IEC 62243 IEEE 1232 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002) : Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) / / IEEE
| IEC 62243 IEEE 1232 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002) : Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) / / IEEE |
| Edizione | [First edition 2005-07.] |
| Pubbl/distr/stampa | New York : , : IEEE, , 2002 |
| Descrizione fisica | 1 online resource (128 pages) |
| Disciplina | 006.33 |
| Collana | IEC |
| Soggetto topico |
Expert systems (Computer science)
Expert systems (Computer science) - Standards Artificial intelligence Reasoning Diagnostic services |
| ISBN | 0-7381-4778-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
62243-2002 - IEC 62243 Ed. 1
IEC 62243 First edition 2005-07 IEEE 1232 IEC 62243 Ed. 1 |
| Record Nr. | UNINA-9910135765903321 |
| New York : , : IEEE, , 2002 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEC 62243 IEEE 1232 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002) : Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) / / IEEE
| IEC 62243 IEEE 1232 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002) : Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) / / IEEE |
| Edizione | [First edition 2005-07.] |
| Pubbl/distr/stampa | New York : , : IEEE, , 2002 |
| Descrizione fisica | 1 online resource (128 pages) |
| Disciplina | 006.33 |
| Collana | IEC |
| Soggetto topico |
Expert systems (Computer science)
Expert systems (Computer science) - Standards Artificial intelligence Reasoning Diagnostic services |
| ISBN | 0-7381-4778-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
62243-2002 - IEC 62243 Ed. 1
IEC 62243 First edition 2005-07 IEEE 1232 IEC 62243 Ed. 1 |
| Record Nr. | UNISA-996279345303316 |
| New York : , : IEEE, , 2002 | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||