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International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2004
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Testing - Circuits
Telecommunication
Radio frequency
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996202164503316
[Place of publication not identified], : International Test Conference, 2004
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2004
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Testing - Circuits
Telecommunication
Radio frequency
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872538803321
[Place of publication not identified], : International Test Conference, 2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2001
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Circuits - Testing
Telecommunication
Radio frequency
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996217698303316
[Place of publication not identified], : International Test Conference, 2001
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2001
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Circuits - Testing
Telecommunication
Radio frequency
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872966803321
[Place of publication not identified], : International Test Conference, 2001
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Proceedings / / International Test Conference
Proceedings / / International Test Conference
Pubbl/distr/stampa [Silver Spring, Md.] : , : [IEEE Computer Society Press]
Disciplina 004
Soggetto topico Computer storage devices
Integrated circuits - Testing
Semiconductor storage devices - Testing
Soggetto genere / forma Periodicals.
Conference papers and proceedings.
ISSN 2378-2250
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti International Test Conference
ITC
IEEE ... Test Conference
IEEE International Test Conference
Proceedings of the International Test Conference
Record Nr. UNINA-9910626163503321
[Silver Spring, Md.] : , : [IEEE Computer Society Press]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Proceedings / / International Test Conference
Proceedings / / International Test Conference
Pubbl/distr/stampa [Silver Spring, Md.] : , : [IEEE Computer Society Press]
Disciplina 004
Soggetto topico Computer storage devices
Integrated circuits - Testing
Semiconductor storage devices - Testing
Soggetto genere / forma Periodicals.
Conference papers and proceedings.
ISSN 2378-2250
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti International Test Conference
ITC
IEEE ... Test Conference
IEEE International Test Conference
Proceedings of the International Test Conference
Record Nr. UNISA-996281107403316
[Silver Spring, Md.] : , : [IEEE Computer Society Press]
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Proceedings International Test Conference 2002
Proceedings International Test Conference 2002
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2002
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Testing - Circuits
Telecommunication
Radio frequency
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996211258803316
[Place of publication not identified], : International Test Conference, 2002
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Proceedings International Test Conference 2002
Proceedings International Test Conference 2002
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2002
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Testing - Circuits
Telecommunication
Radio frequency
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872810403321
[Place of publication not identified], : International Test Conference, 2002
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA]
Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA]
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2003
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Circuits - Testing
Telecommunication
Radio frequency
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996210167703316
[Place of publication not identified], : International Test Conference, 2003
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA]
Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA]
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2003
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Circuits - Testing
Telecommunication
Radio frequency
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910873074603321
[Place of publication not identified], : International Test Conference, 2003
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui