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2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff
| 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 2013 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Very large scale integration
Integrated circuits - Fault tolerance |
| ISBN |
1-4799-1585-8
1-4799-1584-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Record Nr. | UNISA-996279995003316 |
| Piscataway, NJ : , : IEEE, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff
| 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 2013 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Very large scale integration
Integrated circuits - Fault tolerance |
| ISBN |
1-4799-1585-8
1-4799-1584-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Record Nr. | UNINA-9910133227303321 |
| Piscataway, NJ : , : IEEE, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||