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Semiconductor measurement technology : the results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon / / Barbara J. Belzer, David L. Blackburn
| Semiconductor measurement technology : the results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon / / Barbara J. Belzer, David L. Blackburn |
| Autore | Belzer Barbara J |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1997 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BelzerBarbara J
BlackburnDavid L |
| Collana | NIST special publication |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Semiconductor measurement technology |
| Record Nr. | UNINA-9910711191203321 |
Belzer Barbara J
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Semiconductor measurement technology : a bibliography of NBS publications for the years 1962-1986 / / Jane Walters
| Semiconductor measurement technology : a bibliography of NBS publications for the years 1962-1986 / / Jane Walters |
| Autore | Walters Jane |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1987 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | WaltersJane |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Semiconductor measurement technology |
| Record Nr. | UNINA-9910709925603321 |
|
Walters Jane
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1987 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Semiconductor measurement technology : a bibliography of NBS publications for the years 1962-1985 / / Jane Walters
| Semiconductor measurement technology : a bibliography of NBS publications for the years 1962-1985 / / Jane Walters |
| Autore | Walters Jane |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | WaltersJane |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Semiconductor measurement technology |
| Record Nr. | UNINA-9910710551303321 |
|
Walters Jane
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||