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A Practical Guide to Surface Metrology / Michael Quinten
A Practical Guide to Surface Metrology / Michael Quinten
Autore Quinten, Michael
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xxv, 230 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020]
74K35 - Thin films [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
Soggetto non controllato Confocal optical profiling
Digital Holographic Microscopy
Elastic light scattering
Grazing incidence interferometry
Light sectional methods
Multi-wavelength interferometry
Practical surface characterisation
Practical surface measurement
Scanning nearfield optical microscopy
Shearing interferometry
Spectral Reflectometry and Ellipsometry
Surface optical metrology
White light interferometry
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0214455
Quinten, Michael  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
A Practical Guide to Surface Metrology / Michael Quinten
A Practical Guide to Surface Metrology / Michael Quinten
Autore Quinten, Michael
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xxv, 230 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
74K35 - Thin films [MSC 2020]
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020]
Soggetto non controllato Confocal optical profiling
Digital Holographic Microscopy
Elastic light scattering
Grazing incidence interferometry
Light sectional methods
Multi-wavelength interferometry
Practical surface characterisation
Practical surface measurement
Scanning nearfield optical microscopy
Shearing interferometry
Spectral Reflectometry and Ellipsometry
Surface optical metrology
White light interferometry
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00214455
Quinten, Michael  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Angle Resolved Photoemission Spectroscopy of Delafossite Metals : Doctoral Thesis accepted by the Max Planck Institute for Chemical Physics of Solids, Dresden, Germany / Veronika Sunko
Angle Resolved Photoemission Spectroscopy of Delafossite Metals : Doctoral Thesis accepted by the Max Planck Institute for Chemical Physics of Solids, Dresden, Germany / Veronika Sunko
Autore Sunko, Veronika
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xvii, 198 p. : ill. ; 24 cm
Soggetto topico 82-XX - Statistical mechanics, structure of matter [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020]
81V35 - Nuclear physics [MSC 2020]
74K35 - Thin films [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
Soggetto non controllato Angle-Resolved Photoemission
Delafossite oxide metal
Kondo coupling
PdCoO2
PdCrO2
PdRhO2
PtCoO2
Rashba spin-splitting
Spin-Spin Correlation
Spin-Splitting
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0214492
Sunko, Veronika  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Angle Resolved Photoemission Spectroscopy of Delafossite Metals : Doctoral Thesis accepted by the Max Planck Institute for Chemical Physics of Solids, Dresden, Germany / Veronika Sunko
Angle Resolved Photoemission Spectroscopy of Delafossite Metals : Doctoral Thesis accepted by the Max Planck Institute for Chemical Physics of Solids, Dresden, Germany / Veronika Sunko
Autore Sunko, Veronika
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xvii, 198 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
74K35 - Thin films [MSC 2020]
81V35 - Nuclear physics [MSC 2020]
82-XX - Statistical mechanics, structure of matter [MSC 2020]
Soggetto non controllato Angle-Resolved Photoemission
Delafossite oxide metal
Kondo coupling
PdCoO2
PdCrO2
PdRhO2
PtCoO2
Rashba spin-splitting
Spin-Spin Correlation
Spin-Splitting
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00214492
Sunko, Veronika  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Charge and Heat Transport Phenomena in Electronic and Spin Structures in B20-type Compounds : Doctoral Thesis accepted by the University of Tokyo, Tokyo, Japan / Naoya Kanazawa
Charge and Heat Transport Phenomena in Electronic and Spin Structures in B20-type Compounds : Doctoral Thesis accepted by the University of Tokyo, Tokyo, Japan / Naoya Kanazawa
Autore Kanazawa, Naoya
Pubbl/distr/stampa Tokyo, : Springer, 2015
Descrizione fisica xii, 89 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
80Axx - Thermodynamics and heat transfer [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
Soggetto non controllato 3D Skyrmion Crystal State
B20-type Transition-metal Germanium Compound
Gauge Flux of Berry Phase
Skyrmion Structure
Strong Spin-orbit Coupling
Thermoelectric Effect in Dirac Electron System
Topological Hall Effect in Skyrmions
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0133946
Kanazawa, Naoya  
Tokyo, : Springer, 2015
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Charge and Heat Transport Phenomena in Electronic and Spin Structures in B20-type Compounds : Doctoral Thesis accepted by the University of Tokyo, Tokyo, Japan / Naoya Kanazawa
Charge and Heat Transport Phenomena in Electronic and Spin Structures in B20-type Compounds : Doctoral Thesis accepted by the University of Tokyo, Tokyo, Japan / Naoya Kanazawa
Autore Kanazawa, Naoya
Pubbl/distr/stampa Tokyo, : Springer, 2015
Descrizione fisica xii, 89 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
80Axx - Thermodynamics and heat transfer [MSC 2020]
Soggetto non controllato 3D Skyrmion Crystal State
B20-type Transition-metal Germanium Compound
Gauge Flux of Berry Phase
Skyrmion Structure
Strong Spin-orbit Coupling
Thermoelectric Effect in Dirac Electron System
Topological Hall Effect in Skyrmions
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00133946
Kanazawa, Naoya  
Tokyo, : Springer, 2015
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Coherent Light-Matter Interactions in Monolayer Transition-Metal Dichalcogenides : Doctoral Thesis accepted by Massachusetts Institute of Technology, Cambridge, MA, USA / Edbert Jarvis Sie
Coherent Light-Matter Interactions in Monolayer Transition-Metal Dichalcogenides : Doctoral Thesis accepted by Massachusetts Institute of Technology, Cambridge, MA, USA / Edbert Jarvis Sie
Autore Sie, Edbert J.
Pubbl/distr/stampa Cham, : Springer, 2018
Descrizione fisica xvii, 129 p. : ill. ; 24 cm
Soggetto topico 81V80 - Quantum optics [MSC 2020]
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020]
74K35 - Thin films [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
Soggetto non controllato Angle-resolved absorption spectroscopy
Bloch-Siegert effect
Coherent light-matter interactions
Electronic valleys
Optical Stark effect
Time-resolved absorption spectroscopy
Valleytronics
XUV spectroscopy
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0208409
Sie, Edbert J.  
Cham, : Springer, 2018
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Coherent Light-Matter Interactions in Monolayer Transition-Metal Dichalcogenides : Doctoral Thesis accepted by Massachusetts Institute of Technology, Cambridge, MA, USA / Edbert Jarvis Sie
Coherent Light-Matter Interactions in Monolayer Transition-Metal Dichalcogenides : Doctoral Thesis accepted by Massachusetts Institute of Technology, Cambridge, MA, USA / Edbert Jarvis Sie
Autore Sie, Edbert J.
Pubbl/distr/stampa Cham, : Springer, 2018
Descrizione fisica xvii, 129 p. : ill. ; 24 cm
Soggetto topico 74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
74K35 - Thin films [MSC 2020]
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020]
81V80 - Quantum optics [MSC 2020]
Soggetto non controllato Angle-resolved absorption spectroscopy
Bloch-Siegert effect
Coherent light-matter interactions
Electronic valleys
Optical Stark effect
Time-resolved absorption spectroscopy
Valleytronics
XUV spectroscopy
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00208409
Sie, Edbert J.  
Cham, : Springer, 2018
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Confocal Raman Microscopy / Jan Toporski, Thomas Dieing, Olaf Hollricher editors
Confocal Raman Microscopy / Jan Toporski, Thomas Dieing, Olaf Hollricher editors
Edizione [2. ed]
Pubbl/distr/stampa Cham, : Springer, 2018
Descrizione fisica xxiv, 596 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74K35 - Thin films [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
Soggetto non controllato 3D Confocal Raman Imaging
Confocal Raman Spectroscopy Review
Correlative Microscopy
Nanospectroscopy of Individual Carbon Nanotubes
Raman Imaging of Plant Cell Walls
Raman Imaging of Polymeric Materials
Raman Micro-Spectral Imaging
Raman Microscopy in Microbiology
Stress Analysis by Raman Microscopy
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0208433
Cham, : Springer, 2018
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Confocal Raman Microscopy / Jan Toporski, Thomas Dieing, Olaf Hollricher editors
Confocal Raman Microscopy / Jan Toporski, Thomas Dieing, Olaf Hollricher editors
Edizione [2. ed]
Pubbl/distr/stampa Cham, : Springer, 2018
Descrizione fisica xxiv, 596 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
74K35 - Thin films [MSC 2020]
Soggetto non controllato 3D Confocal Raman Imaging
Confocal Raman Spectroscopy Review
Correlative Microscopy
Nanospectroscopy of Individual Carbon Nanotubes
Raman Imaging of Plant Cell Walls
Raman Imaging of Polymeric Materials
Raman Micro-Spectral Imaging
Raman Microscopy in Microbiology
Stress Analysis by Raman Microscopy
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00208433
Cham, : Springer, 2018
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui