA-protein interactions; 4.2.4. Location and mapping of specific sites; 4.2.5. Chromosomes; 4.3. Nucleic acids: RNA; 4.4. Polysaccharides
4.4.1. Imaging polysaccharides
Record Nr. UNINA-9910780725303321
Morris V. J  
London, : Imperial College Press, c2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Atomic force microscopy for biologists / / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Atomic force microscopy for biologists / / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Autore Morris V. J
Edizione [2nd ed.]
Pubbl/distr/stampa London, : Imperial College Press, c2010
Descrizione fisica 1 online resource (423 p.)
Disciplina 570.282
Altri autori (Persone) KirbyA. R
GunningA. P
Soggetto topico Atomic force microscopy
Biology - Technique
ISBN 1-282-76003-3
9786612760037
1-84816-468-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; Acknowledgements; CHAPTER 1 AN INTRODUCTION; CHAPTER 2 APPARATUS; 2.1. The atomic force microscope; 2.2. Piezoelectric scanners; 2.3. Probes and cantilevers; 2.3.1. Cantilever geometry; 2.3.2. Tip shape; 2.3.3. Tip functionality; 2.4. Sample holders; 2.4.1. Liquid cells; 2.5. Detection methods; 2.5.1. Optical detectors: laser beam deflection; 2.5.2. Optical detectors: interferometry; 2.5.3. Electrical detectors: electron tunneling; 2.5.4. Electrical detectors: capacitance; 2.5.5. Electrical detectors: piezoelectric cantilevers; 2.6. Control systems; 2.6.1. AFM electronics
2.6.2. Operation of the electronics 2.6.3. Feedback control loops; 2.6.4. Design limitations; 2.6.5. Enhancing the performance of large scanners; 2.7. Vibration isolation: thermal and mechanical; 2.8. Calibration; 2.8.1. Piezoelectric scanner non-linearity; 2.8.2. Tip related factors: convolution; 2.8.3. Calibration standards; 2.8.4. Tips for scanning a calibration specimen; 2.9. Integrated AFMs; 2.9.1. Combined AFM-light microscope (AFM-LM); 2.9.2. 'Submarine' AFM - the combined AFM - Langmuir Trough; 2.9.3. Combined AFM-surface plasmon resonance (AFM-SPR); 2.9.4. Cryo-AFM; References
Useful information sources CHAPTER 3 BASIC PRINCIPLES; 3.1. Forces; 3.1.1. The Van der Waals force and force-distance curves; 3.1.2. The electrostatic force; 3.1.3. Capillary and adhesive forces; 3.1.4. Double layer forces; 3.2. Imaging modes; 3.2.1. Contact dc mode; 3.2.2. Ac modes: Tapping and non-contact; Tapping in air; Tapping under liquid; True, non-contact ac mode; Tuning the cantilever; Influence of drive frequency; 3.2.3. Deflection mode; 3.3. Image types; 3.3.1. Topography; 3.3.2. Frictional force; 3.3.3. Phase; 3.4. Substrates; 3.4.1. Mica; 3.4.2. Glass; 3.4.3. Graphite
3.5. Common problems 3.5.1. Thermal drift; 3.5.2. Multiple tip effects; 3.5.3. The 'pool' artifact; 3.5.4. Optical interference on highly reflective samples; 3.5.5. Sample roughness; 3.5.6. Sample mobility; 3.5.7. Imaging under liquid; 3.6. Getting started; 3.6.1. DNA; 3.6.2. Troublesome large samples; 3.7. Image optimisation; 3.7.1. Grey levels and colour tables; 3.7.2. Brightness and contrast; 3.7.3. High and low pass filtering; 3.7.4. Normalisation and plane fitting; 3.7.5. Despike; 3.7.6. Fourier filtering; 3.7.7. Correlation averaging; 3.7.8. Stereographs and anaglyphs
3.7.9. Do your homework! References; CHAPTER 4 MACROMOLECULES; 4.1. Imaging methods; 4.1.1. Tip adhesion, molecular damage and displacement; 4.1.2. Depositing macromolecules onto substrates; 4.1.3. Metal coated samples; 4.1.4. Imaging in air; 4.1.5. Imaging under non-aqueous liquids; 4.1.6. Binding molecules to the substrate; 4.1.7. Imaging under water or buffers; 4.2. Nucleic acids: DNA; 4.2.1. Imaging DNA; 4.2.2. DNA conformation, size and shape; 4.2.3. DNA-protein interactions; 4.2.4. Location and mapping of specific sites; 4.2.5. Chromosomes; 4.3. Nucleic acids: RNA; 4.4. Polysaccharides
4.4.1. Imaging polysaccharides
Record Nr. UNINA-9910826608003321
Morris V. J  
London, : Imperial College Press, c2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Atomic force microscopy for biologists / V. J. Morris, A. R. Kirby, A. P. Gunning
Atomic force microscopy for biologists / V. J. Morris, A. R. Kirby, A. P. Gunning
Autore Morris, V. J.
Pubbl/distr/stampa London : Imperial College Press, c1999
Descrizione fisica xiv, 332 p. : ill. ; 23 cm
Disciplina 502.32
539.1
Altri autori (Persone) Kirby, A. R.
Gunning, A. P.
Soggetto topico Atomic force microscopy
Biology - Technique
ISBN 1860941990
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991001467879707536
Morris, V. J.  
London : Imperial College Press, c1999
Materiale a stampa
Lo trovi qui: Univ. del Salento
Opac: Controlla la disponibilità qui
Atomic force microscopy in liquid [[electronic resource] ] : biological applications / / edited by Arturo M. Baró and Ronald G. Reifenberger
Atomic force microscopy in liquid [[electronic resource] ] : biological applications / / edited by Arturo M. Baró and Ronald G. Reifenberger
Edizione [2nd ed.]
Pubbl/distr/stampa Weinheim, Germany, : Wiley-VCH, 2012
Descrizione fisica 1 online resource (384 p.)
Disciplina 502.82
Altri autori (Persone) BaróArturo M
ReifenbergerRonald G
Soggetto topico Atomic force microscopy
ISBN 1-280-66318-9
9786613640116
3-527-64980-8
3-527-64983-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto pt. 1. General atomic force microscopy -- pt. 2. Biological applications.
Record Nr. UNINA-9910139693003321
Weinheim, Germany, : Wiley-VCH, 2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui