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Biblioteca

MARC Lista (tabellare)
2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
Pubbl/distr/stampa [Place of publication not identified], : IEEE Society, 2002
Disciplina 621.3815
Soggetto topico Integrated circuits - Reliability
Integrated circuits - Wafer-scale integration - Reliability
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996202498803316
[Place of publication not identified], : IEEE Society, 2002
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
Pubbl/distr/stampa [Place of publication not identified], : IEEE Society, 2002
Disciplina 621.3815
Soggetto topico Integrated circuits - Reliability
Integrated circuits - Wafer-scale integration - Reliability
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872440403321
[Place of publication not identified], : IEEE Society, 2002
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
Pubbl/distr/stampa [Place of publication not identified], : IEEE Society, 2003
Disciplina 621.3815
Soggetto topico Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996202927503316
[Place of publication not identified], : IEEE Society, 2003
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
Pubbl/distr/stampa [Place of publication not identified], : IEEE Society, 2003
Disciplina 621.3815
Soggetto topico Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872466303321
[Place of publication not identified], : IEEE Society, 2003
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui