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Ai phase II : national security standards for artificial intelligence
| Ai phase II : national security standards for artificial intelligence |
| Pubbl/distr/stampa | [Washington, D.C.] : , : [U.S. Department of Homeland Security], Public-Private Analytic Exchange Program, , 2019 |
| Descrizione fisica | 1 online resource (35 pages) : color illustrations |
| Soggetto topico |
Artificial intelligence - Standards
National security - United States |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Ai phase II |
| Record Nr. | UNINA-9910715239803321 |
| [Washington, D.C.] : , : [U.S. Department of Homeland Security], Public-Private Analytic Exchange Program, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board
| IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board |
| Pubbl/distr/stampa | New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 |
| Descrizione fisica | 1 online resource (v, 35 pages) |
| Disciplina | 006.3 |
| Soggetto topico |
Artificial intelligence - Standards
Expert systems (Computer science) - Standards |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 1522-2004: IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and Metrics |
| Record Nr. | UNISA-996278288803316 |
| New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board
| IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board |
| Pubbl/distr/stampa | New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 |
| Descrizione fisica | 1 online resource (v, 35 pages) |
| Disciplina | 006.3 |
| Soggetto topico |
Artificial intelligence - Standards
Expert systems (Computer science) - Standards |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 1522-2004: IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and Metrics |
| Record Nr. | UNINA-9910147249403321 |
| New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
