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1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA
1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1996
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Congresses
Semiconductors - Congresses - Effect of radiation on
Plasma radiation - Congresses
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996206561303316
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1996
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA
1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1996
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Congresses
Semiconductors - Congresses - Effect of radiation on
Plasma radiation - Congresses
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872918203321
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1996
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA
1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Defects
Semiconductors - Effect of radiation on
Plasma etching - Congresses
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996206561003316
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA
1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Defects
Semiconductors - Effect of radiation on
Plasma etching
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872954903321
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
1998 3rd International Symposium on Plasma Process-Induced Damage : June 4-5, 1998, Honolulu, Hawaii, USA
1998 3rd International Symposium on Plasma Process-Induced Damage : June 4-5, 1998, Honolulu, Hawaii, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1998
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Defects
Semiconductors - Effect of radiation on
Plasma etching
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996206560303316
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1998
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
1998 3rd International Symposium on Plasma Process-Induced Damage : June 4-5, 1998, Honolulu, Hawaii, USA
1998 3rd International Symposium on Plasma Process-Induced Damage : June 4-5, 1998, Honolulu, Hawaii, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1998
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Defects
Semiconductors - Effect of radiation on
Plasma etching
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872956003321
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1998
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
1999 4th International Symposium on Plasma Process-Induced Damage : May 9-11, 1999, Monterey, California, USA
1999 4th International Symposium on Plasma Process-Induced Damage : May 9-11, 1999, Monterey, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1999
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Effect of radiation on
Semiconductors
Plasma radiation
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996206560003316
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1999
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
1999 4th International Symposium on Plasma Process-Induced Damage : May 9-11, 1999, Monterey, California, USA
1999 4th International Symposium on Plasma Process-Induced Damage : May 9-11, 1999, Monterey, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1999
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Effect of radiation on
Semiconductors
Plasma radiation
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872956903321
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1999
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA
2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Effect of radiation on
Semiconductors
Plasma radiation
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996206559703316
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA
2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Effect of radiation on
Semiconductors
Plasma radiation
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872957903321
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui