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ANSI C63.4-2003 (Revision of ANSI C63.4-2001): : American National Standard for Methods of Measurement of Radio-Noise Emissions From Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz / / Institute of Electrical and Electronics Engineers
| ANSI C63.4-2003 (Revision of ANSI C63.4-2001): : American National Standard for Methods of Measurement of Radio-Noise Emissions From Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, NY : , : IEEE, , 2004 |
| Descrizione fisica | 1 online resource (vii, 135 pages) |
| Disciplina | 621.30287 |
| Soggetto topico |
Electric apparatus and appliances - Testing
Radio noise - Measurement |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI C63.4-2003 |
| Record Nr. | UNINA-9910147249303321 |
| New York, NY : , : IEEE, , 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ANSI C63.4-2003 (Revision of ANSI C63.4-2001): : American National Standard for Methods of Measurement of Radio-Noise Emissions From Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz / / Institute of Electrical and Electronics Engineers
| ANSI C63.4-2003 (Revision of ANSI C63.4-2001): : American National Standard for Methods of Measurement of Radio-Noise Emissions From Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, NY : , : IEEE, , 2004 |
| Descrizione fisica | 1 online resource (vii, 135 pages) |
| Disciplina | 621.30287 |
| Soggetto topico |
Electric apparatus and appliances - Testing
Radio noise - Measurement |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI C63.4-2003 |
| Record Nr. | UNISA-996279884203316 |
| New York, NY : , : IEEE, , 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||