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HPS weekly report
| HPS weekly report |
| Pubbl/distr/stampa | Glasgow (Clifton House, Clifton Place, Glasgow G3 7LN), : HPS |
| ISSN | 1753-4224 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215658503316 |
| Glasgow (Clifton House, Clifton Place, Glasgow G3 7LN), : HPS | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
HPS weekly report
| HPS weekly report |
| Pubbl/distr/stampa | Glasgow (Clifton House, Clifton Place, Glasgow G3 7LN), : HPS |
| ISSN | 1753-4224 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145206803321 |
| Glasgow (Clifton House, Clifton Place, Glasgow G3 7LN), : HPS | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surfaces and their measurement [[electronic resource] /] / David Whitehouse
| Surfaces and their measurement [[electronic resource] /] / David Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Pubbl/distr/stampa | London, : HPS, 2002 |
| Descrizione fisica | 1 online resource (425 p.) |
| Disciplina |
620.110287
620.44 |
| Soggetto topico |
Surfaces (Technology) - Measurement
Civil engineering |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-07307-5
9786611073077 0-08-051823-0 1-4175-2668-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification
3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum 4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration 8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation) 10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions Chapter 12. Cylindricity, sphericity |
| Record Nr. | UNINA-9910458247303321 |
Whitehouse D. J (David J.)
|
||
| London, : HPS, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surfaces and their measurement [[electronic resource] /] / David Whitehouse
| Surfaces and their measurement [[electronic resource] /] / David Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Pubbl/distr/stampa | London, : HPS, 2002 |
| Descrizione fisica | 1 online resource (425 p.) |
| Disciplina |
620.110287
620.44 |
| Soggetto topico |
Surfaces (Technology) - Measurement
Civil engineering |
| ISBN |
1-281-07307-5
9786611073077 0-08-051823-0 1-4175-2668-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification
3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum 4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration 8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation) 10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions Chapter 12. Cylindricity, sphericity |
| Record Nr. | UNINA-9910784635403321 |
|
Whitehouse D. J (David J.)
|
||
| London, : HPS, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surfaces and their measurement / / David Whitehouse
| Surfaces and their measurement / / David Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | London, : HPS, 2002 |
| Descrizione fisica | 1 online resource (425 p.) |
| Disciplina |
620.110287
620.44 |
| Soggetto topico |
Surfaces (Technology) - Measurement
Civil engineering |
| ISBN |
1-281-07307-5
9786611073077 0-08-051823-0 1-4175-2668-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification
3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum 4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration 8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation) 10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions Chapter 12. Cylindricity, sphericity |
| Record Nr. | UNINA-9910808849103321 |
|
Whitehouse D. J (David J.)
|
||
| London, : HPS, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surfaces and their measurement [e-book] / David Whitehouse
| Surfaces and their measurement [e-book] / David Whitehouse |
| Autore | Whitehouse, David J. |
| Pubbl/distr/stampa | London : HPS, 2002 |
| Descrizione fisica | xi, 395 p. : ill. ; 25 cm |
| Disciplina | 620.44 |
| Soggetto topico | Surfaces (Technology) - Measurement |
| Soggetto genere / forma | Electronic books. |
| ISBN |
9781903996010
1903996015 |
| Formato | Risorse elettroniche  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1. What is surface metrology? 2. Measurement of surfaces. 3. Profile parameter characterisation. 4. Surfaces in manufacture. 5. Function and surface texture. 6. Surface finish instrumentation. 7. Stylus instruments. 8. Optical methods. 9. Scanning microscopes. 10. Errors of form. 11. Roundness and related subjects. 12. Cylindricity, sphericity etc. 13. Instrument design for minimum error. 14. Calibration of instruments. 15. Sampling, numerical analysis, display. Glossary. |
| Record Nr. | UNISALENTO-991003242779707536 |
|
Whitehouse, David J.
|
||
| London : HPS, 2002 | ||
| Risorse elettroniche | ||
| Lo trovi qui: Univ. del Salento | ||
| ||
