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1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
| 1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1994 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Reliability - Congresses - Wafer scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214351703316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
| 1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1994 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Reliability - Congresses - Wafer scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872753003321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
| 1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1996 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Congresses - Reliability
Integrated circuits - Reliability - Wafer scale integration - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204469603316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
| 1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1996 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer scale integration - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872781003321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
| 1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1997 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Congresses - Reliability - Wafer-scale integration Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212474703316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
| 1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1997 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Congresses - Reliability - Wafer-scale integration Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872846103321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
| 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1998 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212589903316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
| 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1998 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872867103321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
| 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215080003316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
| 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872502503321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
