2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers (IEEE) |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 |
Descrizione fisica | 1 online resource (various paging) : illustrations some color |
Disciplina | 621.38152 |
Soggetto topico |
Semiconductors - Cooling
Semiconductors - Thermal properties |
ISBN | 1-5386-1531-2 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | 2017 33rd Thermal Measurement, Modeling & Management Symposium |
Record Nr. | UNISA-996280189603316 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers (IEEE) |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 |
Descrizione fisica | 1 online resource (various paging) : illustrations some color |
Disciplina | 621.38152 |
Soggetto topico |
Semiconductors - Cooling
Semiconductors - Thermal properties |
ISBN | 1-5386-1531-2 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | 2017 33rd Thermal Measurement, Modeling & Management Symposium |
Record Nr. | UNINA-9910172623503321 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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