Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
Aberration-corrected analytical transmission electron microscopy [[electronic resource] /] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
| Aberration-corrected analytical transmission electron microscopy [[electronic resource] /] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (306 p.) |
| Disciplina |
502.8/25
502.825 |
| Altri autori (Persone) |
BrydsonRik
BrooksSusan |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Transmission electron microscopy
Aberration Achromatism |
| ISBN |
1-119-97990-0
1-283-20457-6 9786613204578 1-119-97884-X 1-119-97885-8 |
| Classificazione | SCI053000 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Aberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons
2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 6.4.2 Implementation of the Scanning System |
| Record Nr. | UNINA-9910139612403321 |
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Aberration-corrected analytical transmission electron microscopy / / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
| Aberration-corrected analytical transmission electron microscopy / / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (306 p.) |
| Disciplina |
502.8/25
502.825 |
| Altri autori (Persone) |
BrydsonRik
BrooksSusan |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Transmission electron microscopy
Aberration Achromatism |
| ISBN |
9786613204578
9781119979906 1119979900 9781283204576 1283204576 9781119978848 111997884X 9781119978855 1119978858 |
| Classificazione | SCI053000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Aberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons
2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 6.4.2 Implementation of the Scanning System |
| Record Nr. | UNINA-9910822805803321 |
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Lens aberration data / J.M. Palmer with a prefaction by W.D. Wright
| Lens aberration data / J.M. Palmer with a prefaction by W.D. Wright |
| Autore | Palmer, J.M. |
| Pubbl/distr/stampa | New York : Adam Hilger Ltd, 1971 |
| Descrizione fisica | xi, 118 p. : ill. ; 26 cm. |
| Altri autori (Persone) | Wright, W.D. |
| Soggetto topico |
Aberration
Lenses |
| Classificazione |
53.0.64
535'.324 QC385 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001053399707536 |
Palmer, J.M.
|
||
| New York : Adam Hilger Ltd, 1971 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
| ||
Optical imaging and aberrations . Part II Wave diffraction optics / / Virendra N. Mahajan, the Aerospace Corporation and College of Optical Sciences, the University of Arizona
| Optical imaging and aberrations . Part II Wave diffraction optics / / Virendra N. Mahajan, the Aerospace Corporation and College of Optical Sciences, the University of Arizona |
| Autore | Mahajan Virendra N. |
| Edizione | [2nd printing.] |
| Pubbl/distr/stampa | Bellingham, Washington : , : Society of Photo-Optical Instrumentation Engineers (SPIE), , [2001] |
| Descrizione fisica | 1 online resource (490 p.) |
| Disciplina | 621.36 |
| Collana | SPIE Press monograph |
| Soggetto topico |
Aberration
Geometrical optics Imaging systems |
| ISBN |
1-61583-707-8
0-8194-7880-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Chapter 1. Image formation: 1.1. Introduction -- 1.2. Rayleigh-Sommerfeld theory of diffraction and Huygens-Fresnel principle -- 1.3. Gaussian image -- 1.4. Diffraction image -- 1.5. Physical significance of PSF -- 1.6. Optical transfer function (OTF) -- 1.7. Asymptotic behavior of PSF -- 1.8. PSF centroid -- 1.9. Strehl ratio -- 1.10. Hopkins ratio -- 1.11. Line- and edge-spread functions (LSF and ESF) -- 1.12. Shift-invariant imaging of a coherent object -- Appendix A. Fourier transform definitions -- Appendix B. Some frequently used integrals -- References -- Problems.
Chapter 2. Optical systems with circular pupils: 2.1. Introduction -- 2.2. Aberration-free system -- 2.3. Strehl ratio and aberration tolerance -- 2.4. Balanced aberrations and Zernike circle polynomials -- 2.5. Defocused system -- 2.6. PSFs for rotationally symmetric aberrations -- 2.7. Symmetry properties of an aberrated PSF -- 2.8. PSFs for primary aberrations -- 2.9. Line of sight of an aberrated system -- 2.10. Diffraction OTF for primary a berrations -- 2.11. Hopkins ratio -- 2.12. Geometrical OTF -- 2.13. Incoherent line- and edge-spread functions -- 2.14. Miscellaneous topics -- 2.15. Coherent imaging -- References -- Problems. Chapter 3. Optical systems with annular pupils: 3.1. Introduction -- 3.2. Aberration-free system -- 3.3. Strehl ratio and aberration tolerance -- 3.4. Balanced aberrations and Zernike annular polynomials -- 3.5. Defocused system -- 3.6. Symmetry properties of an aberrated PSF -- 3.7. PSFs and axial irradiance for primary aberrations -- 3.8. 2-D PSFs -- 3.9. Line of sight of an aberrated system -- References -- Problems. Chapter 4. Optical systems with Gaussian pupils: 4.1. Introduction -- 4.2. General theory -- 4.3. Systems with circular pupils -- 4.4. Systems with annular pupils -- 4.5. Line of sight of an aberrated system -- 4.6. Summary -- References -- Problems. Chapter 5. Random aberrations: 5.1 Introduction -- 5.2 Random image motion -- 5.3 Imaging through atmospheric turbulence -- Appendix. Fourier transform of Zernike polynomials -- References -- Problems -- Bibliography -- References for additional reading -- Index. |
| Altri titoli varianti | Wave diffraction optics |
| Record Nr. | UNINA-9911004827103321 |
|
Mahajan Virendra N.
|
||
| Bellingham, Washington : , : Society of Photo-Optical Instrumentation Engineers (SPIE), , [2001] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Polarization analysis of a balloon-borne solar magnetograph [[electronic resource] ] : final report / / Daniel J. Reiley, Russell A. Chipman
| Polarization analysis of a balloon-borne solar magnetograph [[electronic resource] ] : final report / / Daniel J. Reiley, Russell A. Chipman |
| Autore | Reiley Daniel J |
| Pubbl/distr/stampa | Huntsville, AL : , : Physics Department, School of Science, University of Alabama in Huntsville |
| Descrizione fisica | 1 online resource (42 pages) : illustrations |
| Altri autori (Persone) | ChipmanRussell A |
| Collana | [NASA contractor report] |
| Soggetto topico |
Aberration
Magnetometers Optical polarization Polarized light Solar magnetic field |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Polarization analysis of a balloon-borne solar magnetograph |
| Record Nr. | UNINA-9910701862803321 |
|
Reiley Daniel J
|
||
| Huntsville, AL : , : Physics Department, School of Science, University of Alabama in Huntsville | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Ray geometrical optics / / Virendra N. Mahajan
| Ray geometrical optics / / Virendra N. Mahajan |
| Autore | Mahajan Virendra N |
| Pubbl/distr/stampa | Bellingham, Wash., : SPIE Optical Engineering Press, 1998 |
| Descrizione fisica | 1 online resource (500 p.) |
| Disciplina | 621.36 |
| Collana | Optical imaging and aberrations |
| Soggetto topico |
Aberration
Imaging systems Geometrical optics |
| ISBN |
1-61583-706-X
0-8194-7879-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Chapter 1: Gaussian optics -- Introduction -- Foundations of geometrical optics -- Fermat's principle -- Laws of geometrical optics -- Optical path lengths of neighboring rays -- Malus-Dupin theorem -- Hamilton's point characteristic function and direction of a ray -- Gaussian imaging -- Introduction -- Sign convention -- Spherical refracting surface -- Gaussian imaging equation -- Focal lengths and refracting power -- Magnifications and Lagrange invariant -- Graphical imaging -- Newtonian imaging equation -- Thin lens -- Gaussian imaging equation -- Focal lengths and refracting power -- Undeviated ray -- Magnifications and Lagrange invariant -- Newtonian imaging equation -- Refracting systems -- Cardinal points and planes -- Gaussian imaging, focal lengths, and magnifications -- Nodal points -- Newtonian imaging equation -- Afocal systems -- Spherical reflecting surface (spherical mirror) -- Gaussian imaging equation -- Focal length and reflecting power -- Magnifications and Lagrange invariant -- Graphical imaging -- Newtonian imaging equation -- Paraxial ray tracing -- Refracting surface -- Thin lens -- Two thin lenses -- Thick lens -- Reflecting surface (mirror) -- Two-mirror system -- Catadioptric system: thin lens-mirror combination -- Two-ray Lagrange invariant -- Matrix approach to paraxial ray tracing and Gaussian optics -- Introduction -- System matrix -- Conjugate matrix -- System matrix in terms of Gaussian parameters -- Gaussian imaging equations -- References -- Problems.
Chapter 2: Radiometry of imaging -- Introduction -- Stops, pupils, and vignetting -- Introduction -- Aperture stop, and entrance and exit pupils -- Chief and marginal rays -- Vignetting -- Size of an imaging element -- Telecentric aperture stop -- Field stop, and entrance and exit windows -- Radiometry of point sources -- Irradiance of a surface -- Flux incident on a circular aperture -- Radiometry of extended sources -- Lambertian surface -- Exitance of a Lambertian surface -- Radiance of a tube of rays -- Irradiance by a Lambertian surface element -- Irradiance by a Lambertian disc -- Radiometry of point object imaging -- Radiometry of extended object imaging -- Image radiance -- Pupil distortion -- Image irradiance: aperture stop in front of the system -- Image irradiance: aperture stop in back of the system -- Telecentric systems -- Throughput -- Condition for uniform image irradiance -- Concentric systems -- Photometry -- Photometric quantities and spectral response of the human eye -- Imaging by a human eye -- Brightness of a Lambertian surface -- Observing stars in the daytime -- Appendix: Radiance theorem -- References -- Problems. Chapter 3: Optical aberrations -- Introduction -- Wave and ray aberrations -- Definitions -- Relationship between wave and ray aberrations -- Defocus aberration -- Wavefront tilt -- Aberration function of a rotationally symmetric system -- Rotational invariants -- Power-series expansion -- Explicit dependence on object coordinates -- No explicit dependence on object coordinates -- Zernike circle-polynomial expansion -- Relationships between coefficients of power-series and -- Zernike-polynomial expansions -- Observation of aberrations -- Primary aberrations -- Interferograms -- Conditions for perfect imaging -- Imaging of a 3-D object -- Imaging of a 2-D transverse object -- Imaging of a 1-D axial object -- Linear coma and the sine condition -- Optical sine theorem -- Linear coma and offense against the sine condition -- Appendix A: Degree of approximation in eq. (3-11) -- Appendix B: Wave and ray aberrations: alternative definition and derivation -- References -- Problems. Chapter 4: Geometrical point-spread function -- Introduction -- Theory -- Application to primary aberrations -- Spherical aberration -- Coma -- Astigmatism and field curvature -- Distortion -- Balanced aberrations for minimum spot sigma -- Spot diagrams -- Aberration tolerance and golden rule of optical design -- References -- Problems. Chapter 5: Calculation of primary aberrations -- Refracting systems -- Introduction -- Spherical refracting surface with aperture stop at the surface -- On-axis point object -- Off-axis point object -- Aberrations with respect to Petzval image point -- Aberrations with respect to Gaussian image point -- Spherical refracting surface with aperture stop not at the surface -- On-axis point object -- Off-axis point object -- Aplanatic points of a spherical refracting surface -- Conic refracting surface -- Sag of a conic surface -- On-axis point object -- Off-axis point object -- General aspherical refracting surface -- Series of coaxial refracting (and reflecting) surfaces -- General imaging system -- Petzval curvature and corresponding field curvature wave aberration -- Relationship among Petzval curvature, field curvature, and astigmatism -- Wave aberration coefficients -- Aberration function in terms of Seidel sums or Seidel coefficients -- Effect of change in aperture stop position on the aberration function -- Change of peak aberration coefficients -- Illustration of the effect of aperture-stop shift on coma and distortion -- Aberrations of a spherical refracting surface with aperture stop not at the surface obtained from those with stop at the surface -- Thin lens -- Imaging relations -- Thin lens with spherical surfaces and aperture stop at the lens -- Petzval surface -- Spherical aberration and coma -- Aplanatic lens -- Thin lens with conic surfaces -- Thin lens with aperture stop not at the lens -- Field flattener -- Imaging relations -- Aberration function -- Plane-parallel plate -- Introduction -- Imaging relations -- Aberration function -- Chromatic aberrations -- Introduction -- Single refracting surface -- Thin lens -- General system: surface-by-surface approach -- General system: use of principal and focal points -- Chromatic aberrations as wave aberrations -- Symmetrical principle -- Pupil aberrations and conjuage-shift equations -- Introduction -- Pupil aberrations -- Conjugate-shift equations -- Invariance of image aberrations -- Simultaneous correction of aberrations for two or more object positions -- References -- Problems. Chapter 6: Calculation of primary aberrations: reflecting and catadioptric systems -- Introduction -- Conic reflecting surface -- Conic surface -- Imaging relations -- Aberration function -- Petzval surface -- Spherical mirror -- Aberration function and aplanatic points for arbitrary location of aperture stop -- Aperture stop at the mirror surface -- Aperture stop at the center of curvature of mirror -- Paraboloidal mirror -- Catadioptric systems -- Introduction -- Schmidt camera -- Bouwers-Maksutov camera -- Beam expander -- Introduction -- Gaussian parameters -- Aberration contributed by primary mirror -- Aberration contributed by secondary mirror -- System aberration -- Two-mirror astronomical telescopes -- Introduction -- Gaussian parameters -- Petzval surface -- Aberration contributed by primary mirror -- Aberration contributed by secondary mirror -- System aberration -- Classical Cassegrain and Gregorian telescopes -- Aplanatic Cassegrain and Gregorian telescopes -- Afocal telescope -- Couder anastigmatic telescopes -- Schwarzschild telescope -- Dall-Kirkham telescope -- Astronomical telescopes using aspheric plates -- Introduction -- Aspheric plate in a diverging object beam -- Aspheric plate in a converging image beam -- Aspheric plate and a conic mirror -- Aspheric plate and a two-mirror telescope -- References -- Problems. Chapter 7: Calculation of primary aberrations: perturbed optical systems -- Introduction -- Aberrations of a misaligned surface -- Decentered surface -- Tilted surface -- Despaced surface -- Aberrations of perturbed two-mirror telescopes -- Decentered secondary mirror -- Tilted secondary mirror -- Decentered and tilted secondary mirror -- Despaced secondary mirror -- Fabrication errors -- Refracting surface -- Reflecting surface -- System errors -- Error tolerance -- References -- Problems -- Bibliography -- Index. |
| Record Nr. | UNINA-9911004812903321 |
|
Mahajan Virendra N
|
||
| Bellingham, Wash., : SPIE Optical Engineering Press, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Technical support for AXAF : final report
| Technical support for AXAF : final report |
| Pubbl/distr/stampa | Marshall Space Flight Center, Alabama : , : National Aeronautics and Space Administration, Marshall Space Flight Center, , November 1983 |
| Descrizione fisica | 1 online resource (22 pages) : illustrations |
| Collana | NASA/CR |
| Soggetto topico |
Optimization
Aberration Grazing incidence Error analysis Surface properties |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Technical support for AXAF |
| Record Nr. | UNINA-9910708609103321 |
| Marshall Space Flight Center, Alabama : , : National Aeronautics and Space Administration, Marshall Space Flight Center, , November 1983 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
