7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
Disciplina | 621.3815 |
Collana | ACM Conferences. |
Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
ISBN | 1-5090-9459-8 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | ISQED '06 |
Record Nr. | UNISA-996197586203316 |
[Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
Disciplina | 621.3815 |
Collana | ACM Conferences. |
Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
ISBN |
9781509094592
1509094598 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | ISQED '06 |
Record Nr. | UNINA-9910145452103321 |
[Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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