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A Polymer Cochlear Electrode Array: Atraumatic Deep Insertion, Tripolar Stimulation, and Long-Term Reliability : Doctoral Thesis accepted by Seoul National University for the Degree of Doctor of Philosophy in the Faculty of Electrical and Computer Engineering, Seoul, Korea (Republic of) / Tae Mok Gwon
A Polymer Cochlear Electrode Array: Atraumatic Deep Insertion, Tripolar Stimulation, and Long-Term Reliability : Doctoral Thesis accepted by Seoul National University for the Degree of Doctor of Philosophy in the Faculty of Electrical and Computer Engineering, Seoul, Korea (Republic of) / Tae Mok Gwon
Autore Gwon, Tae Mok
Pubbl/distr/stampa Singapore, : Springer, 2018
Descrizione fisica xxv, 88 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
92E10 - Molecular structure (graph-theoretic methods, methods of differential topology, etc.) [MSC 2020]
74K35 - Thin films [MSC 2020]
Soggetto non controllato Atraumatic deep insertion
Intracochlear electrode
LCP-based cochlear electrode array
Liquid Crystal Polymer
Multi-layered electrode sites
Polymer-based biomedical devices
Polymer-based cochlear implant
Polymer-based neural implants
Tripolar stimulation
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0212002
Gwon, Tae Mok  
Singapore, : Springer, 2018
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
A Polymer Cochlear Electrode Array: Atraumatic Deep Insertion, Tripolar Stimulation, and Long-Term Reliability : Doctoral Thesis accepted by Seoul National University for the Degree of Doctor of Philosophy in the Faculty of Electrical and Computer Engineering, Seoul, Korea (Republic of) / Tae Mok Gwon
A Polymer Cochlear Electrode Array: Atraumatic Deep Insertion, Tripolar Stimulation, and Long-Term Reliability : Doctoral Thesis accepted by Seoul National University for the Degree of Doctor of Philosophy in the Faculty of Electrical and Computer Engineering, Seoul, Korea (Republic of) / Tae Mok Gwon
Autore Gwon, Tae Mok
Pubbl/distr/stampa Singapore, : Springer, 2018
Descrizione fisica xxv, 88 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74K35 - Thin films [MSC 2020]
92E10 - Molecular structure (graph-theoretic methods, methods of differential topology, etc.) [MSC 2020]
Soggetto non controllato Atraumatic deep insertion
Intracochlear electrode
LCP-based cochlear electrode array
Liquid Crystal Polymer
Multi-layered electrode sites
Polymer-based biomedical devices
Polymer-based cochlear implant
Polymer-based neural implants
Tripolar stimulation
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00212002
Gwon, Tae Mok  
Singapore, : Springer, 2018
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
A Practical Guide to Surface Metrology / Michael Quinten
A Practical Guide to Surface Metrology / Michael Quinten
Autore Quinten, Michael
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xxv, 230 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020]
74K35 - Thin films [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
Soggetto non controllato Confocal optical profiling
Digital Holographic Microscopy
Elastic light scattering
Grazing incidence interferometry
Light sectional methods
Multi-wavelength interferometry
Practical surface characterisation
Practical surface measurement
Scanning nearfield optical microscopy
Shearing interferometry
Spectral Reflectometry and Ellipsometry
Surface optical metrology
White light interferometry
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0214455
Quinten, Michael  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
A Practical Guide to Surface Metrology / Michael Quinten
A Practical Guide to Surface Metrology / Michael Quinten
Autore Quinten, Michael
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xxv, 230 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
74K35 - Thin films [MSC 2020]
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020]
Soggetto non controllato Confocal optical profiling
Digital Holographic Microscopy
Elastic light scattering
Grazing incidence interferometry
Light sectional methods
Multi-wavelength interferometry
Practical surface characterisation
Practical surface measurement
Scanning nearfield optical microscopy
Shearing interferometry
Spectral Reflectometry and Ellipsometry
Surface optical metrology
White light interferometry
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00214455
Quinten, Michael  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Angle Resolved Photoemission Spectroscopy of Delafossite Metals : Doctoral Thesis accepted by the Max Planck Institute for Chemical Physics of Solids, Dresden, Germany / Veronika Sunko
Angle Resolved Photoemission Spectroscopy of Delafossite Metals : Doctoral Thesis accepted by the Max Planck Institute for Chemical Physics of Solids, Dresden, Germany / Veronika Sunko
Autore Sunko, Veronika
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xvii, 198 p. : ill. ; 24 cm
Soggetto topico 82-XX - Statistical mechanics, structure of matter [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020]
81V35 - Nuclear physics [MSC 2020]
74K35 - Thin films [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
Soggetto non controllato Angle-Resolved Photoemission
Delafossite oxide metal
Kondo coupling
PdCoO2
PdCrO2
PdRhO2
PtCoO2
Rashba spin-splitting
Spin-Spin Correlation
Spin-Splitting
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0214492
Sunko, Veronika  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Angle Resolved Photoemission Spectroscopy of Delafossite Metals : Doctoral Thesis accepted by the Max Planck Institute for Chemical Physics of Solids, Dresden, Germany / Veronika Sunko
Angle Resolved Photoemission Spectroscopy of Delafossite Metals : Doctoral Thesis accepted by the Max Planck Institute for Chemical Physics of Solids, Dresden, Germany / Veronika Sunko
Autore Sunko, Veronika
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xvii, 198 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
74K35 - Thin films [MSC 2020]
81V35 - Nuclear physics [MSC 2020]
82-XX - Statistical mechanics, structure of matter [MSC 2020]
Soggetto non controllato Angle-Resolved Photoemission
Delafossite oxide metal
Kondo coupling
PdCoO2
PdCrO2
PdRhO2
PtCoO2
Rashba spin-splitting
Spin-Spin Correlation
Spin-Splitting
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00214492
Sunko, Veronika  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors : Studies of Bi2212 and Single-Layer FeSe Film Grown on SrTiO3 Substrate : Doctoral Thesis accepted by The University of Chinese Academy of Sciences, China / Junfeng He
Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors : Studies of Bi2212 and Single-Layer FeSe Film Grown on SrTiO3 Substrate : Doctoral Thesis accepted by The University of Chinese Academy of Sciences, China / Junfeng He
Autore He, Junfeng
Pubbl/distr/stampa Berlin, : Springer, 2016
Descrizione fisica xvi, 126 p. : ill. ; 24 cm
Soggetto topico 82-XX - Statistical mechanics, structure of matter [MSC 2020]
82D55 - Statistical mechanical studies of superconductors [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020]
74K35 - Thin films [MSC 2020]
Soggetto non controllato Angle-Resolved Photoemission
Coexistence of Two Sharp-Mode Couplings
Insulator to Superconductor Crossover
Phase Diagram
Single-Layer FeSe/STO Films
Single-Particle Spectral Function
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0134198
He, Junfeng  
Berlin, : Springer, 2016
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors : Studies of Bi2212 and Single-Layer FeSe Film Grown on SrTiO3 Substrate : Doctoral Thesis accepted by The University of Chinese Academy of Sciences, China / Junfeng He
Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors : Studies of Bi2212 and Single-Layer FeSe Film Grown on SrTiO3 Substrate : Doctoral Thesis accepted by The University of Chinese Academy of Sciences, China / Junfeng He
Autore He, Junfeng
Pubbl/distr/stampa Berlin, : Springer, 2016
Descrizione fisica xvi, 126 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74K35 - Thin films [MSC 2020]
82-XX - Statistical mechanics, structure of matter [MSC 2020]
82D55 - Statistical mechanical studies of superconductors [MSC 2020]
Soggetto non controllato Angle-Resolved Photoemission
Coexistence of Two Sharp-Mode Couplings
Insulator to Superconductor Crossover
Phase Diagram
Single-Layer FeSe/STO Films
Single-Particle Spectral Function
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00134198
He, Junfeng  
Berlin, : Springer, 2016
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Calculus of Variations on Thin Prestressed Films : Asymptotic Methods in Elasticity / Marta Lewicka
Calculus of Variations on Thin Prestressed Films : Asymptotic Methods in Elasticity / Marta Lewicka
Autore Lewicka, Marta
Pubbl/distr/stampa Cham, : Birkhäuser, : Springer, 2023
Descrizione fisica ix, 448 p. : ill. ; 24 cm
Soggetto topico 49Jxx - Existence theories in calculus of variations and optimal control [MSC 2020]
74-XX - Mechanics of deformable solids [MSC 2020]
74Bxx - Elastic materials [MSC 2020]
74K35 - Thin films [MSC 2020]
74Pxx - Optimization problems in solid mechanics [MSC 2020]
Soggetto non controllato Gamma-convergence
Isometric Immersions
Nonlinear elasticity
Prestrain
Prestress
Prestressed Films
Thin Films
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNICAMPANIA-VAN00278574
Lewicka, Marta  
Cham, : Birkhäuser, : Springer, 2023
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Coherent Light-Matter Interactions in Monolayer Transition-Metal Dichalcogenides : Doctoral Thesis accepted by Massachusetts Institute of Technology, Cambridge, MA, USA / Edbert Jarvis Sie
Coherent Light-Matter Interactions in Monolayer Transition-Metal Dichalcogenides : Doctoral Thesis accepted by Massachusetts Institute of Technology, Cambridge, MA, USA / Edbert Jarvis Sie
Autore Sie, Edbert J.
Pubbl/distr/stampa Cham, : Springer, 2018
Descrizione fisica xvii, 129 p. : ill. ; 24 cm
Soggetto topico 81V80 - Quantum optics [MSC 2020]
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020]
74K35 - Thin films [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
Soggetto non controllato Angle-resolved absorption spectroscopy
Bloch-Siegert effect
Coherent light-matter interactions
Electronic valleys
Optical Stark effect
Time-resolved absorption spectroscopy
Valleytronics
XUV spectroscopy
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0208409
Sie, Edbert J.  
Cham, : Springer, 2018
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui