Proceedings : ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

• Pubblicazione: Los Alamitos, California : , : CPS, Conference Publishing Services, IEEE Computer Society, , [2011]-
• Disciplina: 621
• Soggetto topico: Integrated circuits - Very large scale integration - Design and construction; Integrated circuits - Fault tolerance; Nanotechnology; Circuits intégrés - Tolérance aux fautes; Nanotechnologie
• Soggetto genere / forma: Conference papers and proceedings.
• Titolo abbreviato (Periodici): Proc. IEEE Int. Symp. Defect Fault Toler. VLSI Nanotechnol. Syst
• Altri titoli varianti: .. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems; DFT ..; Proceedings of the ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT); Proceedings of the ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS); DFTS; Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ... IEEE International Symposium on; Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) ... IEEE International Symposium on
• Titolo autorizzato: Proceedings
• Formato: Materiale a stampa
• Livello bibliografico: Periodico
• Lingua di pubblicazione: Inglese
• Record Nr.: 996564470003316
• Lo trovi qui: Univ. di Salerno