4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) : 23-25 January 2008, Hong Kong, China / / IEEE Computer Society |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2008 |
Descrizione fisica | 1 online resource (84 pages) |
Disciplina | 621.381 |
Altri autori (Persone) | OsseiranAdam |
Soggetto topico |
Electronics - Design
Electronics - Testing |
ISBN | 1-5090-7977-7 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Fourth Institute of Electrical and Electronics Engineers International Symposium on Electronic Design, Test and Applications (delta 2008) |
Record Nr. | UNINA-9910145113403321 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2008 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) : 23-25 January 2008, Hong Kong, China / / IEEE Computer Society |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2008 |
Descrizione fisica | 1 online resource (84 pages) |
Disciplina | 621.381 |
Altri autori (Persone) | OsseiranAdam |
Soggetto topico |
Electronics - Design
Electronics - Testing |
ISBN | 1-5090-7977-7 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Fourth Institute of Electrical and Electronics Engineers International Symposium on Electronic Design, Test and Applications (delta 2008) |
Record Nr. | UNISA-996215964703316 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2008 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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