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Basic electro-optics for electrical engineers / / Glenn D. Boreman
Basic electro-optics for electrical engineers / / Glenn D. Boreman
Autore Boreman G. D (Glenn D.)
Pubbl/distr/stampa Bellingham, Wash., : SPIE Optical Engineering Press, 1998
Descrizione fisica 1 online resource (101 p.)
Disciplina 621.36
Collana Tutorial texts in optical engineering
Soggetto topico Integrated optics
Electrooptical devices
Optoelectronic devices
ISBN 9781615837427
1615837426
9780819478573
0819478571
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. Geometrical optics -- Introduction -- Electromagnetic spectrum -- Rays -- Imaging concepts -- Aperture stop, marginal ray, and F/# -- Field stop, chief ray, and field of view -- Thick lenses and lens combinations -- Image quality and diffraction -- Image quality and aberrations -- Materials considerations -- 2. Modulation transfer function -- Introduction -- Transfer functions -- Resolution -- MTF calculations -- 3. Radiometry -- Introduction -- Solid angle -- Flux-transfer calculations -- 4. Sources of radiation -- Introduction -- Blackbody radiation -- Emissivity -- 5. Detectors -- Introduction -- Cutoff wavelength -- Cooling requirements -- Spectral responsivity -- Frequency response and noise-equivalent bandwidth -- Noise terminology -- Shot noise and generation-recombination noise -- Johnson noise and 1/f noise -- Noise specification of detectors: noise-equivalent power -- Normalized detectivity D* -- Photovoltaic detectors -- Schottky-Barrier detectors -- Photoconductive detectors -- Photoemissive detectors -- Bolometric detectors -- Pyroelectric detectors -- 6. Lasers -- Introduction -- Directionality, monochromaticity, and brightness -- Gaussian beams -- Temporal laser-beam measurements -- Spatial laser beam measurements.
Record Nr. UNINA-9911004816903321
Boreman G. D (Glenn D.)  
Bellingham, Wash., : SPIE Optical Engineering Press, 1998
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Common sense approach to thermal imaging / Gerald C. Holst
Common sense approach to thermal imaging / Gerald C. Holst
Autore Holst, Gerald C.
Pubbl/distr/stampa Winter Park, Fla. : JCD
Descrizione fisica xiii, 377 p. : ill. ; 23 cm
Disciplina 621.3672
Soggetto topico Infrared imaging
Thermography
Imaging systems
ISBN 0964000075 (JCD)
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991001052629707536
Holst, Gerald C.  
Winter Park, Fla. : JCD
Materiale a stampa
Lo trovi qui: Univ. del Salento
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Digital image compression techniques / Majid Rabbani and Paul W. Jones
Digital image compression techniques / Majid Rabbani and Paul W. Jones
Autore Rabbani, Majid
Pubbl/distr/stampa Bellingham, Washington : SPIE Optical Engineering Press, c1991
Descrizione fisica XV, 220 p. ill. : ill. ; 24 cm
Disciplina 621.36'7
Altri autori (Persone) Jones, Paul W.
Collana Tutorial texts in optical engineering
Soggetto non controllato Elaborazione delle immagini - Tecniche digitali
Teoria della codificazione
ISBN 0-8194-0648-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-990000525020403321
Rabbani, Majid
Bellingham, Washington : SPIE Optical Engineering Press, c1991
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Fractal and wavelet image compression techniques / / Stephen Welstead
Fractal and wavelet image compression techniques / / Stephen Welstead
Autore Welstead Stephen T. <1951->
Pubbl/distr/stampa Bellingham, Wash., : SPIE Optical Engineering Press, c1999
Descrizione fisica 1 online resource (258 p.)
Disciplina 621.36/7
Collana Tutorial texts series
Soggetto topico Image processing - Digital techniques
Image compression - Mathematics
Fractals
Wavelets (Mathematics)
ISBN 9781615837137
1615837132
9780819478597
0819478598
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto pt. 1. Fractal image compression -- pt. 2. Wavelet image compression.
Record Nr. UNINA-9911004816103321
Welstead Stephen T. <1951->  
Bellingham, Wash., : SPIE Optical Engineering Press, c1999
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Fundamentals of electronic image processing / / Arthur R. Weeks, Jr
Fundamentals of electronic image processing / / Arthur R. Weeks, Jr
Autore Weeks Arthur R
Pubbl/distr/stampa Bellingham, Wash., : SPIE Optical Engineering Press
Descrizione fisica xiii, 570 p. : ill. (some col.), maps
Disciplina 621.36/7
Collana SPIE/IEEE series on imaging science & engineering
Soggetto topico Image processing
ISBN 1-61583-746-9
0-8194-8043-6
9780470544709
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Preface -- Acknowledgments -- 1. Introduction to electronic image processing. 1.1. Historical background; 1.2. Applications of image processing; 1.3. Introduction to visual perception; 1.4. Image formation; 1.5. Sampling and quantization; 1.6. Image neighbors and distances; 1.7. Typical image processing systems -- 2. Transforms used in electronic image processing. 2.1. The Fourier series; 2.2. The one-dimensional Fourier transform; 2.3. The two-dimensional Fourier transform; 2.4. Important functions relating to the Fourier transform; 2.5. The discrete Fourier transform; 2.6. Example and properties of the discrete Fourier transform; 2.7. Computation of the discrete Fourier transform; 2.8. Other image transforms -- 3. Image enhancement by point operations. 3.1. An overview of point processing; 3.2. Constant and nonlinear operations; 3.3. Operations between images; 3.4. Histogram techniques -- 4. Spatial filtering and fourier frequency methods. 4.1. Various types of noise that appear in images; 4.2. Spatial filtering; 4.3. Spatial frequency filtering; 4.4. Image restoration.
5. Nonlinear image processing techniques. 5.1. Nonlinear spatial filters based on order statistics; 5.2. Nonlinear mean filters; 5.3. Adaptive filters; 5.4. The homomorphic filter -- 6. Color image processing. 6.1. Color fundamentals; 6.2. Color models; 6.3. Examples of color image processing; 6.4. Pseudocoloring and color displays -- 7. Image geometry and morphological filters. 7.1. Spatial interpolation; 7.2. Image geometry; 7.3. Binary morphology: dilation and erosion; 7.4. Binary morphology: opening, closing, edge detection, and skeletonization; 7.5. Binary morphology: hit-miss, thinning, thickening, and pruning; 7.6. Binary morphology: granulometries and the pattern spectrum; 7.7. Graylevel morphology -- 8. Image segmentation and representation. 8.1. Image thresholding; 8.2. Edge, line, and point detection; 8.3. Region based segmentation; 8.4. Image representation -- 9. Image compression. 9.1. Compression fundamentals; 9.2. Error-free compression methods; 9.3. Lossy compression methods -- Bibliography -- Index.
Record Nr. UNINA-9911004823803321
Weeks Arthur R  
Bellingham, Wash., : SPIE Optical Engineering Press
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Hands-on morphological image processing / / Edward R. Dougherty, Roberto A. Lotufo
Hands-on morphological image processing / / Edward R. Dougherty, Roberto A. Lotufo
Autore Dougherty Edward R
Pubbl/distr/stampa Bellingham, Wash., : SPIE Optical Engineering Press, 2003
Descrizione fisica 1 online resource (289 p.)
Disciplina 621.36/7
Altri autori (Persone) LotufoRoberto A
Collana Tutorial texts in optical engineering
Soggetto topico Image processing - Mathematics
Morphisms (Mathematics)
ISBN 1-61583-698-5
0-8194-7866-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Preface -- List of Symbols -- 1. Binary Erosion and Dilation -- 1.1 Introduction -- 1.2 Euclidean and Discrete Binary Images -- 1.3 Erosion -- 1.4 Dilation -- 1.5 Algebraic Properties -- 1.6 Filter Properties -- 1.7 Relationship to Set Operations -- 1.8 Bounded Operators -- 1.9 Exercises -- 1.10 Laboratory Experiments -- 1.11 References --
2. Binary Opening and Closing -- 2.1 Opening -- 2.2 Closing -- 2.3 Filter Properties -- 2.4 Application of Opening and Closing Filters -- 2.5 Alternating Sequential Filters -- 2.6 Invariance -- 2.7 T-Openings -- 2.8 Demonstration -- 2.9 Exercises -- 2.10 Laboratory Experiments -- 2.11 References --
3. Morphological Processing of Binary Images -- 3.1 Pixel Regions -- 3.2 Boundary Detection -- 3.3 Reconstruction -- 3.4 Conditional Dilation -- 3.5 Marker Selection in Reconstruction -- 3.6 Reconstructive T-opening -- 3.7 Logical Openings -- 3.8 Logical Structural Filters -- 3.9 Connected Operators -- 3.10 Skeletonization -- 3.11 Distance Transform -- 3.12 Geodesic Distance Transform -- 3.13 Exercises -- 3.14 Laboratory Experiments -- 3.15 References --
4. Hit-or-Miss Transform -- 4.1 The Transform -- 4.2 Object Recognition -- 4.3 Thinning -- 4.4 Pruning -- 4.5 Exercises -- 4.6 Laboratory Experiments -- 4.7 References --
5. Gray-Scale Morphology -- 5.1 Mathematical Preliminaries -- 5.2 Gray-Scale Erosion -- 5.3 Gray-Scale Dilation -- 5.4 Algebraic Properties -- 5.5 Filter Properties -- 5.6 Umbra Transform -- 5.7 Flat Structuring Elements -- 5.8 Gray-Scale Morphology for Discrete Images -- 5.9 Gray-Scale Morphology for Discrete Bounded Signals -- 5.10 Gray-Scale Opening and Closing -- 5.11 Exercises -- 5.12 Laboratory Experiments -- 5.13 References --
6. Morphological Processing of Gray-Scale Images -- 6.1 Morphological Gradient -- 6.2 Top-Hat Transform -- 6.3 Gray-Scale Alternating Sequential Filters -- 6.4 Gray-Scale Morphological Reconstruction -- 6.5 Flat Zones and Connected Filters -- 6.6 Gray-Scale Reconstructive Opening -- 6.7 Connected Alternating Sequential Filters -- 6.8 Image Extrema -- 6.9 Markers From Regional Maxima of Filtered Images -- 6.10 Extinction Values -- 6.11 Demonstration -- 6.12 Exercises -- 6.13 Laboratory Experiments -- 6.14 References --
7. Morphological Segmentation Watershed -- 7.1 Watershed From Markers -- 7.2 Watershed, Voronoi Diagram and SKIZ -- 7.3 Segmentation of Overlapped Convex Cells -- 7.4 Inner and Outer Markers -- 7.5 Hierarchical Watershed Transform -- 7.6 Watershed Transform Algorithms -- 7.7 Demonstrations -- 7.8 Exercises -- 7.9 Laboratory Experiments -- 7.10 References --
8. Granulometries -- 8.1 Granulometries Generated by a Single Opening -- 8.2 Discrete Size Distributions -- 8.3 The Open and Discrete-Size Transforms -- 8.4 Granulometries on Random Binary Images -- 8.5 Granulometric Classification -- 8.6 General Granulometries -- 8.7 Logical Granulometries -- 8.8 Discrete Granulometric Bandpass Filters -- 8.9 Gray-Scale Granulometries -- 8.10 Exercises -- 8.11 Laboratory Experiments -- 8.12 References --
9. Automatic Design of Morphological Operators -- 9.1 Boolean Functions -- 9.2 Morphological Representation -- 9.3 Optimal W-Operators -- 9.4 Design of Optimal W-Operators -- 9.5 Optimal Increasing Filters -- 9.6 Differencing Filters -- 9.7 Resolution Conversion -- 9.8 Multiresolution Analysis -- 9.9 Aperture Filters -- 9.10 Relation to Pattern Recognition -- 9.11 Exercises -- 9.12 References --Index.
Record Nr. UNINA-9911004824103321
Dougherty Edward R  
Bellingham, Wash., : SPIE Optical Engineering Press, 2003
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Intermediate optical design / / Michael J. Kidger
Intermediate optical design / / Michael J. Kidger
Autore Kidger Michael J
Pubbl/distr/stampa Bellingham, Wash., : SPIE Optical Engineering Press, c2004
Descrizione fisica 1 online resource (250 p.)
Disciplina 535/.32
Collana SPIE monograph
Soggetto topico Geometrical optics
ISBN 1-61583-704-3
0-8194-7831-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Chapter 1. Optimization -- Special characteristics of lens design as an optimization problem -- The nature of the merit function -- The Strehl ratio -- MTF optimization -- General comments -- Comparison with the optical thin-film design problem -- Nonlinearity of the aberrations -- Changes needed to reduce high-order aberrations -- A method of visualizing the problem of optimization in lens design -- Theory of damped least squares (Levenberg-Marquardt) -- Some details of damped least squares as used in lens design -- Paraxial (first-order) properties -- Seidel and Buchdahl coefficients -- Transverse ray or wavefront aberrations -- Aberration balancing and choice of weighting factors -- Damping -- Control of physical constraints -- Control of glass boundary conditions -- Solves -- Lagrange multipliers -- Some reasons for the success of the DLS method -- Experiments with optimization programs -- Effect of changing the damping factor -- Effect of scaling the parameter changes -- An optimization example -- References.
Chapter 2. Buchdahl aberrations -- Third-order coefficients -- Fifth-order coefficients -- Comparison with H.H. Hopkins notation -- Examples -- Double Gauss -- Shafer lens with zero third- and fifth-order aberrations -- References -- Chapter 3. Synthesis of new lens designs -- Choice of a starting point -- Modification of an existing design -- Purchase of a competing lens -- Analytic solutions -- Nonanalytic synthesis of new design forms -- Examples -- A unit magnification telecentric doublet pair -- A simple zoom lens -- The use of catalog components -- Singlets -- Doublets and triplets -- Meniscus singlets -- Field flatteners -- Cemented triplets -- References -- Chapter 4. Lenses for 35-mm cameras -- The triplet -- The tessar -- The double-Gauss (planar-type) -- The Sonnar -- Wide-angle lenses for rangefinder cameras (Zeiss Biogon) -- Wide-angle lens for rangefinder camera (Schneider Super-Angulon) -- Wide-angle lenses for SLR cameras -- Telephoto lens -- Long-focus telephoto lens -- Lens for compact point-and-shoot camera -- Single lens for disposable cameras -- References.
Chapter 5. Secondary spectrum and apochromats -- Apochromatic doublets -- Apochromatic triplets -- Petzval lenses -- Double-Gauss lenses -- Telephoto lenses -- Zoom lenses -- Microscope objectives -- Secondary spectrum correction with normal glasses -- Liquids -- Diffractive optics -- McCarthy-Wynne principle -- Schupmann principle -- Transverse secondary spectrum -- References -- Chapter 6. Lenses for laser applications -- Gaussian beams -- Laser beam expanders -- Two-lens beam expanders -- Three-lens beam expanders -- F-Theta lenses -- Lenses for optical disks -- Laser diode collimators -- References -- Chapter 7. Microscope objectives -- Classical microscope objectives -- Flat-field microscope objectives -- Oil-immersion objectives -- References -- Chapter 8. Microlithographic Projection Optics -- Unit-magnification zero-power monocentric systems -- Dyson 1x relay -- Offner 1x relay -- Wynne-Dyson 1x relay -- Wynne-Offner 1x relay -- Reduction lenses -- Catadioptric reduction systems -- Catoptric reduction systems -- References.
Chapter 9. Zoom lenses -- General principles -- Control of chromatic aberration -- Field curvature -- Minimization of movements -- Two-component zooms -- Minus-plus plastic disposable zoom -- Plus-minus plastic disposable zoom -- A typical minus-plus zoom -- A typical plus-minus zoom -- Three-component zooms -- Four-component zooms -- Zoom relays -- Zoom telescopes -- Zoom modules -- References -- Chapter 10. Decentered and asymmetric systems -- General properties of decentered systems -- Coordinate systems -- Interpretation of results -- New-axis surface -- Toroids -- Offset surfaces (or off-axis surfaces) -- Convention for mirrors -- Kutter system -- Single parabolic mirror -- Alpha rotations -- Beta rotations -- Alpha and beta rotations -- Scanning systems -- The active side of a surface -- X-ray telescopes -- WOLTER2 example -- WOLTER1 example -- Chapter 11. Design for manufacturability -- Tolerancing -- Simplicity of design -- Air spaces -- Glass components -- Glass choice -- Mirror surfaces -- Redesign for actual melt data -- Use of existing tools and test plates -- Selective assembly and adjustment after assembly -- General points -- References -- Index.
Record Nr. UNINA-9911004822203321
Kidger Michael J  
Bellingham, Wash., : SPIE Optical Engineering Press, c2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
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The Internet for scientists and engineers : online tools and resources / Brian J. Thomas
The Internet for scientists and engineers : online tools and resources / Brian J. Thomas
Autore Thomas, Brian J.
Pubbl/distr/stampa Bellingham : SPIE Optical Engineering Press, c1995
Descrizione fisica xix, 450 p. ; 25 cm.
Soggetto topico Internet (Computer network)
ISBN 0819418064
Classificazione 621.3.8
TK5105.875.I57T48
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991001013689707536
Thomas, Brian J.  
Bellingham : SPIE Optical Engineering Press, c1995
Materiale a stampa
Lo trovi qui: Univ. del Salento
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Introduction to imaging spectrometers / / William L. Wolfe
Introduction to imaging spectrometers / / William L. Wolfe
Autore Wolfe William L
Pubbl/distr/stampa Bellingham, Wash., : SPIE Optical Engineering Press, c1997
Descrizione fisica 1 online resource (162 p.)
Disciplina 621.36/1
Collana Tutorial texts in optical engineering
Soggetto topico Spectrometer
Imaging systems - Design and construction
ISBN 1-61583-741-8
0-8194-7854-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. Introduction -- The Scheme of This Text -- The Future -- References and Bibliography.
2. Optics overview -- Photons, Waves, and Rays -- The Detection of Radiation -- Interference -- Wavefronts, Normals, Beams, and Rays -- Refractive Index -- The Laws of Reflection and Refraction -- Total Internal Reflection -- Diffraction -- Geometric Optics and Optical Design -- The Idealized Thin Lens -- The Lens Maker's Equation -- Aberrations -- Bending the Lens.
3. Radiometry review -- Definitions of Important Radiometric Quantities -- Radiative Transfer -- Solid Angle and Speed -- Stops and Pupils.
4. Spectrometer specifications -- Spectral Variables -- Resolution -- Resolving Power.
5. Imaging introduction -- The Field of View -- Scanners -- Strip Mappers -- Pushbroom Scanners -- Whiskbroom Scanners.
6. Detector descriptions -- Descriptors -- Properties of Elemental Detectors -- Properties of Detector Arrays -- Fundamental Limits.
7. System sensitivity -- Specification -- Charge-Collecting Detectors -- Summary of Figures of Merit.
8. Filter phenomena -- Types of Filters -- One-Layer Filters -- Multilayer Filters -- Circular and Linear Variable Filters -- Fabry-Perot Filters -- Acousto-Optical Filters.
9. Prism spectrometers -- Prism Deviation -- Minimum Deviation -- Geometric Layout -- Resolution and Resolving Power -- Throughput -- An Example.
10. Grating spectrometers -- Diffraction Theory -- Geometric Layout -- Resolution and Resolving Power -- Throughput -- Blazing Rulings -- Operation.
11. Michelson interferometer spectrometers -- Two-Beam Interference -- Interference in the Michelson Interferometer -- The Twyman-Green Interferometer -- The Fourier Transform Spectrometer -- Throughput and Sensitivity.
12. An imaging Fourier transform spectrometer -- Monochromatic Operation -- Field Operation.
13. Fabry-Perot interferometer spectrometers -- Description -- Spectral Transmission -- Resolving Power, Throughput, and Free Spectral Range -- The Fabry-Perot Imaging Spectrometer.
14. A challenging application -- Requirements -- The (Up)Front-Filter Approach -- The Rear (FPA) Filter Approach -- The Multiple-Lens Filter Approach -- The Acousto-Optic Filter -- The Grating Approach -- The FTS Approach -- Sensitivity Calculations.
15. A satellite spectrometer -- Requirements -- Analysis -- Another Way to Calculate.
16. A Mars Rover experiment -- Requirements Definitions -- The Martian Environment -- Optical Properties of (Martian?) Minerals -- The Candidate Imaging Spectrometers -- Two-Dimensional Array Systems -- Possible Improvements.
17. Some trade-offs -- General Considerations -- Optical Efficiency -- Bandwidth -- Sensitivity -- Examples.
18. Other examples -- The Westinghouse AOTF System -- HYDICE -- TRW Devices.
Appendix to Chapter 2, Optics operations -- Derivation of the Wave Equation from Maxwell's Equations -- Representation of Fields -- The Poynting Vector -- Derivation of Snell's Law -- Interference -- Diffraction -- The Thin Lens -- Refraction at a Spherical Surface -- The Aberrations -- Bending the Lens -- Appendix to Chapter 6, Detectors -- The Signal -- The Noise -- The Noises -- Expressions for the Limiting Specific Detectivities -- Appendix to Chapter 9, Prisms -- Throughput -- Slit Sizes and Resolution -- Deviation -- Dispersion -- Some Mounting Arrangements -- Appendix to Chapter 10, Gratings -- The Grating Diffraction Pattern -- The Grating Equation -- Resolving Power -- Free Spectral Range -- Some Mounting Arrangements -- Appendix to Chapter 12, FTS foundations -- Resolution -- Resolving Power -- Sensitivity -- Apodization.
Altri titoli varianti Imaging spectrometers
Record Nr. UNINA-9911004812703321
Wolfe William L  
Bellingham, Wash., : SPIE Optical Engineering Press, c1997
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Introduction to infrared system design / / William L. Wolfe
Introduction to infrared system design / / William L. Wolfe
Autore Wolfe William L
Pubbl/distr/stampa Bellingham, Wash., : SPIE Optical Engineering Press, c1996
Descrizione fisica 1 online resource (146 p.)
Disciplina 621.36/2
Collana Tutorial texts in optical engineering
Soggetto topico Infrared equipment - Design and construction
ISBN 1-61583-740-X
0-8194-7853-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. Introduction -- 2. Applications overview -- 3. Review of geometric optics -- Rays, beams, and pencils -- The laws of reflection and refraction -- Gaussian optics -- Paraxial optics -- Stops and pupils -- Optical speed -- Aberrations -- Combinations of aberrations -- 4. Review of radiometry -- Angle and solid angle -- Spectral terms -- Radiometric terms -- Radiometric transfer -- 5. Detector parameters -- Detector descriptions -- Detector noises -- Detector types -- Detector arrays -- 6. The infrared system -- Description of the infrared system -- Sensitivity equations -- The emitted and reflected scene -- 7. Atmospheric transmission and Radiation -- Overview -- High-resolution spectra -- Calculational methods -- Procedures -- MODTRAN.
8. Evaluation of the infrared scene -- Evaluation of the scene SNR -- The nature of the infrared scene -- 9. Bandwidth and scan strategies -- Information bandwidth -- Time delay and integration -- Optimizing scan patterns -- The bow-tie effect -- The Palmer scan -- Effective noise bandwidth -- 10. Optical materials -- Types of materials -- Selection criteria -- Reflection and transmission -- Absorption -- Refractive materials -- Mirrors -- Glass vs. metals and composites -- 11. Some optical systems -- Single-mirror systems -- Two-mirror systems -- Three-mirror systems -- Schmidt systems -- Bouwers-Maksutov systems -- Reflecting relays -- 12. Scanning systems -- The plane parallel plate -- Refracting polygon scanners -- Risley prism scanners -- Rotating flats and axe-blade reflecting scanners -- The reflecting polygon scanner (carousel) -- The Kennedy split-aperture scanner -- Image-space scanners -- Narcissus -- 13. Real-time imager descriptions -- Contrast and modulation -- Spatial frequency -- Modulation transfer functions -- Minimum resolvable temperature difference -- Limitations and other figures of merit -- MTFs for diffraction-limited systems -- 14. Design examples -- The design process -- A night-driving imager -- ICBM interceptors -- A Peacekeeper detector -- Summary.
Altri titoli varianti Infrared system design
Record Nr. UNINA-9911004815203321
Wolfe William L  
Bellingham, Wash., : SPIE Optical Engineering Press, c1996
Materiale a stampa
Lo trovi qui: Univ. Federico II
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