Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson |
Autore | Nelson Wayne <1936-> |
Pubbl/distr/stampa | New York, : Wiley, c1990 |
Descrizione fisica | 1 online resource (xiv, 601 p. ) : ill |
Disciplina | 519.5 |
Collana | Wiley series in probability and mathematical statistics. Applied probability and statistics |
Soggetto topico |
Failure time data analysis
Reliability (Engineering) - Statistical methods Accelerated life testing - Statistical methods |
ISBN |
1-282-30782-7
9786612307829 0-470-31679-9 0-470-31747-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface. 1. Introduction and Background. 2. Models for Life Tests with Constant Stress. 3. Graphical Data Analysis. 4. Complete Data and Least Squares Analyses. 5. Censored Data and Maximum Likelihood Methods. 6. Test Plans. 7. Competing Failure Modes and Size Effect. 8. Least-Squares Comparisons for Complete Data. 9. Maximum Likelihood Comparisons for Censored and Other Data. 10. Models and Data Analyses for Step and Varying Stress. 11. Accelerated Degradation. Appendix A. Statistical Tables. References. Index. |
Record Nr. | UNINA-9910144695703321 |
Nelson Wayne <1936->
![]() |
||
New York, : Wiley, c1990 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson |
Autore | Nelson Wayne <1936-> |
Pubbl/distr/stampa | New York, : Wiley, c1990 |
Descrizione fisica | 1 online resource (xiv, 601 p. ) : ill |
Disciplina | 519.5 |
Collana | Wiley series in probability and mathematical statistics. Applied probability and statistics |
Soggetto topico |
Failure time data analysis
Reliability (Engineering) - Statistical methods Accelerated life testing - Statistical methods |
ISBN |
1-282-30782-7
9786612307829 0-470-31679-9 0-470-31747-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface. 1. Introduction and Background. 2. Models for Life Tests with Constant Stress. 3. Graphical Data Analysis. 4. Complete Data and Least Squares Analyses. 5. Censored Data and Maximum Likelihood Methods. 6. Test Plans. 7. Competing Failure Modes and Size Effect. 8. Least-Squares Comparisons for Complete Data. 9. Maximum Likelihood Comparisons for Censored and Other Data. 10. Models and Data Analyses for Step and Varying Stress. 11. Accelerated Degradation. Appendix A. Statistical Tables. References. Index. |
Record Nr. | UNINA-9910830596903321 |
Nelson Wayne <1936->
![]() |
||
New York, : Wiley, c1990 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson |
Autore | Nelson Wayne <1936-> |
Pubbl/distr/stampa | New York, : Wiley, c1990 |
Descrizione fisica | 1 online resource (xiv, 601 p. ) : ill |
Disciplina | 519.5 |
Collana | Wiley series in probability and mathematical statistics. Applied probability and statistics |
Soggetto topico |
Failure time data analysis
Reliability (Engineering) - Statistical methods Accelerated life testing - Statistical methods |
ISBN |
1-282-30782-7
9786612307829 0-470-31679-9 0-470-31747-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface. 1. Introduction and Background. 2. Models for Life Tests with Constant Stress. 3. Graphical Data Analysis. 4. Complete Data and Least Squares Analyses. 5. Censored Data and Maximum Likelihood Methods. 6. Test Plans. 7. Competing Failure Modes and Size Effect. 8. Least-Squares Comparisons for Complete Data. 9. Maximum Likelihood Comparisons for Censored and Other Data. 10. Models and Data Analyses for Step and Varying Stress. 11. Accelerated Degradation. Appendix A. Statistical Tables. References. Index. |
Record Nr. | UNINA-9910840822303321 |
Nelson Wayne <1936->
![]() |
||
New York, : Wiley, c1990 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|